Zinc
Oxide (ZnO) thin films were deposited on glass substrates via the ultrasonic
spray pyrolysis technique. The films were subsequently annealed in ambient air
from 350°C to 550°C for 3h. The morphology and structural properties of the
thin films were studied by atomic force microscopy (AFM) and X-ray
diffractometry (XRD) techniques. The X-ray diffraction studies revealed that the films
are polycrystalline with the hexagonal structure and a preferred orientation
along (002) directions. The optical
properties of the films were characterized by UV-vis spectroscopy. The
transmission values of the annealed ZnO films were average 80% within the
visible range (400–700 nm). The
optical band gap values of the films are between 3.27 and 3.23 eV. Electrical resistivity of the films was
measured using four-probe
measurement system. The electrical resistivity of the
films decreased with the increasing annealing temperature. According to our
investigation results, it can be seen that annealing treatment plays an
important role on the some physical properties of ZnO films.
Subjects | Engineering |
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Journal Section | Articles |
Authors | |
Publication Date | December 1, 2016 |
Published in Issue | Year 2016 Volume: 17 Issue: 4 |