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            <front>

                <journal-meta>
                                                                <journal-id>ejeas</journal-id>
            <journal-title-group>
                                                                                    <journal-title>European Journal of Engineering and Applied Sciences</journal-title>
            </journal-title-group>
                            <issn pub-type="ppub">2651-3412</issn>
                                        <issn pub-type="epub">2667-8454</issn>
                                                                                            <publisher>
                    <publisher-name>Tekirdag Namik Kemal University</publisher-name>
                </publisher>
                    </journal-meta>
                <article-meta>
                                        <article-id/>
                                                                <article-categories>
                                            <subj-group  xml:lang="en">
                                                            <subject>Engineering</subject>
                                                    </subj-group>
                                            <subj-group  xml:lang="tr">
                                                            <subject>Mühendislik</subject>
                                                    </subj-group>
                                    </article-categories>
                                                                                                                                                        <title-group>
                                                                                                                        <article-title>A Simple Test for Non-ideal Memristors</article-title>
                                                                                                                                                                                                <trans-title-group xml:lang="tr">
                                    <trans-title>Yüksek Roff/Ron Oranlı Memristörler İçin Bir Test Yöntemi</trans-title>
                                </trans-title-group>
                                                                                                    </title-group>
            
                                                    <contrib-group content-type="authors">
                                                                        <contrib contrib-type="author">
                                                                    <contrib-id contrib-id-type="orcid">
                                        https://orcid.org/0000-0003-0030-7136</contrib-id>
                                                                <name>
                                    <surname>Mutlu</surname>
                                    <given-names>Reşat</given-names>
                                </name>
                                                                    <aff>NAMIK KEMAL UNIVERSITY</aff>
                                                            </contrib>
                                                    <contrib contrib-type="author">
                                                                    <contrib-id contrib-id-type="orcid">
                                        https://orcid.org/0000-0001-5937-2114</contrib-id>
                                                                <name>
                                    <surname>Karakulak</surname>
                                    <given-names>Ertuğrul</given-names>
                                </name>
                                                                    <aff>NAMIK KEMAL UNIVERSITY</aff>
                                                            </contrib>
                                                                                </contrib-group>
                        
                                        <pub-date pub-type="pub" iso-8601-date="20190718">
                    <day>07</day>
                    <month>18</month>
                    <year>2019</year>
                </pub-date>
                                        <volume>2</volume>
                                        <issue>1</issue>
                                        <fpage>1</fpage>
                                        <lpage>5</lpage>
                        
                        <history>
                                    <date date-type="received" iso-8601-date="20190324">
                        <day>03</day>
                        <month>24</month>
                        <year>2019</year>
                    </date>
                                                    <date date-type="accepted" iso-8601-date="20190624">
                        <day>06</day>
                        <month>24</month>
                        <year>2019</year>
                    </date>
                            </history>
                                        <permissions>
                    <copyright-statement>Copyright © 2018, European Journal of Engineering and Applied Sciences</copyright-statement>
                    <copyright-year>2018</copyright-year>
                    <copyright-holder>European Journal of Engineering and Applied Sciences</copyright-holder>
                </permissions>
            
                                                                                                <abstract><p>Semiconductor components must be tested beforetheir usage. The test for a diode is well-known. Memristor is a nonlinearcircuit element, whose existence has been predicted in 1971 and a memristivesystem behaving as memristor has been found in 2008. It is actually a nonlinearresistor with charge-dependency. In recent years, memristor has become animportant research area. In addition to ideal memristors, memristive systemsare nowadays also called memristors. However, memristor is not entirely knownas a circuit element and there is still research undergoing to model it.Memristor has different models used in literature, such as linear dopant driftmodels, nonlinear dopant drift models, and threshold-based models. If memristorwould become commercially available and start being commonly used in circuits,it will also need testing methods to be used by circuit designers. In thispaper, by reviewing some of the memristor models given in literature, a simpletest is suggested to be applied for individual memristors.</p></abstract>
                                                                                                                                    <trans-abstract xml:lang="tr">
                            <p>Yarı iletken elektronik elemanlar kullanımlarından önce testedilmelidirler. Memristörler varlığı 1971 yılında ortaya atılmış olan doğrusalolmayan elemanlardır ve bir memristif sistem 2008 yılında bulunmuştur.Memristörler son yıllarda önemli bir araştırma alanına dönüşmüştür. Ayrıcamemristörlere ilave olarak memristif sistemler de memristör olarakadlandırılmaktadır. Literatürde memristörlere ait lineer iyon sürüklenme hızlı,doğrusal olmayan iyon sürüklenme hızlı ve eşik voltajlı olmak üzere çok sayıda modelbulunmaktadır. Bir gün memristörler ticari olarak satıldığında devretasarımcılarının bir memristör test yöntemine ihtiyaç olacaktır. Bu makaledeöncelikle çeşitli memristör modelleri incelenmiş ve yüksek ROFF/RON oranına sahip memristörler için bir test yöntemi verilmiştir. Bu test sadecebir multimetre ya da ohmmetre kullanılarak yapılabilmekte ve ölçülenmemristörün sağlam ya da bozuk olduğunu göstermektedir.</p></trans-abstract>
                                                            
            
                                                            <kwd-group>
                                                    <kwd>Memristor</kwd>
                                                    <kwd>  Component test</kwd>
                                                    <kwd>  Thin films</kwd>
                                            </kwd-group>
                                                        
                                                                            <kwd-group xml:lang="tr">
                                                    <kwd>Memristör</kwd>
                                                    <kwd>  Eleman test</kwd>
                                                    <kwd>  İnce filmler.</kwd>
                                            </kwd-group>
                                                                                                            </article-meta>
    </front>
    <back>
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    </article>
