APA |
Temel, B., Kılıc, N., Ozgultekın, B., Ucan, O. N. (2012). SEPARATION OF ORIGINAL PAINTINGS OF MATISSE AND HIS FAKES USING WAVELET AND ARTIFICIAL NEURAL NETWORKS. IU-Journal of Electrical & Electronics Engineering, 9(1), 791-796. |
|
AMA |
Temel B, Kılıc N, Ozgultekın B, Ucan ON. SEPARATION OF ORIGINAL PAINTINGS OF MATISSE AND HIS FAKES USING WAVELET AND ARTIFICIAL NEURAL NETWORKS. IU-Journal of Electrical & Electronics Engineering. Şubat 2012;9(1):791-796. |
|
Chicago |
Temel, Baybora, Niyazi Kılıc, Bunyamin Ozgultekın, ve Osman N. Ucan. “SEPARATION OF ORIGINAL PAINTINGS OF MATISSE AND HIS FAKES USING WAVELET AND ARTIFICIAL NEURAL NETWORKS”. IU-Journal of Electrical & Electronics Engineering 9, sy. 1 (Şubat 2012): 791-96. |
|
EndNote |
Temel B, Kılıc N, Ozgultekın B, Ucan ON (01 Şubat 2012) SEPARATION OF ORIGINAL PAINTINGS OF MATISSE AND HIS FAKES USING WAVELET AND ARTIFICIAL NEURAL NETWORKS. IU-Journal of Electrical & Electronics Engineering 9 1 791–796. |
|
IEEE |
B. Temel, N. Kılıc, B. Ozgultekın, ve O. N. Ucan, “SEPARATION OF ORIGINAL PAINTINGS OF MATISSE AND HIS FAKES USING WAVELET AND ARTIFICIAL NEURAL NETWORKS”, IU-Journal of Electrical & Electronics Engineering, c. 9, sy. 1, ss. 791–796, 2012. |
|
ISNAD |
Temel, Baybora vd. “SEPARATION OF ORIGINAL PAINTINGS OF MATISSE AND HIS FAKES USING WAVELET AND ARTIFICIAL NEURAL NETWORKS”. IU-Journal of Electrical & Electronics Engineering 9/1 (Şubat 2012), 791-796. |
|
JAMA |
Temel B, Kılıc N, Ozgultekın B, Ucan ON. SEPARATION OF ORIGINAL PAINTINGS OF MATISSE AND HIS FAKES USING WAVELET AND ARTIFICIAL NEURAL NETWORKS. IU-Journal of Electrical & Electronics Engineering. 2012;9:791–796. |
|
MLA |
Temel, Baybora vd. “SEPARATION OF ORIGINAL PAINTINGS OF MATISSE AND HIS FAKES USING WAVELET AND ARTIFICIAL NEURAL NETWORKS”. IU-Journal of Electrical & Electronics Engineering, c. 9, sy. 1, 2012, ss. 791-6. |
|
Vancouver |
Temel B, Kılıc N, Ozgultekın B, Ucan ON. SEPARATION OF ORIGINAL PAINTINGS OF MATISSE AND HIS FAKES USING WAVELET AND ARTIFICIAL NEURAL NETWORKS. IU-Journal of Electrical & Electronics Engineering. 2012;9(1):791-6. |
|