Seventy nine maize inbred lines were screened under artificial epiphytotic condition at two locations viz, Nagenahalli
and Varanasi for continuously for 2 years to identify the additional sources of resistance for ‘Southern Corn Leaf Blight
(SCLB). The Southern Corn Leaf Blight caused by Bipolaris maydis is also known as ‘Maydis Leaf Blight’. The present
study has helped in the identification of 26 resistant inbred lines, 25 moderately resistant, 16 susceptible and 12 highly
susceptible maize genotypes. Ten lines viz. V53, V 178, V 190, V 336, V 340, V 341, V 345, V 348, CM 104 and CM 145
by scoring below 1.5 disease score showed high level of resistance, whereas inbred lines viz., V 49, CM 126, CM 127,
CM 202 and CM 212 showed high level of susceptibility as they scored above 3.5 disease score across the environment.
It was also observed that average disease incidence was high in Nagenahalli than Varanasi thus indicating that isolates of
Bipolaris maydis were more virulent at Nagenahalli than Varanasi.
Journal Section | Articles |
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Authors | |
Publication Date | January 31, 2017 |
Published in Issue | Year 2017 Volume: 3 Issue: 1 |