TY  - JOUR
TT  - Effect on the Electrical Characterizations of  Temperature and Frequency Depending on Series  Resistance and Interface States in MS Structure
AU  - Kınacı, Barış
PY  - 2017
DA  - June
JF  - Politeknik Dergisi
PB  - Gazi University
WT  - DergiPark
SN  - 2147-9429
SP  - 313
EP  - 318
VL  - 20
IS  - 2
KW  - MS Yapı
KW  - Ni/Au Metal Kontak
KW  - Elektriksel Karakterizasyonlar
N2  - In order to explain the experimental effect of series resistance and interface states of device on current–voltage, capacitance–voltage and conductance–voltage characteritics of Ni/Au/n–Si structure have beeen investigated. Current–voltage characteritics of structure have beeen measuremed in the temperature range of 100K–380K by steps of 40K. In addition, capacitance–voltage and conductance–voltage characteristics of structure have beeen measuremed in the frequency range of 100kHz–1MHz at room temperature. The obtained results show that the Ni/Au/n–Si structure is a good candidate for the electronic device applications
UR  - https://dergipark.org.tr/en/pub/politeknik/issue//368159
L1  - https://dergipark.org.tr/en/download/article-file/385867
ER  -