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In-Situ Measurement Via E/M Impedance Spectroscopy Technique Using Shear Horizontal Piezoelectric Wafer Active Sensors

Year 2015, Volume: 1 Issue: 2, 65 - 71, 26.05.2015
https://doi.org/10.19072/ijet.105713

Abstract

In this paper, an electromechanical in-situ measurement method is to be developed for determination of some properties of fuel-oils. Electromechanical impedance spectroscopy (EMIS) method is to be utilized in the measurement technique which will be developed. This method uses piezoelectric sensors that work in electromechanical principles as resonator and dynamically determines the characteristics of a medium that the resonator interacts. EMIS method has been mostly used to determine the dynamic changes in elastic properties of solid materials.This method utilizes the shear horizontal piezoelectric wafer active sensor (SH-PWAS) to generate shear horizontal mode standing waves. Piezoelectric wafer active sensors (PWAS), that are to be utilized in this study, have recently been developed as easily manufactured, small in size and weight, and broad banded transducers to utilize in qualitative and quantitative measurement systems.

References

  • V. Giurgiutiu, J. Bao, and W. Zhao, “Active Sensor Wave Propagation Health Monitoring of Beam and Plate Structures,” in Proc of SPIE’s 8th International Symposium on Smart Structures and Materials, 2001, no. March.
  • C. Liang, F. P. Sun, and C. a. Rogers, “Coupled Electro-Mechanical Analysis of Adaptive Material Systems -- Determination of the Actuator Power Consumption and System Energy Transfer,” J. Intell. Mater. Syst. Struct., vol. 5, no. 1, pp. 12–20, Jan. 1994.
  • F. P. Sun, C. Liang, and C. A. Rogers, “Structural modal analysis using collocated piezoelectric actuator/sensors: an electromechanical approach,” in Proc. SPIE 2190, Smart Structures and Materials 1994: Smart Structures and Intelligent Systems, 238, 1994.
  • A. N. Zagrai and V. Giurgiutiu, “Electro-Mechanical Impedance Method for Damage Identification in Circular Plates,” vol. 40, 2001.
  • G. Park, H. Sohn, C. R. Farrar, and D. J. Inman, “Overview of Piezoelectric Impedance-Based Health Monitoring and Path Forward,” Shock Vib. Dig., vol. 35, no. 6, pp. 451–463, Nov. 2003.
  • S. Bhalla, P. Kumar, A. Gupta, and T. K. Datta, “Simplified Impedance Model for Adhesively Bonded Piezo-Impedance Transducers,” J. Aerosp. Eng., vol. 22, no. 4, pp. 373–382, Oct. 2009.
  • H. A. Tinoco and A. L. Serpa, “Bonding influence on the electromechanical admittance of piezoelectric sensors bonded to structures based on EMI technique,” 2011.
  • V. G. Annamdas and M. a. Radhika, “Electromechanical impedance of piezoelectric transducers for monitoring metallic and non-metallic structures: A review of wired, wireless and energy-harvesting methods,” J. Intell. Mater. Syst. Struct., vol. 24, no. 9, pp. 1021–1042, Mar. 2013.
  • S. Srivastava, S. Bhalla, A. Madan, and A. Gupta, “Biomedical Applications of Smart Piezoelectric Materials,” in 9th International Symposium on Advanced Science and Technology in Experimental Mechanics, 2014, pp. 9–12.
  • Y. Y. Lim and C. K. Soh, “Towards more accurate numerical modeling of impedance based high frequency harmonic vibration,” Smart Mater. Struct., vol. 23, no. 3, p. 035017, Mar. 2014.
  • T. Kamas, B. Lin, and V. Giurgiutiu, “Analytical modeling of PWAS in-plane and out-of-plane electromechanical impedance spectroscopy (EMIS),” in SPIE Smart Structure and Materials + Nondestructive Evaluation and Health Monitoring 2013, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems, 2013, vol. 8692, p. 869227.
  • T. Kamas, V. Giurgiutiu, and B. Lin, “Modeling and Experimentation of Thickness Mode E/M Impedance and Rayleigh wave Propagation for Piezoelectric Wafer Active Sensors on Thick Plates,” in ASME-SMASIS, 2014, pp. 1–9.
  • A. Kamal, V. Giurgiutiu, and B. Lin, “Predictive modeling of PWAS-coupled shear horizontal waves,” in SPIE 2013 Smart Structure/NDE, Health Monitoring and Smart NDE of Structural and Biological Systems, 2013, p. 86950F.
  • K. K. Kanazawa and J. G. Gordon, “The oscillation frequency of a quartz resonator in contact with a liquid,” Anal. Chem. Acta, vol. 175, pp. 99–105, 1985.
  • F. Josse and Z. Shana, “Analysis of shear horizontal surface waves at the boundary between a pieazoelectric crystal and a viscous fluid medium,” J. Acoust. Soc. Am., pp. 978–984, 1988.
  • E. Nwankwo and C. J. Durning, “Mechanical response of thickness-shear mode quartz-crystal resonators to linear viscoelastic fluids,” Sensors Actuators A Phys., vol. 64, pp. 119–124, 1998.
  • S. J. Martin, H. L. Bandey, R. W. Cernosek, A. R. Hillman, M. J. Brown, and L. Le, “Equivalent-Circuit Model for the Thickness-Shear Mode Resonator with a Viscoelastic Film Near Film Resonance,” vol. II, no. 1, pp. 141–149, 2000.
  • Y. K. Suh and Y. H. Kim, “Effect of Overlayer Viscoelasticity on Resonant Characteristics of a Quartz Crystal Resonator,” Jpn. J. Appl. Phys., vol. 49, no. 6, p. 065801, Jun. 2010.
  • F. L. Guo and R. Sun, “Propagation of Bleustein–Gulyaev wave in 6mm piezoelectric materials loaded with viscous liquid,” Int. J. Solids Struct., vol. 45, no. 13, pp. 3699–3710, Jun. 2008.
  • C. Schaschke, I. Fletcher, and N. Glen, “Density and Viscosity Measurement of Diesel Fuels at Combined High Pressure and Elevated Temperature,” Processes, vol. 1, no. 2, pp. 30–48, 2013.
  • T. Kamas, “Behavior of Piezoelectric Wafer Active Sensor in Various Media,” University of South Carolina, 2014.
  • “ANSYS Help.” 2009.
Year 2015, Volume: 1 Issue: 2, 65 - 71, 26.05.2015
https://doi.org/10.19072/ijet.105713

