Research Article

XRD RAMAN AND Uv-vis SPECTROSCOPICAL ANALYSIS OF NANOSTRUCTURED CdS:Li FILMS

Volume: 19 Number: 1 March 31, 2018
EN

XRD RAMAN AND Uv-vis SPECTROSCOPICAL ANALYSIS OF NANOSTRUCTURED CdS:Li FILMS

Abstract

CdS and CdS:Li films were produced my means of ultrasonic spray pyrolysis (USP) method by spraying on glass bases heated up to 340±5 C. LiCl in three different rates was added into the preliminary solution while producing CdS:Li films. The effect of Li on the structural and optical characteristics of the CdS film was analyzed. XDR spectra showed that the crystallization degree decreases while lithium is 15% and increases when lithium rate increases. The crystallite sizes were calculated to be in the range of 60-85 nm. SEM photographs showed that the contribution of Li changed surface appearances of films and particle size. All films exhibit the Raman peaks centered 298 and 590 cm-1 and the peak profiles are almost symmetric. The optical band gap and Urbach energy values of these films were determined. The maximum transmittance is found to be almost 80% for the visible region. LiCl which was added to the preliminary solution changed the optical characteristics of CdS film. 

Keywords

Li doped CdS film; XRD; Raman; Optical properties

References

  1. REFERENCES
  2. [1] Durose K, Edwards P R, Halliday D P. Materials aspects of CdTe/CdS solar cells, J. Cryst. Growth 1999; 197: 733-742.
  3. [2] Voss C, Subramanian S, Chang C H. Cadmium sulfide thin-film transistors fabricated by low-temperature chemical-bath deposition, J. Appl. Phys. 2004; 96: 5819–5823.
  4. [3] Mereu B, Sarau G, Pentia E, Draghici V, Lisca M, Botila T, Pintilie L. Field-effect transistor based on nanometric thin CdS films, Mater. Sci. Eng. 2004; B109: 260-263.
  5. [4] Seon J B, Lee S, Kim J M, Jeong H D. Spin-coated CdS thin films for n-channel thin film transistors, Chem. Mater. 2009: 21: 604-611.
  6. [5] Arreola-Jardón G, González L A, García-Cerda L A, Gnade B, Quevedo-López M A, Ramírez-Bon R. Ammonia-free chemically deposited CdS films as active layers in thin film transistors, Thin Solid Films 2010; 519: 517-520.
  7. [6] Rmili A, Ouachtari F, Bouaoud A,. Louardi A, Chtouki T, Elidrissi B,. Erguig H. Structural, optical and electrical properties of Ni-doped CdS thin films prepared by spray pyrolysis, Journal of Alloys and Compounds 2013; 557: 53-59.
  8. [7] Yücel E, Şahin O. Effect of pH on the structural, optical and nanomechanical properties of CdS thin films grown b ychemical bath deposition Ceramics International 2016; 42: 6399-6407.
  9. [8] Sahay P P,. Nath R K, Tewari S. Optical properties of thermally evaporated CdS thin films, Cryst. Res. Technol. 2007; 42 (3) 275-280.
  10. [9] Patidar D, Sharma R, Jain N, Sharma T P, Saxena N S. Optical properties of CdS sintered film, Bull. Mater. Sci. 2006; 29 (1): 21-24.
APA
Hurma, T. (2018). XRD RAMAN AND Uv-vis SPECTROSCOPICAL ANALYSIS OF NANOSTRUCTURED CdS:Li FILMS. Anadolu University Journal of Science and Technology A - Applied Sciences and Engineering, 19(1), 114-121. https://doi.org/10.18038/aubtda.333956
AMA
1.Hurma T. XRD RAMAN AND Uv-vis SPECTROSCOPICAL ANALYSIS OF NANOSTRUCTURED CdS:Li FILMS. AUJST-A. 2018;19(1):114-121. doi:10.18038/aubtda.333956
Chicago
Hurma, Tülay. 2018. “XRD RAMAN AND Uv-Vis SPECTROSCOPICAL ANALYSIS OF NANOSTRUCTURED CdS:Li FILMS”. Anadolu University Journal of Science and Technology A - Applied Sciences and Engineering 19 (1): 114-21. https://doi.org/10.18038/aubtda.333956.
EndNote
Hurma T (March 1, 2018) XRD RAMAN AND Uv-vis SPECTROSCOPICAL ANALYSIS OF NANOSTRUCTURED CdS:Li FILMS. Anadolu University Journal of Science and Technology A - Applied Sciences and Engineering 19 1 114–121.
IEEE
[1]T. Hurma, “XRD RAMAN AND Uv-vis SPECTROSCOPICAL ANALYSIS OF NANOSTRUCTURED CdS:Li FILMS”, AUJST-A, vol. 19, no. 1, pp. 114–121, Mar. 2018, doi: 10.18038/aubtda.333956.
ISNAD
Hurma, Tülay. “XRD RAMAN AND Uv-Vis SPECTROSCOPICAL ANALYSIS OF NANOSTRUCTURED CdS:Li FILMS”. Anadolu University Journal of Science and Technology A - Applied Sciences and Engineering 19/1 (March 1, 2018): 114-121. https://doi.org/10.18038/aubtda.333956.
JAMA
1.Hurma T. XRD RAMAN AND Uv-vis SPECTROSCOPICAL ANALYSIS OF NANOSTRUCTURED CdS:Li FILMS. AUJST-A. 2018;19:114–121.
MLA
Hurma, Tülay. “XRD RAMAN AND Uv-Vis SPECTROSCOPICAL ANALYSIS OF NANOSTRUCTURED CdS:Li FILMS”. Anadolu University Journal of Science and Technology A - Applied Sciences and Engineering, vol. 19, no. 1, Mar. 2018, pp. 114-21, doi:10.18038/aubtda.333956.
Vancouver
1.Tülay Hurma. XRD RAMAN AND Uv-vis SPECTROSCOPICAL ANALYSIS OF NANOSTRUCTURED CdS:Li FILMS. AUJST-A. 2018 Mar. 1;19(1):114-21. doi:10.18038/aubtda.333956