An investigation of radiation damage in bipolar and field effect transistors is presented.
For low frequency transistors, 90 % of the damage in forward current gain occurs at k>w y doses around 100 K. rads. On the other hand, tlıe effects on microwave transistors occur at lıigher- dosc levels up to 100 x 106 rads. The damage effect has minimum that usually corresponds to the low (0.10 mA.) and higher (300 mA) ends of the operating collector current range of a device.
Primary Language | English |
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Subjects | Engineering |
Journal Section | Research Articles |
Authors | |
Publication Date | January 1, 1994 |
Submission Date | January 1, 1994 |
Published in Issue | Year 1994 Volume: 43 |
Communications Faculty of Sciences University of Ankara Series A2-A3 Physical Sciences and Engineering
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