Review: An Optical Surface Probe by Reflectance Anisotropy Spectroscopy

Volume: 6 Number: 2 June 30, 2019
  • Orhan Zeybek
EN

Review: An Optical Surface Probe by Reflectance Anisotropy Spectroscopy

Abstract

Rface and interface information. RAS measures the difference in reflectance of light eflectance anisotropy spectroscopy RAS is an optical technique to produce surlinearly polarised along two orthogonal axes in the surface at near normal incidence as a function of photon energy. The quantity obtained by RAS is the so-called reflectance anisotropy. Since only the surface is anisotropic, the measured reflectance anisotropy is connected only with the atomic composition of the surface, not of the bulk. This review presents theoretical as well as experimental procedure to explain RAS technique.

Keywords

References

  1. 1. Azzam RMA, Bashara NM. Ellipsometry and Polarised light. North- Holland Physics publishing, Amsterdam, (1987).
  2. 2. McIntyre JDE, Aspnes DE. Differential reflection spectroscopy of very thin surface films. Surf Sci 24 (1971) 417.
  3. 3. Aspnes DE, Studna AA. High Precision Scanning Ellipsometer. Appl Opt 14 (1975) 220.
  4. 4. Shvets VA, Spesivtsev EV, Rykhlitskii SV, Mikhailov NN. Ellipsometry as a high-precision technique for subnanometerresolved monitoring of thin-film structures. Nanotechnologies in Russia 4(3) (2009) 201.
  5. 5. Aspnes DE. Abovebandgap optical anisotropies in cubic semiconductors: A visible–near ultraviolet probe of surfaces. J Vac Sci Technol B 3 (1985) 1498.
  6. 6. Aspnes DE, Studna AA. Anisotropies in the Above Band-Gap Optical Spectra of Cubic Semiconductors. Phys Rev Lett 54 (1985)1956.
  7. 7. Aspnes DE, Colas E, Studna AA, Bhat R, Koza MA, Keramidas VG. Kinetic Limits of Monolayer Growth on (001) GaAs by Organometallic Chemical-vapor Deposition. Phys Rev Lett 61 (1988) 2782.
  8. 8. Aspnes DE, Harbison JP, Studna AA, Florez LT. Application of reflectance difference spectroscopy to molecular-beam epitaxy growth of GaAs and AlAs. J Vac Sci Technol A 6 (1988) 1327.

Details

Primary Language

English

Subjects

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Journal Section

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Authors

Orhan Zeybek This is me

Publication Date

June 30, 2019

Submission Date

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Acceptance Date

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Published in Issue

Year 2019 Volume: 6 Number: 2

APA
Zeybek, O. (2019). Review: An Optical Surface Probe by Reflectance Anisotropy Spectroscopy. Hittite Journal of Science and Engineering, 6(2), 147-152. https://doi.org/10.17350/HJSE19030000140
AMA
1.Zeybek O. Review: An Optical Surface Probe by Reflectance Anisotropy Spectroscopy. Hittite J Sci Eng. 2019;6(2):147-152. doi:10.17350/HJSE19030000140
Chicago
Zeybek, Orhan. 2019. “Review: An Optical Surface Probe by Reflectance Anisotropy Spectroscopy”. Hittite Journal of Science and Engineering 6 (2): 147-52. https://doi.org/10.17350/HJSE19030000140.
EndNote
Zeybek O (June 1, 2019) Review: An Optical Surface Probe by Reflectance Anisotropy Spectroscopy. Hittite Journal of Science and Engineering 6 2 147–152.
IEEE
[1]O. Zeybek, “Review: An Optical Surface Probe by Reflectance Anisotropy Spectroscopy”, Hittite J Sci Eng, vol. 6, no. 2, pp. 147–152, June 2019, doi: 10.17350/HJSE19030000140.
ISNAD
Zeybek, Orhan. “Review: An Optical Surface Probe by Reflectance Anisotropy Spectroscopy”. Hittite Journal of Science and Engineering 6/2 (June 1, 2019): 147-152. https://doi.org/10.17350/HJSE19030000140.
JAMA
1.Zeybek O. Review: An Optical Surface Probe by Reflectance Anisotropy Spectroscopy. Hittite J Sci Eng. 2019;6:147–152.
MLA
Zeybek, Orhan. “Review: An Optical Surface Probe by Reflectance Anisotropy Spectroscopy”. Hittite Journal of Science and Engineering, vol. 6, no. 2, June 2019, pp. 147-52, doi:10.17350/HJSE19030000140.
Vancouver
1.Orhan Zeybek. Review: An Optical Surface Probe by Reflectance Anisotropy Spectroscopy. Hittite J Sci Eng. 2019 Jun. 1;6(2):147-52. doi:10.17350/HJSE19030000140

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