THE STRUCTURAL, SURFACE MORPHOLOGY, OPTICAL AND ELECTRICAL PROPERTIES OF ZnO FILM DOPED GALLIUM AT 10%
Abstract
The pure and 10% gallium (Ga) doped zinc oxide (ZnO) films synthesized on glass substrates by ultrasonic spray pyrolysis technique. The structural, surface morphology, optical and electrical properties of pure and doped films were analysed by X–ray diffraction (XRD) pattern, atomic force microscopy (AFM), Ultraviolet – Visible (UV–Vis) spectrophotometer and four probe technique, respectively. It observed from the results of XRD that the preferred orientation changed from (100) to (002) with Ga doping at 10 %. Also, the grain size and strain values of films calculated both Scherrer Method and Williamson–Hall (W–H) Method were compared. In the result of this comparison, the values calculated by Scherrer Method were found to be smaller than the values calculated by W–H Method. All experimental results show that the grain size, surface roughness, energy band gap and electrical conductivity increased as its Urbach energy decreased with the addition of gallium. As a result, the crystallinity of ZnO film was observed to improve with doping Ga at 10 %.
Keywords
References
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Details
Primary Language
English
Subjects
Metrology, Applied and Industrial Physics
Journal Section
Research Article
Authors
H. Senem Aydoğu
*
0000-0003-2426-9162
Türkiye
Seda Uzkalan
This is me
0000-0003-2564-6484
Türkiye
Publication Date
December 31, 2019
Submission Date
November 30, 2018
Acceptance Date
December 30, 2019
Published in Issue
Year 2019 Number: 043