Hidrotermal Reaksiyon Sıcaklığının CuO İnce Filmlerin Yapısal ve Optik Özelliklerine Etkisi

Yıl 2024, Cilt: 17 Sayı: 1, 196 - 209, 28.03.2024

Aykut Astam Ömer Kaya

https://doi.org/10.18185/erzifbed.1392027

Öz

Bakır oksitler cihaz uygulamaları için incelenen ilk yarı iletkenlerden biridir. Bu çalışmada, CuO ince filmler, herhangi bir yüzey aktif madde kullanılmadan, hidrotermal yöntemle flor katkılı kalay oksit (FTO) altlıklar üzerine büyütülmüş ve reaksiyon sıcaklığının filmlerin özellikleri üzerine etkisi araştırılmıştır. Farklı reaksiyon sıcaklıklarında büyütülen CuO ince filmler, X-ışını kırınımı (XRD), taramalı elektron mikroskobu (SEM), enerji dağılımlı X-ışını analizi (EDAX), Raman spektroskopisi ve optik soğurma ölçümleri kullanılarak yapısal ve optik özellikleri açısından karakterize edilmiştir. XRD sonuçları, tüm filmlerin herhangi bir safsızlık fazı içermeyen, monoklinik kristal yapıya sahip, polikristal CuO'dan oluştuğunu ortaya çıkarmıştır. SEM görüntüleri, krizantem benzeri yapıların oluştuğunu ve hidrotermal reaksiyon sıcaklığının artmasıyla bu yapıların sayısının arttığını göstermiştir. EDAX ölçümleri Cu ve O elementlerinin varlığını kanıtlamış ve tüm filmlerin Cu/O oranlarının bire yakın olduğunu göstermiştir. Raman spektrumları tüm filmlerde kristal CuO oluşumunu doğrulamıştır. Optik soğurma ölçümlerinden CuO ince filmlerinin doğrudan yasak enerji aralığı değerlerinin hidrotermal reaksiyon sıcaklığına bağlı olarak 1,34 eV ile 1,41 eV arasında olduğu bulunmuştur.

Anahtar Kelimeler

CuO ince filmler, hidrotermal method, reaksiyon sıcaklığı

Effect of Hydrothermal Reaction Temperature on the Structural and Optical Properties of CuO Thin Films

Öz

Copper oxides are one of the first semiconductors studied for device applications. In the present work, CuO thin films were deposited on fluorine-doped tin oxide (FTO) substrates via hydrothermal method without using any surfactant and the effects of reaction temperature on the properties of the films were studied. CuO thin films deposited at different reaction temperatures were characterized for their structural and optical properties using X-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive X-ray analysis (EDAX), Raman spectroscopy, and optical absorption measurements. XRD results revealed that all the films consisted of polycrystalline CuO with a monoclinic crystal structure without any impurity phase. SEM images showed that chrysanthemum-like structures were formed, the number of which increased with increasing hydrothermal reaction temperature. EDAX measurements proved the existence of Cu and O elements and showed that all the films have Cu/O ratios close to unity. The Raman spectra confirmed the formation of crystalline CuO in all the films. From the optical absorption measurements, the direct forbidden energy gap values of the CuO thin films were found to be between 1.34 eV and 1.41 eV, depending on the hydrothermal reaction temperature.

Anahtar Kelimeler

CuO thin films, hydrothermal method, reaction temperature

Kaynakça

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