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Current-Voltage (I-V) and Capacitance-Voltage (C-V) Characteristics of Au/Bi4Ti3O12/SnO2 Structures

Year 2007, Volume: 20 Issue: 4, 97 - 102, 28.03.2010

Abstract

The electrical properties of Au/Bi4Ti3O12/SnO2 structures were investigated by forward bias I-V, forward and reverse bias C-V and G/w-V measurements. The results indicate structural disordering, presence of the interface states in the BTO capacitors and existence of polarization. Dielectric constant(e'), dielectric loss(e'') and dielectric tangent(tand) were found as 170, 309 and 1,8 respectively at 50 kHz. C-V and G/w-V were measured in the frequency range of 1 kHz-5 MHz. It was found that dielectric constant(e') and dielectric loss(e'') systematically decrease with increasing frequency in 10 kHz-1 MHz frequency range and tand versus frequency plot exhibits a minimum at about 5 kHz. The ideality factor and series resistance were found to be 1,5 and 1030 W respectively from I-V measurements and series resistance was found as 350 W from the measured conductance in strong accumulation region. The observations are comparable with the other values for BTO structures reported in the literature.

 

References

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  • [2] Cummins, S.E., “A new bistable ferroelectric light gate or display element”, Proc. IEEE, 55: 1537- 1538 (1967).
  • [3] Cummins, S. E., Cross L. E., "Crystal symmetry, optical properties, and ferroelectric polarization of Bi4Ti3O12 single crystals", Appl. Phys. Letters, 10: 14-16 (1967).
  • [4] Wu, S.Y., Takei, W.J. , Francoma, M.H., “Transient switching response and partial switching phenomena in coarse-grained rhombohedral-phase PLZT ceramics”, Ferroelectrics, 10: 43-46 (1976).
  • [5] Agasiyev, A. A., Mamedov, M.Z., Muradov, M. B., “Electrical Conductivity and Dielectric Properties of Bi4Ti3O12”, J. Phys. III France, 6 (7): 853-861 (1996).
  • [6] B.H., Park, S. J., Hyun, “Imprint failures and asymmetric electrical properties induced by thermal processes in epitaxial Bi4Ti3O12 thin films”, Journal of Applied Physics, 84: 4428-4435 (1998).
  • [7] Joshi, P.C., Krupanidh, S.B., “Structural and electrical studies on rapid thermally processed ferroelectric Bi4Ti3O12 thin films by metalloorganic solution deposition”, Journal of Applied Physics, 72 (12): 5817-5819 (1992).
  • [8] Pintilie, L., Pintilie, I., Petre, D., Botila, T., Alexe M., “Trap characterization of Bi4Ti3O12 thin films by thermally stimulated currents”, Appl. Physica A, 69: 105-109 (1999).
  • [9] Fu, L., Liu, K., Zhang, B., Chu, J., “Capacitancevoltage characteristics of Bi4Ti3O12/p-Si interface”, Appl. Phys. Letters, 72 (14): 1784-1786 (1998).
  • [10] Norde, H., “A modified forward I-V plot for Schottky diodes with high series resistance”, Journal of Applied Physics, 50 (7): 5052-5053 (1979).
  • [11] Sato, K., Yasamura, Y., “Study of forward I-V plot for Schottky diodes with high series resistance”, J.Appl.Phys., 58 (9): 3655-3657 (1985).
  • [12] Bohlin, K.E., “Generalized Norde plot including determination of the ideality factor”, J.Appl.Phys., 60 (3): 1223-1224 (1986).
  • [13] Cheung, S.K., Cheung, N.W., “Extraction of Schottky diode parameters from forward currentvoltage characteristics”, Appl.Phys. Lett., 49 (2): 85-87 (1986).
  • [14] Green, M.A., King, F.D., Shewchun, J., “Minority Carrier MIS Tunnel Diodes and their Application to Electron and Photovoltaic Energy Conversion Part I: Theory”, Solid-State Electronics, 17: 551- 561 (1974).
  • [15] Özdemir, S., Altındal, Ş., “Temperature dependent electrical characteristics of Al-SiOx-pSi solar cells”, Solar Energy Materials and Solar Cells, 32 (2): 115-127 (1994).
  • [16] W. P., Kang, J. L., Davidson, Y., Gurbuz, D. V., Kerns, “Temperature Dependence and Effect of Series Resistance on Electrical Characteristics of a Polycrystalline Diamond MIS Diode”, Journal of Applied Physics, 78 (2): 1101-1107 (1995).
  • [17] Nicollian, E.H., Brews, J.R., “Metal Oxide Semiconductor (MOS) Physics and Technology”, John Wiley & Sons, New York, 423–491 (1982).
  • [18] Kong, L. B., Ma, J., “Randomly oriented Bi4Ti3O12 thin films derived from a hybrid solgel process”, Thin Solid Films, 379: 89-93 (2000).
  • [19] Wang, H., Fu, L. W., Hang, S. X., “Preparation and Properties of Bi4Ti3O12 Single-Crystal Thin Films by Atmospheric Pressure Metalorganic Chemical Vapor Deposition”, J. Appl. Phys., 73 (11): 7963 (1993).
  • [20] Joshi, P.C., Krupandihi, S.B., “Switching, fatigue, and retention in ferroelectric Bi4Ti3O12 thin films”, Appl.Phys. Lett., 62 (16): 1928-1930 (1993).
  • [21] A.Q., Jiang, G.H., Li,, L.D., Zhang, “Dielectric study in nanocrystalline Bi4Ti3O12 prepared by chemical coprecipitation”, J.Appl.Phys., 83 (9): 4878-4883 (1998).
  • [22] Lee, J.J., Alluri, P., Dey, S.K., "Effect of interfaces on the electrical behavior of (Pb0.72La 0.28) TiO3 thin films”, Appl.Phys.Lett., 65 (16): 2027-2029 (1994)
Year 2007, Volume: 20 Issue: 4, 97 - 102, 28.03.2010

