Research Article

SVDD Based Data-Driven Fault Detection

Number: Special Issue-1 December 1, 2016
EN

SVDD Based Data-Driven Fault Detection

Abstract

Conventional data driven process monitoring algorithms are limited to Gaussian process data for principal component analysis (PCA) algorithm and non-Gaussian process data for independent component analysis (ICA) algorithm. This paper provides a comparison study between the conventional data driven methods and support vector data description (SVDD) algorithm for fault detection (FD). Different from the traditional methods, SVDD algorithm has no Gausssian assumption. Thus the distribution of process data is not important for SVDD method. In order to compare their FD performances of the proposed methods from the application viewpoint, Tennessee Eastman (TE) benchmark process is utilized to compare the results of all the discussed methods. Simulation results on TE process show that ICA and SVDD methods perform better for false faults than the PCA method.

Keywords

References

  1. [1] Shams M. B., Budman H. M., and Duever T. A., Fault detection, identification and diagnosis using CUSUM based PCA, Chemical Engineering Science, 66(20), 4488-4498, 2011.
  2. Villegas T., Fuente M. J., and Rodríguez M., Principal component analysis for fault detection and diagnosis. experience with a pilot plant, In CIMMACS'10 Proceedings of the 9th WSEAS international conference on computational intelligence, man-machine systems and cybernetics , 2010, December, pp. 147-152.

Details

Primary Language

English

Subjects

Engineering

Journal Section

Research Article

Authors

Yusuf Sevim
KARADENIZ TEKNIK UNIV
Türkiye

Publication Date

December 1, 2016

Submission Date

January 10, 2017

Acceptance Date

December 1, 2016

Published in Issue

Year 2016 Number: Special Issue-1

APA
Sevim, Y. (2016). SVDD Based Data-Driven Fault Detection. International Journal of Applied Mathematics Electronics and Computers, Special Issue-1, 408-411. https://doi.org/10.18100/ijamec.285123
AMA
1.Sevim Y. SVDD Based Data-Driven Fault Detection. International Journal of Applied Mathematics Electronics and Computers. 2016;(Special Issue-1):408-411. doi:10.18100/ijamec.285123
Chicago
Sevim, Yusuf. 2016. “SVDD Based Data-Driven Fault Detection”. International Journal of Applied Mathematics Electronics and Computers, no. Special Issue-1: 408-11. https://doi.org/10.18100/ijamec.285123.
EndNote
Sevim Y (December 1, 2016) SVDD Based Data-Driven Fault Detection. International Journal of Applied Mathematics Electronics and Computers Special Issue-1 408–411.
IEEE
[1]Y. Sevim, “SVDD Based Data-Driven Fault Detection”, International Journal of Applied Mathematics Electronics and Computers, no. Special Issue-1, pp. 408–411, Dec. 2016, doi: 10.18100/ijamec.285123.
ISNAD
Sevim, Yusuf. “SVDD Based Data-Driven Fault Detection”. International Journal of Applied Mathematics Electronics and Computers. Special Issue-1 (December 1, 2016): 408-411. https://doi.org/10.18100/ijamec.285123.
JAMA
1.Sevim Y. SVDD Based Data-Driven Fault Detection. International Journal of Applied Mathematics Electronics and Computers. 2016;:408–411.
MLA
Sevim, Yusuf. “SVDD Based Data-Driven Fault Detection”. International Journal of Applied Mathematics Electronics and Computers, no. Special Issue-1, Dec. 2016, pp. 408-11, doi:10.18100/ijamec.285123.
Vancouver
1.Yusuf Sevim. SVDD Based Data-Driven Fault Detection. International Journal of Applied Mathematics Electronics and Computers. 2016 Dec. 1;(Special Issue-1):408-11. doi:10.18100/ijamec.285123