TY - JOUR T1 - Utilizing symmetric Phi-divergence in serial independence testing AU - Ashtari Nezhad, Emad PY - 2025 DA - June Y2 - 2025 DO - 10.15672/hujms.1586978 JF - Hacettepe Journal of Mathematics and Statistics PB - Hacettepe University WT - DergiPark SN - 2651-477X SP - 1206 EP - 1235 VL - 54 IS - 3 LA - en AB - This manuscript introduces a novel class of time series independence tests based on Phi-divergence and quantile-based symbolization. We derive the asymptotic distribution of the test statistic and propose a bootstrap version. Simulations identified optimal parameter values and compared the test performance to existing methods, demonstrating higher size-corrected power for specific Phi-divergence cases. Furthermore, we investigate Rukhin and power divergence, revealing Pearson’s divergence as optimal. 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