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Year 2015, Volume: 36 Issue: 3, 1 - 10, 13.05.2015

Omid Ghahghaei Saeed Malekzadeh Hamed Naeimy

Abstract

References

  • Jonah A. Harley, Advances in piezoresistive probes for atomic force microscopy, March 2000.
  • Varol A., Gunev I., Orun B., and Basdogan C., Numerical simulation of nano scanning in intermittent-contact mode AFM under Q control. arXiv:1204.3016.
  • Tortonese M., Yamada H., Barrett R.C., Quate C.F. and Edward L., Ginzton Laboratory, Atomic force microscopy using a piezoresistive cantilever. Solid-State Sensors and Actuators, 1991. Digest of Technical Papers, TRANSDUCERS '91., 1991 International Conference on
  • Georg Schitter, Member, IEEE, Karl J. Åström, Fellow, IEEE, Barry E. DeMartini, Member, IEEE, Philipp J. Thurner, Kimberly L. Turner, and Paul K. Hansma, Design and Modeling of a High-Speed AFM-Scanner. IEEE Transactıons on Control Systems Technology, 15 (2007) 5.
  • Miller E.H., A note on reflector arrays (Periodical style Accepted for publication),” IEEE Trans. Antennas Propagat., to be published.

Design & modeling a novel Atomic Force Microscope (AFM) for detect roughness in turning machining

Year 2015, Volume: 36 Issue: 3, 1 - 10, 13.05.2015

Omid Ghahghaei Saeed Malekzadeh Hamed Naeimy

Abstract

Abstract. In this paper we design and modeling a novel AFM (Atomic Force Microscope) that use it in turning machining. We know that work piece roughness is very essential part in final product in every machining method specially in turning. In this case we want to know availability of using AFM in turning. So at first designed a kind of AFM with cantilever beam, piezoelectric and piezoresistance. After that we should modeling this design in our situation, for these we define some surface that may be happen in machining. So know modeled our design for sample surface. At the end of project a P control method has been used for controlling our processing.

Keywords

Atomic Force Microscope turning machining; roughness; AFM control; cantilever beam

References

  • Jonah A. Harley, Advances in piezoresistive probes for atomic force microscopy, March 2000.
  • Varol A., Gunev I., Orun B., and Basdogan C., Numerical simulation of nano scanning in intermittent-contact mode AFM under Q control. arXiv:1204.3016.
  • Tortonese M., Yamada H., Barrett R.C., Quate C.F. and Edward L., Ginzton Laboratory, Atomic force microscopy using a piezoresistive cantilever. Solid-State Sensors and Actuators, 1991. Digest of Technical Papers, TRANSDUCERS '91., 1991 International Conference on
  • Georg Schitter, Member, IEEE, Karl J. Åström, Fellow, IEEE, Barry E. DeMartini, Member, IEEE, Philipp J. Thurner, Kimberly L. Turner, and Paul K. Hansma, Design and Modeling of a High-Speed AFM-Scanner. IEEE Transactıons on Control Systems Technology, 15 (2007) 5.
  • Miller E.H., A note on reflector arrays (Periodical style Accepted for publication),” IEEE Trans. Antennas Propagat., to be published.
There are 5 citations in total.

Details

Journal Section Special
Authors

Omid Ghahghaei

Saeed Malekzadeh This is me

Hamed Naeimy This is me

Publication Date May 13, 2015
Published in Issue Year 2015 Volume: 36 Issue: 3

Cite

APA Ghahghaei, O., Malekzadeh, S., & Naeimy, H. (2015). Design & modeling a novel Atomic Force Microscope (AFM) for detect roughness in turning machining. Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi, 36(3), 1-10.
AMA Ghahghaei O, Malekzadeh S, Naeimy H. Design & modeling a novel Atomic Force Microscope (AFM) for detect roughness in turning machining. Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi. May 2015;36(3):1-10.
Chicago Ghahghaei, Omid, Saeed Malekzadeh, and Hamed Naeimy. “Design & Modeling a Novel Atomic Force Microscope (AFM) for Detect Roughness in Turning Machining”. Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi 36, no. 3 (May 2015): 1-10.
EndNote Ghahghaei O, Malekzadeh S, Naeimy H (May 1, 2015) Design & modeling a novel Atomic Force Microscope (AFM) for detect roughness in turning machining. Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi 36 3 1–10.
IEEE O. Ghahghaei, S. Malekzadeh, and H. Naeimy, “Design & modeling a novel Atomic Force Microscope (AFM) for detect roughness in turning machining”, Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi, vol. 36, no. 3, pp. 1–10, 2015.
ISNAD Ghahghaei, Omid et al. “Design & Modeling a Novel Atomic Force Microscope (AFM) for Detect Roughness in Turning Machining”. Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi 36/3 (May 2015), 1-10.
JAMA Ghahghaei O, Malekzadeh S, Naeimy H. Design & modeling a novel Atomic Force Microscope (AFM) for detect roughness in turning machining. Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi. 2015;36:1–10.
MLA Ghahghaei, Omid et al. “Design & Modeling a Novel Atomic Force Microscope (AFM) for Detect Roughness in Turning Machining”. Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi, vol. 36, no. 3, 2015, pp. 1-10.
Vancouver Ghahghaei O, Malekzadeh S, Naeimy H. Design & modeling a novel Atomic Force Microscope (AFM) for detect roughness in turning machining. Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi. 2015;36(3):1-10.