The pure and 10% gallium (Ga) doped zinc oxide (ZnO) films synthesized on glass substrates by ultrasonic spray pyrolysis technique. The structural, surface morphology, optical and electrical properties of pure and doped films were analysed by X–ray diffraction (XRD) pattern, atomic force microscopy (AFM), Ultraviolet – Visible (UV–Vis) spectrophotometer and four probe technique, respectively. It observed from the results of XRD that the preferred orientation changed from (100) to (002) with Ga doping at 10 %. Also, the grain size and strain values of films calculated both Scherrer Method and Williamson–Hall (W–H) Method were compared. In the result of this comparison, the values calculated by Scherrer Method were found to be smaller than the values calculated by W–H Method. All experimental results show that the grain size, surface roughness, energy band gap and electrical conductivity increased as its Urbach energy decreased with the addition of gallium. As a result, the crystallinity of ZnO film was observed to improve with doping Ga at 10 %.
Primary Language | English |
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Subjects | Metrology, Applied and Industrial Physics |
Journal Section | Articles |
Authors | |
Publication Date | December 31, 2019 |
Published in Issue | Year 2019 Issue: 043 |
HAZİRAN 2020'den itibaren Journal of Scientific Reports-A adı altında ingilizce olarak yayın hayatına devam edecektir.