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Sol Jel Yöntemiyle Elde Edilen ZnO Filminin Yapısal, Morfolojik ve Optik Özelliklerine Erbiyum Katkısının Etkisi

Year 2019, Volume: 14 Issue: 2, 179 - 192, 30.11.2019
https://doi.org/10.29233/sdufeffd.528740

Abstract

Katkısız ve Erbiyum (Er) katkılı çinko oksit (ZnO)
filmleri sol jel spin kaplama yöntemi ile p-Si alttaşlar üzerine elde
edilmiştir. ZnO filminin yapısal, morfolojik ve optik özellikleri üzerine Er
katkısının etkisi sırasıyla, X-ışını kırınım cihazı, taramalı elektron
mikroskobu (SEM) ve UV-vis spektrofotometresi kullanılarak araştırılmıştır.
X-ışınları kırınımı (XRD) spektrumlarından, bütün filmlerin hekzagonal wurtzite
yapıda ve zinkit fazda kristallendiği belirlenmiştir. Kristallenme boyutu,
dislokasyon yoğunluğu, örgü parametreleri, kristal yapıdaki deformasyon ve
gerilim gibi yapısal parametreler hesaplanmıştır. SEM görüntülerinden, film
yüzeylerinin çatlaklar ve gözenekler olmadan iyi kaplanmış ve homojen olduğu
görülmektedir. Ortalama tane boyutu, tane sınırları ve filmlerin yüzey
durumlarının araştırılması için ImageJ programı kullanılmıştır. UV
sprektrofotometresi ile optik ölçümler yapılmış ve optik bant aralığı
diferansiyel yansıma ve Kubelka-Munk teorisiyle belirlenmiştir. Her iki
yöntemden de, ZnO filminin optik band değerinin Er katkısıyla düzensiz olarak
artıp azaldığı belirlenmiştir. %0,4 Er katkılı ZnO filminin optik band
aralığının diğer filmlere göre daha büyük olduğu gözlenmiştir.

