@article{article_630999, title={TEM characterization and synthesis of nanoparticle B4C by high-energy milling}, journal={International Advanced Researches and Engineering Journal}, volume={3}, pages={195–201}, year={2019}, DOI={10.35860/iarej.630999}, author={Gökmeşe, Hakan and Bostan, Bulent and Yilmaz, Talha Alper and Tasci, Ufuk}, keywords={TEM,Diffraction pattern,B4C,Nanoparticle,Synthesis}, abstract={<p class="MsoNormal" style="margin-bottom:.0001pt;text-align:justify;line-height:normal;"> <span style="font-size:9pt;font-family:’Times New Roman’, serif;">In this study, nanoparticle B <sub>4 </sub>C synthesis was carried out by
high-energy milling. For this purpose, B <sub>2 </sub>O <sub>3 </sub>-C-Mg triple
systems were used in the reaction stoichiometric ratios as starting materials
in the experimental studies. The reduction process of B <sub>2 </sub>O <sub>3 </sub>
was performed using speks type milling device. The transformation of the
ceramic phase of the nanoparticle B <sub>4 </sub>C by XRD analysis was examined.
In terms of microstructural characterization of its powder shape and
morphology, TEM (imaging and selected area diffraction pattern) investigations
were conducted. The product synthesized by the leaching process was cleaned
from MgO/B <sub>4 </sub>C impurities and the production of the nanoparticle B <sub>4 </sub>C
was performed. After leaching processes, it was determined that some of the
synthesized powders were below 50 nm, while others varied between the ranges of
50-350 nm. In TEM examinations of B <sub>4 </sub>C particles carried out after
leaching process, it was seen that there were twin formations observed as
planar error. Depending on the d values calculated by solving the TEM
diffraction patterns, the planes represented by nano-sized B <sub>4 </sub>C
particles were determined. </span> </p> <p> </p>}, number={3}, publisher={Ceyhun YILMAZ}