Research Article

A Line Fitting Algorithm: Linear Fitting on Locally Deflection (LFLD)

Volume: 10 Number: 2 June 30, 2022
EN

A Line Fitting Algorithm: Linear Fitting on Locally Deflection (LFLD)

Abstract

The main motivation of the study is to prevent and optimize the deviations in linear connections with complex calculations related to the previous and next steps. This purpose is used for more stable detection and therefore segmentation of object edge/corner regions in Quality Control Systems with Image Processing and Artificial Intelligence algorithms produced by authors within Alpplas Industrial Investments Inc. The dataset used in this area was originally obtained as a result of the edge approaches of the plastic panels manufactured by Alpplas Inc., extracted from the images taken from the AlpVision Quality Control Machine patented with this research. The data consists entirely of the pixel values of the edge points. Dispersed numeric data sets have quite changeable values, create high complexity and require the computation of formidable correlation. In this study, dispersed numeric data optimized by fitting to linearity. The LFLD (Linear Fitting on Locally Deflection) algorithm developed to solve the problem of linear fitting. Dispersed numeric data can be regulated and could be rendered linearly which is curved line smoothing, or line fitting by desired tolerance values. The LFLD algorithm organizes the data by creating a regular linear line (fitting) from the complex data according to the desired tolerance values.

Keywords

References

  1. [1] Ethem Alpaydın. “Adaptive Com-putation and Machine Learning”. Introduction to Machine Learning, MIT Press, Cambridge, MA, 3 edition, 2014, pp. 79.
  2. [2] Y. W. Chang et al., “Training and testing low-degree polynomial data mappings via linear svm”, J. Mach. Learn. Res., 11, pp. 1471–1490, 2010.
  3. [3] W. S. Cleveland, “Robust locally weighted regression and smooth-ing scatterplots”, Journal of the American Statistical Association, 74(368), pp. 829–836, 1979.
  4. [4] W. S. Cleveland and S. J. Devlin, “Locally weighted regression: An approach to regression analysis by local fitting”, Journal of the American Statistical Association, 83(403), pp. 596–610, 1988.
  5. [5] D. Freedman, “Statistical Models: Theory and Practice”, Cambridge University Press, August 2005.
  6. [6] H. L. Seal, “Studies in the history of probability and statistics. xv: The historical development of the gauss linear model”, Biometrika, 54(1/2), pp. 1–24, 1967.
  7. [7] Caruana, Rich and Virginia R. de Sa. “Benefitting from the Variables that Variable Selection Discards.” J. Mach. Learn. Res., 3, pp. 1245-1264, 2003.
  8. [8] V. N. Vapnik, “Conditions for Consistency of Empirical Risk Minimization Principle”. Statistical Learning Theory, Wiley Interscience Publication, 1998, pp. 82.

Details

Primary Language

English

Subjects

Engineering

Journal Section

Research Article

Publication Date

June 30, 2022

Submission Date

March 1, 2022

Acceptance Date

June 1, 2022

Published in Issue

Year 2022 Volume: 10 Number: 2

APA
Yasak, M. S., & Bilgehan, M. S. (2022). A Line Fitting Algorithm: Linear Fitting on Locally Deflection (LFLD). International Journal of Applied Mathematics Electronics and Computers, 10(2), 49-56. https://doi.org/10.18100/ijamec.1080843
AMA
1.Yasak MS, Bilgehan MS. A Line Fitting Algorithm: Linear Fitting on Locally Deflection (LFLD). International Journal of Applied Mathematics Electronics and Computers. 2022;10(2):49-56. doi:10.18100/ijamec.1080843
Chicago
Yasak, Mahmut Sami, and Muhammed Said Bilgehan. 2022. “A Line Fitting Algorithm: Linear Fitting on Locally Deflection (LFLD)”. International Journal of Applied Mathematics Electronics and Computers 10 (2): 49-56. https://doi.org/10.18100/ijamec.1080843.
EndNote
Yasak MS, Bilgehan MS (June 1, 2022) A Line Fitting Algorithm: Linear Fitting on Locally Deflection (LFLD). International Journal of Applied Mathematics Electronics and Computers 10 2 49–56.
IEEE
[1]M. S. Yasak and M. S. Bilgehan, “A Line Fitting Algorithm: Linear Fitting on Locally Deflection (LFLD)”, International Journal of Applied Mathematics Electronics and Computers, vol. 10, no. 2, pp. 49–56, June 2022, doi: 10.18100/ijamec.1080843.
ISNAD
Yasak, Mahmut Sami - Bilgehan, Muhammed Said. “A Line Fitting Algorithm: Linear Fitting on Locally Deflection (LFLD)”. International Journal of Applied Mathematics Electronics and Computers 10/2 (June 1, 2022): 49-56. https://doi.org/10.18100/ijamec.1080843.
JAMA
1.Yasak MS, Bilgehan MS. A Line Fitting Algorithm: Linear Fitting on Locally Deflection (LFLD). International Journal of Applied Mathematics Electronics and Computers. 2022;10:49–56.
MLA
Yasak, Mahmut Sami, and Muhammed Said Bilgehan. “A Line Fitting Algorithm: Linear Fitting on Locally Deflection (LFLD)”. International Journal of Applied Mathematics Electronics and Computers, vol. 10, no. 2, June 2022, pp. 49-56, doi:10.18100/ijamec.1080843.
Vancouver
1.Mahmut Sami Yasak, Muhammed Said Bilgehan. A Line Fitting Algorithm: Linear Fitting on Locally Deflection (LFLD). International Journal of Applied Mathematics Electronics and Computers. 2022 Jun. 1;10(2):49-56. doi:10.18100/ijamec.1080843