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SVDD Based Data-Driven Fault Detection

Year 2016, Special Issue (2016), 408 - 411, 01.12.2016

Abstract

Conventional data driven process monitoring algorithms are limited to
Gaussian process data for principal component analysis (PCA) algorithm and
non-Gaussian process data for independent component analysis (ICA) algorithm.
This paper provides a comparison study between the conventional data driven
methods and support vector data description (SVDD) algorithm for fault
detection (FD). Different from the traditional methods, SVDD algorithm has no
Gausssian assumption. Thus the distribution of process data is not important
for SVDD method. In order to compare their FD performances of the proposed
methods from the application viewpoint, Tennessee Eastman (TE) benchmark
process is utilized to compare the results of all the discussed methods.
Simulation results on TE process show that ICA and SVDD methods perform better
for false faults than the PCA method.

References

  • [1] Shams M. B., Budman H. M., and Duever T. A., Fault detection, identification and diagnosis using CUSUM based PCA, Chemical Engineering Science, 66(20), 4488-4498, 2011.
  • Villegas T., Fuente M. J., and Rodríguez M., Principal component analysis for fault detection and diagnosis. experience with a pilot plant, In CIMMACS'10 Proceedings of the 9th WSEAS international conference on computational intelligence, man-machine systems and cybernetics , 2010, December, pp. 147-152.
Year 2016, Special Issue (2016), 408 - 411, 01.12.2016

Abstract

References

  • [1] Shams M. B., Budman H. M., and Duever T. A., Fault detection, identification and diagnosis using CUSUM based PCA, Chemical Engineering Science, 66(20), 4488-4498, 2011.
  • Villegas T., Fuente M. J., and Rodríguez M., Principal component analysis for fault detection and diagnosis. experience with a pilot plant, In CIMMACS'10 Proceedings of the 9th WSEAS international conference on computational intelligence, man-machine systems and cybernetics , 2010, December, pp. 147-152.
There are 2 citations in total.

Details

Subjects Engineering
Journal Section Research Article
Authors

Yusuf Sevim

Publication Date December 1, 2016
Published in Issue Year 2016 Special Issue (2016)

Cite

APA Sevim, Y. (2016). SVDD Based Data-Driven Fault Detection. International Journal of Applied Mathematics Electronics and Computers(Special Issue-1), 408-411. https://doi.org/10.18100/ijamec.285123
AMA Sevim Y. SVDD Based Data-Driven Fault Detection. International Journal of Applied Mathematics Electronics and Computers. December 2016;(Special Issue-1):408-411. doi:10.18100/ijamec.285123
Chicago Sevim, Yusuf. “SVDD Based Data-Driven Fault Detection”. International Journal of Applied Mathematics Electronics and Computers, no. Special Issue-1 (December 2016): 408-11. https://doi.org/10.18100/ijamec.285123.
EndNote Sevim Y (December 1, 2016) SVDD Based Data-Driven Fault Detection. International Journal of Applied Mathematics Electronics and Computers Special Issue-1 408–411.
IEEE Y. Sevim, “SVDD Based Data-Driven Fault Detection”, International Journal of Applied Mathematics Electronics and Computers, no. Special Issue-1, pp. 408–411, December 2016, doi: 10.18100/ijamec.285123.
ISNAD Sevim, Yusuf. “SVDD Based Data-Driven Fault Detection”. International Journal of Applied Mathematics Electronics and Computers Special Issue-1 (December 2016), 408-411. https://doi.org/10.18100/ijamec.285123.
JAMA Sevim Y. SVDD Based Data-Driven Fault Detection. International Journal of Applied Mathematics Electronics and Computers. 2016;:408–411.
MLA Sevim, Yusuf. “SVDD Based Data-Driven Fault Detection”. International Journal of Applied Mathematics Electronics and Computers, no. Special Issue-1, 2016, pp. 408-11, doi:10.18100/ijamec.285123.
Vancouver Sevim Y. SVDD Based Data-Driven Fault Detection. International Journal of Applied Mathematics Electronics and Computers. 2016(Special Issue-1):408-11.