Scalar Dielectric Constant Extraction of Planar Materials from Reflection Measurements

Yıl 2020, Cilt: 4 Sayı: 3, 113 - 115, 20.09.2020

Bektaş Çolak

https://doi.org/10.26701/ems.623406

Cited By: 1

Öz

Industrial plastics are widely used in warfare electromechanical systems to protect the internal electronic circuitry from environmental effects. Depending the purpose of the warfare system, the surface interaction with electromagnetic fields play a key role and the main parameter that determines reflection and the shielding of the electromagnetic fields from material surface is the dielectric constant of the material itself. In this paper, extraction of scalar dielectric constant from electromagnetic reflection measurement using an alternative two standard calibration technique in a low cost aluminum compact chamber is obtained. Calibration technique uses time domain measurements and converts them to frequency domain. Especially in R&D phase of electromechanical integration of warfare systems, this technique is quite useful where the exact values of dielectric constants of planar industrial plastics are not required. Obtained reflection coefficient error level is 0.67dB for 10mm while it reaches 1.62dB for 40mm thickness materials. It is shown that calculated values are in good agreement with the reference measurement method performed by precision airline setup Agilent 85050C.

Anahtar Kelimeler

Scalar Dielectric Constant, Planar Materials, Time Gating, Calibration

Kaynakça

• Smith, F.C., Chambers, B., & Bennett, J.C. (1994). Methodology for Accurate Free-space Characterisation of Radar Absorbing Materials, Proc. IEE Science measurement and Technology, 141(6): 538-546
• Gu, D., Houtz, D., Randa, J., & Walker, D. K. (2011, July). Extraction of reflectivity from microwave blackbody target with free-space measurements. In 2011 IEEE International Geoscience and Remote Sensing Symposium (pp. 3847-3850). IEEE.
• Bartley, P. G., & Begley, S. B. (2012, May). A new free-space calibration technique for materials measurement. In 2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings (pp. 47-51). IEEE.
• Kemptner, E., & Thurner, S. (2012, March). Free space material characterization for microwave frequencies. In 2012 6th European Conference on Antennas and Propagation (EUCAP) (pp. 3513-3515). IEEE.
• Rocha, L. S., Junqueira, C. C., Gambin, E., Vicente, A. N., Culhaoglu, A. E., & Kemptner, E. (2013, August). A free space measurement approach for dielectric material characterization. In 2013 SBMO/IEEE MTT-S International Microwave & Optoelectronics Conference (IMOC) (pp. 1-5). IEEE.
• Caijun, Z., Quanxing, J., & Shenhui, J. (2011). Calibration-independent and position-insensitive transmission/reflection method for permittivity measurement with one sample in coaxial line. IEEE Transactions on Electromagnetic Compatibility, 53(3): 684-689.
• Hasar C. U. (2008). A New Calibration-Independent Method for Complex Permittivity Extraction of Solid Dielectric Materials, IEEE Microwave and Wireless Component Letters, 18(12): 788-790
• Hasar, U. C. (2008). A fast and accurate amplitude-only transmission-reflection method for complex permittivity determination of lossy materials. IEEE Transactions on Microwave Theory and Techniques, 56(9): 2129-2135.
• Colak, B. (2016, June). A comparative study on the calibration of Frequency domain reflection measurements for a compact test chamber. In 2016 9th International Kharkiv Symposium on Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves (MSMW) (pp. 1-4). IEEE.
• Colak B., Helhel S. (2019). A new error reduction technique for reflection coefficient measurements for use in quick laboratory tests, International Journal of Electronics, 106(2): 237-249
• Wu, S. M., Guan, S. W., Li, C. D., Tsai, L. X., Kuo, C. T., Hsieh, M. K., & Su, C. H. (2018, May). Dielectric constant and loss-tangent extraction using near-field technology and phase delay method. In 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) (pp. 683-686). IEEE.