Abstract

References

  • V. Giurgiutiu, J. Bao, and W. Zhao, “Active Sensor Wave Propagation Health Monitoring of Beam and Plate Structures,” in Proc of SPIE’s 8th International Symposium on Smart Structures and Materials, 2001, no. March.
  • C. Liang, F. P. Sun, and C. a. Rogers, “Coupled Electro-Mechanical Analysis of Adaptive Material Systems -- Determination of the Actuator Power Consumption and System Energy Transfer,” J. Intell. Mater. Syst. Struct., vol. 5, no. 1, pp. 12–20, Jan. 1994.
  • F. P. Sun, C. Liang, and C. A. Rogers, “Structural modal analysis using collocated piezoelectric actuator/sensors: an electromechanical approach,” in Proc. SPIE 2190, Smart Structures and Materials 1994: Smart Structures and Intelligent Systems, 238, 1994.
  • A. N. Zagrai and V. Giurgiutiu, “Electro-Mechanical Impedance Method for Damage Identification in Circular Plates,” vol. 40, 2001.
  • G. Park, H. Sohn, C. R. Farrar, and D. J. Inman, “Overview of Piezoelectric Impedance-Based Health Monitoring and Path Forward,” Shock Vib. Dig., vol. 35, no. 6, pp. 451–463, Nov. 2003.
  • S. Bhalla, P. Kumar, A. Gupta, and T. K. Datta, “Simplified Impedance Model for Adhesively Bonded Piezo-Impedance Transducers,” J. Aerosp. Eng., vol. 22, no. 4, pp. 373–382, Oct. 2009.
  • H. A. Tinoco and A. L. Serpa, “Bonding influence on the electromechanical admittance of piezoelectric sensors bonded to structures based on EMI technique,” 2011.
  • V. G. Annamdas and M. a. Radhika, “Electromechanical impedance of piezoelectric transducers for monitoring metallic and non-metallic structures: A review of wired, wireless and energy-harvesting methods,” J. Intell. Mater. Syst. Struct., vol. 24, no. 9, pp. 1021–1042, Mar. 2013.
  • S. Srivastava, S. Bhalla, A. Madan, and A. Gupta, “Biomedical Applications of Smart Piezoelectric Materials,” in 9th International Symposium on Advanced Science and Technology in Experimental Mechanics, 2014, pp. 9–12.
  • Y. Y. Lim and C. K. Soh, “Towards more accurate numerical modeling of impedance based high frequency harmonic vibration,” Smart Mater. Struct., vol. 23, no. 3, p. 035017, Mar. 2014.
  • T. Kamas, B. Lin, and V. Giurgiutiu, “Analytical modeling of PWAS in-plane and out-of-plane electromechanical impedance spectroscopy (EMIS),” in SPIE Smart Structure and Materials + Nondestructive Evaluation and Health Monitoring 2013, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems, 2013, vol. 8692, p. 869227.
  • T. Kamas, V. Giurgiutiu, and B. Lin, “Modeling and Experimentation of Thickness Mode E/M Impedance and Rayleigh wave Propagation for Piezoelectric Wafer Active Sensors on Thick Plates,” in ASME-SMASIS, 2014, pp. 1–9.
  • A. Kamal, V. Giurgiutiu, and B. Lin, “Predictive modeling of PWAS-coupled shear horizontal waves,” in SPIE 2013 Smart Structure/NDE, Health Monitoring and Smart NDE of Structural and Biological Systems, 2013, p. 86950F.
  • K. K. Kanazawa and J. G. Gordon, “The oscillation frequency of a quartz resonator in contact with a liquid,” Anal. Chem. Acta, vol. 175, pp. 99–105, 1985.
  • F. Josse and Z. Shana, “Analysis of shear horizontal surface waves at the boundary between a pieazoelectric crystal and a viscous fluid medium,” J. Acoust. Soc. Am., pp. 978–984, 1988.
  • E. Nwankwo and C. J. Durning, “Mechanical response of thickness-shear mode quartz-crystal resonators to linear viscoelastic fluids,” Sensors Actuators A Phys., vol. 64, pp. 119–124, 1998.
  • S. J. Martin, H. L. Bandey, R. W. Cernosek, A. R. Hillman, M. J. Brown, and L. Le, “Equivalent-Circuit Model for the Thickness-Shear Mode Resonator with a Viscoelastic Film Near Film Resonance,” vol. II, no. 1, pp. 141–149, 2000.
  • Y. K. Suh and Y. H. Kim, “Effect of Overlayer Viscoelasticity on Resonant Characteristics of a Quartz Crystal Resonator,” Jpn. J. Appl. Phys., vol. 49, no. 6, p. 065801, Jun. 2010.
  • F. L. Guo and R. Sun, “Propagation of Bleustein–Gulyaev wave in 6mm piezoelectric materials loaded with viscous liquid,” Int. J. Solids Struct., vol. 45, no. 13, pp. 3699–3710, Jun. 2008.
  • C. Schaschke, I. Fletcher, and N. Glen, “Density and Viscosity Measurement of Diesel Fuels at Combined High Pressure and Elevated Temperature,” Processes, vol. 1, no. 2, pp. 30–48, 2013.
  • T. Kamas, “Behavior of Piezoelectric Wafer Active Sensor in Various Media,” University of South Carolina, 2014.
  • “ANSYS Help.” 2009.
There are 22 citations in total.