Abstract

References

  • [1] Sze, S. M., “Physics of Semiconductor Devices 2nd ed.”, John Wiley & Sons, New York, 362-390 (1981).
  • [2] Cummins, S.E., “A new bistable ferroelectric light gate or display element”, Proc. IEEE, 55: 1537- 1538 (1967).
  • [3] Cummins, S. E., Cross L. E., "Crystal symmetry, optical properties, and ferroelectric polarization of Bi4Ti3O12 single crystals", Appl. Phys. Letters, 10: 14-16 (1967).
  • [4] Wu, S.Y., Takei, W.J. , Francoma, M.H., “Transient switching response and partial switching phenomena in coarse-grained rhombohedral-phase PLZT ceramics”, Ferroelectrics, 10: 43-46 (1976).
  • [5] Agasiyev, A. A., Mamedov, M.Z., Muradov, M. B., “Electrical Conductivity and Dielectric Properties of Bi4Ti3O12”, J. Phys. III France, 6 (7): 853-861 (1996).
  • [6] B.H., Park, S. J., Hyun, “Imprint failures and asymmetric electrical properties induced by thermal processes in epitaxial Bi4Ti3O12 thin films”, Journal of Applied Physics, 84: 4428-4435 (1998).
  • [7] Joshi, P.C., Krupanidh, S.B., “Structural and electrical studies on rapid thermally processed ferroelectric Bi4Ti3O12 thin films by metalloorganic solution deposition”, Journal of Applied Physics, 72 (12): 5817-5819 (1992).
  • [8] Pintilie, L., Pintilie, I., Petre, D., Botila, T., Alexe M., “Trap characterization of Bi4Ti3O12 thin films by thermally stimulated currents”, Appl. Physica A, 69: 105-109 (1999).
  • [9] Fu, L., Liu, K., Zhang, B., Chu, J., “Capacitancevoltage characteristics of Bi4Ti3O12/p-Si interface”, Appl. Phys. Letters, 72 (14): 1784-1786 (1998).
  • [10] Norde, H., “A modified forward I-V plot for Schottky diodes with high series resistance”, Journal of Applied Physics, 50 (7): 5052-5053 (1979).
  • [11] Sato, K., Yasamura, Y., “Study of forward I-V plot for Schottky diodes with high series resistance”, J.Appl.Phys., 58 (9): 3655-3657 (1985).
  • [12] Bohlin, K.E., “Generalized Norde plot including determination of the ideality factor”, J.Appl.Phys., 60 (3): 1223-1224 (1986).
  • [13] Cheung, S.K., Cheung, N.W., “Extraction of Schottky diode parameters from forward currentvoltage characteristics”, Appl.Phys. Lett., 49 (2): 85-87 (1986).
  • [14] Green, M.A., King, F.D., Shewchun, J., “Minority Carrier MIS Tunnel Diodes and their Application to Electron and Photovoltaic Energy Conversion Part I: Theory”, Solid-State Electronics, 17: 551- 561 (1974).
  • [15] Özdemir, S., Altındal, Ş., “Temperature dependent electrical characteristics of Al-SiOx-pSi solar cells”, Solar Energy Materials and Solar Cells, 32 (2): 115-127 (1994).
  • [16] W. P., Kang, J. L., Davidson, Y., Gurbuz, D. V., Kerns, “Temperature Dependence and Effect of Series Resistance on Electrical Characteristics of a Polycrystalline Diamond MIS Diode”, Journal of Applied Physics, 78 (2): 1101-1107 (1995).
  • [17] Nicollian, E.H., Brews, J.R., “Metal Oxide Semiconductor (MOS) Physics and Technology”, John Wiley & Sons, New York, 423–491 (1982).
  • [18] Kong, L. B., Ma, J., “Randomly oriented Bi4Ti3O12 thin films derived from a hybrid solgel process”, Thin Solid Films, 379: 89-93 (2000).
  • [19] Wang, H., Fu, L. W., Hang, S. X., “Preparation and Properties of Bi4Ti3O12 Single-Crystal Thin Films by Atmospheric Pressure Metalorganic Chemical Vapor Deposition”, J. Appl. Phys., 73 (11): 7963 (1993).
  • [20] Joshi, P.C., Krupandihi, S.B., “Switching, fatigue, and retention in ferroelectric Bi4Ti3O12 thin films”, Appl.Phys. Lett., 62 (16): 1928-1930 (1993).
  • [21] A.Q., Jiang, G.H., Li,, L.D., Zhang, “Dielectric study in nanocrystalline Bi4Ti3O12 prepared by chemical coprecipitation”, J.Appl.Phys., 83 (9): 4878-4883 (1998).
  • [22] Lee, J.J., Alluri, P., Dey, S.K., "Effect of interfaces on the electrical behavior of (Pb0.72La 0.28) TiO3 thin films”, Appl.Phys.Lett., 65 (16): 2027-2029 (1994)
There are 22 citations in total.

