Structural, electrical, thermal, mechanical properties and micro-hardness in Sn-based Sn-Pb-Al ternary alloys
Abstract
The structural,
electrical, thermal, mechanical properties and micro-hardness of five different
samples of Sn-Pb-Al ternary alloys (Sn-[x] wt. % Pb-10 wt. % Al) (x=40, 30, 20
and 10) with constant Al concentrations, and the eutectic Sn-Pb-Al (Sn61.82Pb38.10Al0.08)
ternary alloy were investigated. The electrical conductivity of the samples,
depending on temperature, was measured using the four-point probe technique
(4PPT). The temperature dependence of the thermal conductivities of the samples
was shown using the Wiedemann-Franz (W-F) law with the data obtained from
electrical measurements. Scanning Electron Microscope (SEM), X-ray diffraction
(XRD), and Energy Dispersive X-ray Analysis (EDX) measurements were carried out
to reveal the surface morphology, crystal structure, cell parameters, grain
sizes, and chemical compositions. Tensile tests were carried out to determine the
ultimate tensile strengths depending on the particle size of each component in
the alloys. The results of the micro-hardness tests were found using a Vickers
test machine for each component of the alloys.
Keywords
Electrical and mechanical properties, Micro-hardness, Crystal structure
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