Details

Primary Language English
Journal Section Makaleler
Authors

Tuncay Kamaş

Publication Date May 26, 2015
Published in Issue Year 2015 Volume: 1 Issue: 2

Cite

APA Kamaş, T. (2015). In-Situ Measurement Via E/M Impedance Spectroscopy Technique Using Shear Horizontal Piezoelectric Wafer Active Sensors. International Journal of Engineering Technologies IJET, 1(2), 65-71. https://doi.org/10.19072/ijet.105713
AMA Kamaş T. In-Situ Measurement Via E/M Impedance Spectroscopy Technique Using Shear Horizontal Piezoelectric Wafer Active Sensors. IJET. June 2015;1(2):65-71. doi:10.19072/ijet.105713
Chicago Kamaş, Tuncay. “In-Situ Measurement Via E/M Impedance Spectroscopy Technique Using Shear Horizontal Piezoelectric Wafer Active Sensors”. International Journal of Engineering Technologies IJET 1, no. 2 (June 2015): 65-71. https://doi.org/10.19072/ijet.105713.
EndNote Kamaş T (June 1, 2015) In-Situ Measurement Via E/M Impedance Spectroscopy Technique Using Shear Horizontal Piezoelectric Wafer Active Sensors. International Journal of Engineering Technologies IJET 1 2 65–71.
IEEE T. Kamaş, “In-Situ Measurement Via E/M Impedance Spectroscopy Technique Using Shear Horizontal Piezoelectric Wafer Active Sensors”, IJET, vol. 1, no. 2, pp. 65–71, 2015, doi: 10.19072/ijet.105713.
ISNAD Kamaş, Tuncay. “In-Situ Measurement Via E/M Impedance Spectroscopy Technique Using Shear Horizontal Piezoelectric Wafer Active Sensors”. International Journal of Engineering Technologies IJET 1/2 (June 2015), 65-71. https://doi.org/10.19072/ijet.105713.
JAMA Kamaş T. In-Situ Measurement Via E/M Impedance Spectroscopy Technique Using Shear Horizontal Piezoelectric Wafer Active Sensors. IJET. 2015;1:65–71.
MLA Kamaş, Tuncay. “In-Situ Measurement Via E/M Impedance Spectroscopy Technique Using Shear Horizontal Piezoelectric Wafer Active Sensors”. International Journal of Engineering Technologies IJET, vol. 1, no. 2, 2015, pp. 65-71, doi:10.19072/ijet.105713.
Vancouver Kamaş T. In-Situ Measurement Via E/M Impedance Spectroscopy Technique Using Shear Horizontal Piezoelectric Wafer Active Sensors. IJET. 2015;1(2):65-71.

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