Details

Primary Language English
Journal Section Physics
Authors

Funda Parlaktürk This is me

Arif Agasıev This is me

Adem Tataroğlu This is me

Şemsettin Altındal This is me

Publication Date March 28, 2010
Published in Issue Year 2007 Volume: 20 Issue: 4

Cite

APA Parlaktürk, F., Agasıev, A., Tataroğlu, A., Altındal, Ş. (2010). Current-Voltage (I-V) and Capacitance-Voltage (C-V) Characteristics of Au/Bi4Ti3O12/SnO2 Structures. Gazi University Journal of Science, 20(4), 97-102.
AMA Parlaktürk F, Agasıev A, Tataroğlu A, Altındal Ş. Current-Voltage (I-V) and Capacitance-Voltage (C-V) Characteristics of Au/Bi4Ti3O12/SnO2 Structures. Gazi University Journal of Science. March 2010;20(4):97-102.
Chicago Parlaktürk, Funda, Arif Agasıev, Adem Tataroğlu, and Şemsettin Altındal. “Current-Voltage (I-V) and Capacitance-Voltage (C-V) Characteristics of Au/Bi4Ti3O12/SnO2 Structures”. Gazi University Journal of Science 20, no. 4 (March 2010): 97-102.
EndNote Parlaktürk F, Agasıev A, Tataroğlu A, Altındal Ş (March 1, 2010) Current-Voltage (I-V) and Capacitance-Voltage (C-V) Characteristics of Au/Bi4Ti3O12/SnO2 Structures. Gazi University Journal of Science 20 4 97–102.
IEEE F. Parlaktürk, A. Agasıev, A. Tataroğlu, and Ş. Altındal, “Current-Voltage (I-V) and Capacitance-Voltage (C-V) Characteristics of Au/Bi4Ti3O12/SnO2 Structures”, Gazi University Journal of Science, vol. 20, no. 4, pp. 97–102, 2010.
ISNAD Parlaktürk, Funda et al. “Current-Voltage (I-V) and Capacitance-Voltage (C-V) Characteristics of Au/Bi4Ti3O12/SnO2 Structures”. Gazi University Journal of Science 20/4 (March 2010), 97-102.
JAMA Parlaktürk F, Agasıev A, Tataroğlu A, Altındal Ş. Current-Voltage (I-V) and Capacitance-Voltage (C-V) Characteristics of Au/Bi4Ti3O12/SnO2 Structures. Gazi University Journal of Science. 2010;20:97–102.
MLA Parlaktürk, Funda et al. “Current-Voltage (I-V) and Capacitance-Voltage (C-V) Characteristics of Au/Bi4Ti3O12/SnO2 Structures”. Gazi University Journal of Science, vol. 20, no. 4, 2010, pp. 97-102.
Vancouver Parlaktürk F, Agasıev A, Tataroğlu A, Altındal Ş. Current-Voltage (I-V) and Capacitance-Voltage (C-V) Characteristics of Au/Bi4Ti3O12/SnO2 Structures. Gazi University Journal of Science. 2010;20(4):97-102.