Supporting Institution

Anadolu Üniversitesi Bilimsel Araştırma Komisyonu

Project Number

1501F032 no’lu lisansüstü projesi

References

  • [1] H. Morkoç and Ü. Özgür, Zinc Oxide: Fundamentals, Materials and Device Technology. Wiley Company, Germany, 2009.
  • [2] G. Ilgu, Y. Caglar, S. Ilican, M. Caglar, S. Ruzgar, “The effect of sol concentration on the structural and electrical parameters of nanostructure ZnO films by sol gel dip coating,” J. Nanoelectron. Optoe., 9, 622-627, 2014.
  • [3] M. Raja, N. Muthukumarasamy, D. Velauthapillai, R. Balasundaraprabhu, S. Agilan, and T. S. Senthil, “Studies on bundle like ZnO nanorods for solar cell applications,” Solar Energy, 106, 129-135, 2014.
  • [4] L. Zhu and W. Zeng, “Room-temperature gas sensing of ZnO-based gas sensor: A review,” Sensor. Actuat. A-Phys., 267, 242–261, 2017.
  • [5] T. Ates, C. Tatar, and F. Yakuphanoglu, “Preparation of semiconductor ZnO powders by sol gel method: Humidity sensors,” Sensor. Actuat. A-Phys., 190, 153-160, 2013.
  • [6] S. Ilican, K. Gorgun, Y. Caglar and M. Caglar, “Influence of irradiation time on structural, morphological properties of ZnO-NRs films deposited by MW-CBD and their photodiode applications,” J. Nanomaterials, 2017, 1-12, 2017.
  • [7] Y. Caglar, M. Caglar, S. Ilican, S. Aksoy and F. Yakuphanoglu, “Effect of channel thickness on the field effect mobility of ZnO-TFT fabricated by sol gel process,” J. Alloys Compound., 621, 189-193, 2015.
  • [8] R. S. Gonçalves, P. Barrozo, G. L. Brito, B. C. Viana, and F. Cunha, “The effect of thickness on optical, structural and growth mechanism of ZnO thin film prepared by magnetron sputtering,” Thin Solid Films, 661, 40-45, 2018.
  • [9] L. Phan, S. C. Yu, R. Vincent, N. H. Dan, and W. S. Shi, “Photoluminescence properties of various CVD-grown ZnO nanostructures,” J. Lumin., 130, 1142-1146, 2010.
  • [10] C. Su, Y. M. Lu, Z. Z. Zhang, C. X. Shan, B. Yao, B. H. Li, D. Z. Shen, J. Y. Zhang, D. X. Zhao, and X. W. Fan, “The optical properties of ZnO/ZnMgO single quantum well grown by P-MBE,” Appl. Surf. Sci., 254, 7303-7305, 2008.
  • [11] A. Arslan, E. Hur, S. Ilican, Y. Caglar, and M. Caglar, “Controlled growth of c-axis oriented ZnO nanorod array films by electrodeposition method and characterization,” Spectrochim. Acta A, 128, 716-723, 2014.
  • [12] M. Imai, M. Watanabe, H. Tominaga, K. Yoshino, Y. Ogomi, Q. Shen, T. Toyoda, T. Minemoto, and S. Hayase, “Growth mechanism of ZnO thin films grown by spray pyrolysis using diethylzinc solution,” Phys. Status Solidi A., 215, 1700406, 2018.
  • [13] D. Aryanto, W. N. Jannah., Masturi, T. Sudiro, A. S. Wismogroho, P. Sebayang, Sugianto, and P. Marwoto, “Preparation and structural characterization of ZnO thin films by sol-gel method,” J. Phys: Conf. Series, 817, 012025, 2017.
  • [14] F. Ran, L. Miao, S. Tanemura, M. Tanemura, Y. Cao, S. Tanaka, and N. Shibata, “ Effect of annealing temperature on optical properties of Er-doped ZnO films prepared by sol-gel method,” Mater. Sci. Eng. B, 148, 35-39, 2008.
  • [15] V. Kumari, V. Kumar, B. P. Malik, and R. M. Mehra, “Devendra Mohan Nonlinear optical properties of erbium doped zinc oxide (EZO) thin films,” Opt. Commun., 285(8), 2182-2188, 2012.
  • [16] L. Miao, S. Tanemura, L. Zhao, X. Xiao, and X. T. Zhang, “Ellipsometric studies of optical properties of Er-doped ZnO thin films synthesized by sol–gel method,” Thin Solid Films, 543, 125-129, 2013.
  • [17] R. Vettumperumal, S. Kalyanaraman, and R. Thangavel, “Optical constants and near infrared emission of Er doped ZnO sol–gel thin films,” J. Lumin., 158, 493-500, 2015.
  • [18] S. Ilican, “Structural, optical and electrical properties of Erbium-Doped ZnO thin films Prepared by spin coating method,” J. Nanoelectron. Optoe., 11(4), 465-471, 2016.
  • [19] B. D. Cullity, Elements of X-Ray Diffraction. Addison-Wesley Publishing Company Inc., United States of America, 1956.
  • [20] A. S. Hassanien, A. A. Akl, and A. H. Sáaedi, “ Synthesis, crystallography, microstructure, crystal defects, and morphology of BixZn1−xO nanoparticles prepared by sol–gel technique,” Cryst. Eng. Comm., 20, 1716-1730, 2018.
  • [21] G. K. Williamson and R. E. Smallman, “Dislocation densities in some annealed and cold-worked metals from measurements on the X-Ray Debye-Scherrer spectrum,” Philosophical Magazine, 1(1), 34-45, 1956.
  • [22] C. Kittel, Introduction to Solid State physics. (8. Baskı). John Wiley and Sons, Inc., United States of America, 2005.
  • [23] M. E. Fitzpatrick, A. T. Fry, P. Holdway, F. A. Kandil, J. Shackleton, and L. Suominen, Determination of Residual Stresses by X-ray Diffraction (Issue 2). Measurement Good Practice Guide No. 52, United Kingdom, 2005.
  • [24] H. Hong, J. Huang, H. He, Z. Fan, and J. Shao, “ Influence of different post-treatments on the structure and optical properties of zinc oxide thin films.” Appl. Surf. Sci., 242, 346-352, 2005.
  • [25] T. B. Bateman, “ Elastic moduli of single-crystal zinc oxide,” J. Appl. Phys., 33, 3309-3312, 1962.
  • [26] A. E. Morales, E. S. Mora, and U. Pal, “Use of diffuse reflectance spectroscopy for optical characterization of un-supported nanostructures,” Rev. Mex. Fisica S., 53(5), 18-22, 2007.
  • [27] V. Senthilkumar, P. Vickraman, and R. Ravikumar, “ Synthesis of fluorine doped tin oxide nanoparticles by sol-gel technique and their characterization,” J. Sol-Gel Sci. Technol., 53(2), 316-321, 2010.
  • [28] S. Q. Li, C. B. Yao, Y. Cai, Y. Han, K. X. Zhang, X. Wen, H. T. Yin, Q. H. Li, and W. J. Sun, “Nonlinear absorption properties and excitedstate charge-transfer dynamics of Er doped ZnO films,” Opt. Mater. Exp., 8(11), 3262-3276, 2018.
  • [29] M. H. Choi and T. Y. Ma, “Erbium concentration effects on the structural and photoluminescence properties of ZnO:Er films,” Mater. Lett., 62, 1835-1838, 2008.

