@article{article_489982, title={Chemical Mapping of Graphene-Based Material with X-ray Photoelectron Spectroscopy (XPS) Using Principal Component Analysis (PCA)}, journal={Erzincan University Journal of Science and Technology}, volume={12}, pages={820–832}, year={2019}, author={Erdoğan, Ayşegül and Aktürk, Merve and Dursun, Zekerya}, keywords={Kimyasal haritalama,X-Işını Fotoelektron Spketroskopisi,temel bileşenler analizi,grafen}, abstract={<p> <span lang="en-us" style="font-size:10pt;line-height:115%;font-family:’Times New Roman’, serif;" xml:lang="en-us">XPS has been extensively
used to characterize the surface chemistry of materials. It plays a unique role
in giving access to qualitative, semi-quantitative/quantitative information as
well as speciation and the presence of chemical functional groups on the
surface of any material. PCA is the analysis of variability in a particular set
of data. The first principal component accounts for as much of the variability
in the data as possible and has the largest eigenvalue. Large image data sets
obtained by XPS can be analyzed using PCA in order to extract the most
significant information. The goal of PCA in an area scan of XPS is to find
images which are correlated or anti-correlated. Images are acquired as a
function of binding energy in an images-to-spectra experiment. Small area
spectra can be obtained from any part of the sample by plotting image pixel
intensity for a single pixel or a group of pixels versus binding energy. In the
present study, the graphene-based material was synthesized via oxidation of
graphite by Brodie Method. Then, chemical mapping has been produced with PCA on
the basis of spectral information. For this purpose, XPS area scan has been
performed and then the data sets were subjected to PCA in order to present the
compositional inhomogeneities on the surface of synthesized graphene-based
material. </span> <br /> </p>}, number={2}, publisher={Erzincan Binali Yıldırım Üniversitesi}