Year 2018, Volume 26, Issue 5, Pages 2595 - 2604 2018-10-01

Incremental Banerjee test conditions committing for robust parallelization framework

AIMAD EDDINE DEBBI [1] , HADDI BAKHTI [2]

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This paper describes the design of an automatic parallelization framework. The kernel supplied at its front end was suggested as an instrument for parallel potential assessment. It was used to measure the maximum achievable speedups in the major set of the CHStone benchmark suite programs. In such framework, we suggested the liberation of parallelism incrementally. We proposed a data dependency heuristic-based transformation method to make true dependences dissociation. We generated an internal representation ($ IR^{2} $), where the Banerjee test conditions are met. Two among three of Banerjee test conditions came to be committed. In shared memory many/multicore platforms, the third condition could be satisfied by privatization. We would be able to choose the safe and the opportune pairwise (mapping-privatization) scheme among a number of threads mapping scenarios that become available in the $ IR^{2} $ structure. Instrumentation on a subset of CHStone benchmark was carried out as a validity proof of our proposal, and the results confirmed that our framework kernel is robust.
Automatic parallelization, parallel programming, source-to-source compilation, data dependency profiling, parallelism assessment, benchmarking
Journal Section Articles
Authors

Author: AIMAD EDDINE DEBBI

Author: HADDI BAKHTI

Bibtex @ { tbtkelektrik574401, journal = {Turkish Journal of Electrical Engineering and Computer Science}, issn = {1300-0632}, eissn = {1303-6203}, address = {TUBITAK}, year = {2018}, volume = {26}, pages = {2595 - 2604}, doi = {}, title = {Incremental Banerjee test conditions committing for robust parallelization framework}, key = {cite}, author = {DEBBI, AIMAD EDDINE and BAKHTI, HADDI} }
APA DEBBI, A , BAKHTI, H . (2018). Incremental Banerjee test conditions committing for robust parallelization framework. Turkish Journal of Electrical Engineering and Computer Science, 26 (5), 2595-2604. Retrieved from http://dergipark.org.tr/tbtkelektrik/issue/45630/574401
MLA DEBBI, A , BAKHTI, H . "Incremental Banerjee test conditions committing for robust parallelization framework". Turkish Journal of Electrical Engineering and Computer Science 26 (2018): 2595-2604 <http://dergipark.org.tr/tbtkelektrik/issue/45630/574401>
Chicago DEBBI, A , BAKHTI, H . "Incremental Banerjee test conditions committing for robust parallelization framework". Turkish Journal of Electrical Engineering and Computer Science 26 (2018): 2595-2604
RIS TY - JOUR T1 - Incremental Banerjee test conditions committing for robust parallelization framework AU - AIMAD EDDINE DEBBI , HADDI BAKHTI Y1 - 2018 PY - 2018 N1 - DO - T2 - Turkish Journal of Electrical Engineering and Computer Science JF - Journal JO - JOR SP - 2595 EP - 2604 VL - 26 IS - 5 SN - 1300-0632-1303-6203 M3 - UR - Y2 - 2019 ER -
EndNote %0 Turkish Journal of Electrical Engineering and Computer Science Incremental Banerjee test conditions committing for robust parallelization framework %A AIMAD EDDINE DEBBI , HADDI BAKHTI %T Incremental Banerjee test conditions committing for robust parallelization framework %D 2018 %J Turkish Journal of Electrical Engineering and Computer Science %P 1300-0632-1303-6203 %V 26 %N 5 %R %U
ISNAD DEBBI, AIMAD EDDINE , BAKHTI, HADDI . "Incremental Banerjee test conditions committing for robust parallelization framework". Turkish Journal of Electrical Engineering and Computer Science 26 / 5 (October 2018): 2595-2604.