X-Ray Diffraction Studies of Undoped and In-Doped Cd0.22Zn0.78S films Deposited by Spray Pyrolysis

Year 2005, Volume: 1 Issue: 3, 85 - 94, 01.08.2005

Saliha İlican, Yasemin And Müjdat Çağlar Saliha Ilıcan Yasemin Çağlar Müjdat Çağlar

Abstract

Keywords

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X-Ray Diffraction Studies of Undoped and in-Doped Cd0.22Zn0.78S Films Deposited by Spray Pyrolysis

Abstract

Cd0.22Zn0.78S and In-doped Cd0.22Zn0.78S films have been produced by the spray pyrolysis
method at 275±5°C substrate temperature. This work describes the X-ray diffraction spectra of all
films at room temperature. X-ray diffraction spectra of the films showed that they are hexagonal and
formed as Cd0.22Zn0.78S polycrystalline structure. Film thickness, texture coefficient (TC), grain size
values, lattice constants, and d% error were calculated. Effects of Indium incorporation on these properties deposited films have been systematically investigated.

Keywords

Cadmium Zinc Sulfide, Indium Doping, Spray Pyrolysis, X-Ray Diffraction Spectra, Texture Coefficient, Grain Size

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