APA |
Mınaeı, S., Yıldız, M., Yıldız, M., Türköz, S. T., et al. (2012). HIGH SWING CMOS REALIZATION FOR THIRD GENERATION CURRENT CONVEYOR (CCIII). IU-Journal of Electrical & Electronics Engineering, 3(1), 819-826. |
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AMA |
Mınaeı S, Yıldız M, Yıldız M, Türköz ST, Türköz ST, Kuntman H, Kuntman H. HIGH SWING CMOS REALIZATION FOR THIRD GENERATION CURRENT CONVEYOR (CCIII). IU-Journal of Electrical & Electronics Engineering. January 2012;3(1):819-826. |
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Chicago |
Mınaeı, Shahram, Merih Yıldız, Merih Yıldız, Sait TÜRKÖZ Türköz, Sait TÜRKÖZ Türköz, Hakan Kuntman, and Hakan Kuntman. “HIGH SWING CMOS REALIZATION FOR THIRD GENERATION CURRENT CONVEYOR (CCIII)”. IU-Journal of Electrical & Electronics Engineering 3, no. 1 (January 2012): 819-26. |
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EndNote |
Mınaeı S, Yıldız M, Yıldız M, Türköz ST, Türköz ST, Kuntman H, Kuntman H (January 1, 2012) HIGH SWING CMOS REALIZATION FOR THIRD GENERATION CURRENT CONVEYOR (CCIII). IU-Journal of Electrical & Electronics Engineering 3 1 819–826. |
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IEEE |
S. Mınaeı, M. Yıldız, M. Yıldız, S. T. Türköz, S. T. Türköz, H. Kuntman, and H. Kuntman, “HIGH SWING CMOS REALIZATION FOR THIRD GENERATION CURRENT CONVEYOR (CCIII)”, IU-Journal of Electrical & Electronics Engineering, vol. 3, no. 1, pp. 819–826, 2012. |
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ISNAD |
Mınaeı, Shahram et al. “HIGH SWING CMOS REALIZATION FOR THIRD GENERATION CURRENT CONVEYOR (CCIII)”. IU-Journal of Electrical & Electronics Engineering 3/1 (January 2012), 819-826. |
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JAMA |
Mınaeı S, Yıldız M, Yıldız M, Türköz ST, Türköz ST, Kuntman H, Kuntman H. HIGH SWING CMOS REALIZATION FOR THIRD GENERATION CURRENT CONVEYOR (CCIII). IU-Journal of Electrical & Electronics Engineering. 2012;3:819–826. |
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MLA |
Mınaeı, Shahram et al. “HIGH SWING CMOS REALIZATION FOR THIRD GENERATION CURRENT CONVEYOR (CCIII)”. IU-Journal of Electrical & Electronics Engineering, vol. 3, no. 1, 2012, pp. 819-26. |
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Vancouver |
Mınaeı S, Yıldız M, Yıldız M, Türköz ST, Türköz ST, Kuntman H, Kuntman H. HIGH SWING CMOS REALIZATION FOR THIRD GENERATION CURRENT CONVEYOR (CCIII). IU-Journal of Electrical & Electronics Engineering. 2012;3(1):819-26. |
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