Effect of Erbium on Structural, Morphological and Optical Properties of Sol Gel Derived ZnO Film

Year 2019, Volume: 14 Issue: 2, 179 - 192, 30.11.2019
https://doi.org/10.29233/sdufeffd.528740

Abstract

Undoped and Erbium (Er) doped zinc oxide (ZnO)
films were prepared on p-Si substrates by sol gel method using spin coating
technique. The effect of Er dopant on the structural, morphological and optical
properties of ZnO film was investigated by X-ray diffractometer, scanning
electron microscope (SEM) and UV-vis spectrophotometer, respectively. From
X-ray diffraction (XRD) spectra, the films were crystallized in hexagonal
wurtzite structure in zincite phase. The structural parameters such as grain
size, dislocation density, lattice parameters, strain and stress were
calculated. From the SEM images, it is seen that the film surfaces are
well-coated, uniform, without cracks and pores. ImageJ program was used to
investigate the average particle size, grain boundaries and the surface of the
films. The optical properties were studied by diffuse reflectance spectra
measured by UV-vis spectrophotometer and the optical band gap values were
determined by differential reflectance and Kubelka-Munk theory. In both
methods, it was determined the optical band gap value of ZnO film increases or
decreases irregularly with the Er content. It was observed that the optical
band gap of the 0.4% Er doped ZnO film was larger than the other films.

Project Number

1501F032 no’lu lisansüstü projesi

References

  • [1] H. Morkoç and Ü. Özgür, Zinc Oxide: Fundamentals, Materials and Device Technology. Wiley Company, Germany, 2009.
  • [2] G. Ilgu, Y. Caglar, S. Ilican, M. Caglar, S. Ruzgar, “The effect of sol concentration on the structural and electrical parameters of nanostructure ZnO films by sol gel dip coating,” J. Nanoelectron. Optoe., 9, 622-627, 2014.
  • [3] M. Raja, N. Muthukumarasamy, D. Velauthapillai, R. Balasundaraprabhu, S. Agilan, and T. S. Senthil, “Studies on bundle like ZnO nanorods for solar cell applications,” Solar Energy, 106, 129-135, 2014.
  • [4] L. Zhu and W. Zeng, “Room-temperature gas sensing of ZnO-based gas sensor: A review,” Sensor. Actuat. A-Phys., 267, 242–261, 2017.
  • [5] T. Ates, C. Tatar, and F. Yakuphanoglu, “Preparation of semiconductor ZnO powders by sol gel method: Humidity sensors,” Sensor. Actuat. A-Phys., 190, 153-160, 2013.
  • [6] S. Ilican, K. Gorgun, Y. Caglar and M. Caglar, “Influence of irradiation time on structural, morphological properties of ZnO-NRs films deposited by MW-CBD and their photodiode applications,” J. Nanomaterials, 2017, 1-12, 2017.
  • [7] Y. Caglar, M. Caglar, S. Ilican, S. Aksoy and F. Yakuphanoglu, “Effect of channel thickness on the field effect mobility of ZnO-TFT fabricated by sol gel process,” J. Alloys Compound., 621, 189-193, 2015.
  • [8] R. S. Gonçalves, P. Barrozo, G. L. Brito, B. C. Viana, and F. Cunha, “The effect of thickness on optical, structural and growth mechanism of ZnO thin film prepared by magnetron sputtering,” Thin Solid Films, 661, 40-45, 2018.
  • [9] L. Phan, S. C. Yu, R. Vincent, N. H. Dan, and W. S. Shi, “Photoluminescence properties of various CVD-grown ZnO nanostructures,” J. Lumin., 130, 1142-1146, 2010.
  • [10] C. Su, Y. M. Lu, Z. Z. Zhang, C. X. Shan, B. Yao, B. H. Li, D. Z. Shen, J. Y. Zhang, D. X. Zhao, and X. W. Fan, “The optical properties of ZnO/ZnMgO single quantum well grown by P-MBE,” Appl. Surf. Sci., 254, 7303-7305, 2008.
  • [11] A. Arslan, E. Hur, S. Ilican, Y. Caglar, and M. Caglar, “Controlled growth of c-axis oriented ZnO nanorod array films by electrodeposition method and characterization,” Spectrochim. Acta A, 128, 716-723, 2014.
  • [12] M. Imai, M. Watanabe, H. Tominaga, K. Yoshino, Y. Ogomi, Q. Shen, T. Toyoda, T. Minemoto, and S. Hayase, “Growth mechanism of ZnO thin films grown by spray pyrolysis using diethylzinc solution,” Phys. Status Solidi A., 215, 1700406, 2018.
  • [13] D. Aryanto, W. N. Jannah., Masturi, T. Sudiro, A. S. Wismogroho, P. Sebayang, Sugianto, and P. Marwoto, “Preparation and structural characterization of ZnO thin films by sol-gel method,” J. Phys: Conf. Series, 817, 012025, 2017.
  • [14] F. Ran, L. Miao, S. Tanemura, M. Tanemura, Y. Cao, S. Tanaka, and N. Shibata, “ Effect of annealing temperature on optical properties of Er-doped ZnO films prepared by sol-gel method,” Mater. Sci. Eng. B, 148, 35-39, 2008.
  • [15] V. Kumari, V. Kumar, B. P. Malik, and R. M. Mehra, “Devendra Mohan Nonlinear optical properties of erbium doped zinc oxide (EZO) thin films,” Opt. Commun., 285(8), 2182-2188, 2012.
  • [16] L. Miao, S. Tanemura, L. Zhao, X. Xiao, and X. T. Zhang, “Ellipsometric studies of optical properties of Er-doped ZnO thin films synthesized by sol–gel method,” Thin Solid Films, 543, 125-129, 2013.
  • [17] R. Vettumperumal, S. Kalyanaraman, and R. Thangavel, “Optical constants and near infrared emission of Er doped ZnO sol–gel thin films,” J. Lumin., 158, 493-500, 2015.
  • [18] S. Ilican, “Structural, optical and electrical properties of Erbium-Doped ZnO thin films Prepared by spin coating method,” J. Nanoelectron. Optoe., 11(4), 465-471, 2016.
  • [19] B. D. Cullity, Elements of X-Ray Diffraction. Addison-Wesley Publishing Company Inc., United States of America, 1956.
  • [20] A. S. Hassanien, A. A. Akl, and A. H. Sáaedi, “ Synthesis, crystallography, microstructure, crystal defects, and morphology of BixZn1−xO nanoparticles prepared by sol–gel technique,” Cryst. Eng. Comm., 20, 1716-1730, 2018.
  • [21] G. K. Williamson and R. E. Smallman, “Dislocation densities in some annealed and cold-worked metals from measurements on the X-Ray Debye-Scherrer spectrum,” Philosophical Magazine, 1(1), 34-45, 1956.
  • [22] C. Kittel, Introduction to Solid State physics. (8. Baskı). John Wiley and Sons, Inc., United States of America, 2005.
  • [23] M. E. Fitzpatrick, A. T. Fry, P. Holdway, F. A. Kandil, J. Shackleton, and L. Suominen, Determination of Residual Stresses by X-ray Diffraction (Issue 2). Measurement Good Practice Guide No. 52, United Kingdom, 2005.
  • [24] H. Hong, J. Huang, H. He, Z. Fan, and J. Shao, “ Influence of different post-treatments on the structure and optical properties of zinc oxide thin films.” Appl. Surf. Sci., 242, 346-352, 2005.
  • [25] T. B. Bateman, “ Elastic moduli of single-crystal zinc oxide,” J. Appl. Phys., 33, 3309-3312, 1962.
  • [26] A. E. Morales, E. S. Mora, and U. Pal, “Use of diffuse reflectance spectroscopy for optical characterization of un-supported nanostructures,” Rev. Mex. Fisica S., 53(5), 18-22, 2007.
  • [27] V. Senthilkumar, P. Vickraman, and R. Ravikumar, “ Synthesis of fluorine doped tin oxide nanoparticles by sol-gel technique and their characterization,” J. Sol-Gel Sci. Technol., 53(2), 316-321, 2010.
  • [28] S. Q. Li, C. B. Yao, Y. Cai, Y. Han, K. X. Zhang, X. Wen, H. T. Yin, Q. H. Li, and W. J. Sun, “Nonlinear absorption properties and excitedstate charge-transfer dynamics of Er doped ZnO films,” Opt. Mater. Exp., 8(11), 3262-3276, 2018.
  • [29] M. H. Choi and T. Y. Ma, “Erbium concentration effects on the structural and photoluminescence properties of ZnO:Er films,” Mater. Lett., 62, 1835-1838, 2008.
There are 29 citations in total.

Details

Primary Language Turkish
Subjects Metrology, Applied and Industrial Physics
Journal Section Makaleler
Authors

Gonca İlgü Büyük 0000-0003-2493-0133

Saliha Ilıcan This is me 0000-0003-4064-4364

Project Number 1501F032 no’lu lisansüstü projesi
Publication Date November 30, 2019
Published in Issue Year 2019 Volume: 14 Issue: 2

Cite

IEEE G. İlgü Büyük and S. Ilıcan, “Sol Jel Yöntemiyle Elde Edilen ZnO Filminin Yapısal, Morfolojik ve Optik Özelliklerine Erbiyum Katkısının Etkisi”, Süleyman Demirel University Faculty of Arts and Science Journal of Science, vol. 14, no. 2, pp. 179–192, 2019, doi: 10.29233/sdufeffd.528740.