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RELIABILITY ANALYSIS OF ADSS CABLES USING DRY BAND ARCING TEST

Year 2008, Volume: 8 Issue: 1, 593 - 601, 02.01.2012
https://izlik.org/JA93EY33AD

Abstract

RELIABILITY ANALYSIS OF ADSS CABLES USING DRY BAND ARCING TEST

References

  • G. Carlton, C. N. Carter, and A. J. Peacock, “Progress in the long term testing of an all dielectric self supporting cable for power system use,” in Proc. 12th Int. Conf. Electricity Distribution, 1993, pp. 3.16/1–3.16/4.
  • G. Carlton, A. Bartlett, C. Carter, and T. Parkin, “UK power utilities, experience with optical telecommunications cabling systems,” Power Eng. J., vol. 9, pp. 7–14, Feb. 1995.
  • M. W. Tuominen and R. G. Olsen, “Electrical design parameters of alldielectric self supporting fiber optic cable,” IEEE Trans. Power Del., vol. 15, no. 3, pp. 940–947, Jul. 2000.
  • F. Kaidanov, R. Munteanu, and G. Sheinfain, “Damages and destruction of fiber optic cables on 161 kV overhead transmission lines,” IEEE Elect. Insul. Mag., vol. 16, no. 4, pp. 16–23, Jul. 2000.
  • G. Karady, G. Besztercey, and M.W. Tuominen, “Corona caused deterioration of ADSS fiber-optic cables on high-voltage lines,” IEEE Trans. Power Del., vol. 14, no. 4, pp. 1438–1447, Oct. 1999.
  • V. Chartier, “Private notes on fiber-optic cable failures,” in Proc. IEEE Panel Sess. Winter Power Meet., New York, 1997.
  • G. Karady, E. Al-Ammar, B. Shi and M. W. Tuominen ,“ Experimental Verification of The Proposed IEEE Performance and Testing Standard for ADSS Fiber Optic Cable for Use on Electric Utility Power Lines” , IEEE Trans. Power Del., vol. 21, no. 1, pp. 450-455, Jan. 2006.
  • IEEE Standard for All Dielectric Self Supporting Fiber Optic Cable (2004).
  • G. Karady and D. Srinivasan, “Algorithm to predict dry-band arcing in fiber-optic cables,” IEEE Trans. Power Del., vol. 16, no. 2, pp. 286–291, Apr. 2001.
  • Kapur, K.C., and Lamberson, L.R., , Reliability in Engineering Design, pp 8-30, John Wiley & Sons, New York,1977.
  • Mark P. Kaminskiy, Vasiliy V. Kristov, A simple Procedure for Bayesian Estimation of the Weibull Distrubition, IEEE Transactions on Reliability, Vol.54 No.4, pp. 612-616, December 2005.

Year 2008, Volume: 8 Issue: 1, 593 - 601, 02.01.2012
https://izlik.org/JA93EY33AD

Abstract

References

  • G. Carlton, C. N. Carter, and A. J. Peacock, “Progress in the long term testing of an all dielectric self supporting cable for power system use,” in Proc. 12th Int. Conf. Electricity Distribution, 1993, pp. 3.16/1–3.16/4.
  • G. Carlton, A. Bartlett, C. Carter, and T. Parkin, “UK power utilities, experience with optical telecommunications cabling systems,” Power Eng. J., vol. 9, pp. 7–14, Feb. 1995.
  • M. W. Tuominen and R. G. Olsen, “Electrical design parameters of alldielectric self supporting fiber optic cable,” IEEE Trans. Power Del., vol. 15, no. 3, pp. 940–947, Jul. 2000.
  • F. Kaidanov, R. Munteanu, and G. Sheinfain, “Damages and destruction of fiber optic cables on 161 kV overhead transmission lines,” IEEE Elect. Insul. Mag., vol. 16, no. 4, pp. 16–23, Jul. 2000.
  • G. Karady, G. Besztercey, and M.W. Tuominen, “Corona caused deterioration of ADSS fiber-optic cables on high-voltage lines,” IEEE Trans. Power Del., vol. 14, no. 4, pp. 1438–1447, Oct. 1999.
  • V. Chartier, “Private notes on fiber-optic cable failures,” in Proc. IEEE Panel Sess. Winter Power Meet., New York, 1997.
  • G. Karady, E. Al-Ammar, B. Shi and M. W. Tuominen ,“ Experimental Verification of The Proposed IEEE Performance and Testing Standard for ADSS Fiber Optic Cable for Use on Electric Utility Power Lines” , IEEE Trans. Power Del., vol. 21, no. 1, pp. 450-455, Jan. 2006.
  • IEEE Standard for All Dielectric Self Supporting Fiber Optic Cable (2004).
  • G. Karady and D. Srinivasan, “Algorithm to predict dry-band arcing in fiber-optic cables,” IEEE Trans. Power Del., vol. 16, no. 2, pp. 286–291, Apr. 2001.
  • Kapur, K.C., and Lamberson, L.R., , Reliability in Engineering Design, pp 8-30, John Wiley & Sons, New York,1977.
  • Mark P. Kaminskiy, Vasiliy V. Kristov, A simple Procedure for Bayesian Estimation of the Weibull Distrubition, IEEE Transactions on Reliability, Vol.54 No.4, pp. 612-616, December 2005.
There are 11 citations in total.

Details

Primary Language English
Authors

İbrahim Güneş This is me

Yasin Özcelep This is me

Publication Date January 2, 2012
IZ https://izlik.org/JA93EY33AD
Published in Issue Year 2008 Volume: 8 Issue: 1

Cite

APA Güneş, İ., & Özcelep, Y. (2012). RELIABILITY ANALYSIS OF ADSS CABLES USING DRY BAND ARCING TEST. IU-Journal of Electrical & Electronics Engineering, 8(1), 593-601. https://izlik.org/JA93EY33AD
AMA 1.Güneş İ, Özcelep Y. RELIABILITY ANALYSIS OF ADSS CABLES USING DRY BAND ARCING TEST. IU-Journal of Electrical & Electronics Engineering. 2012;8(1):593-601. https://izlik.org/JA93EY33AD
Chicago Güneş, İbrahim, and Yasin Özcelep. 2012. “RELIABILITY ANALYSIS OF ADSS CABLES USING DRY BAND ARCING TEST”. IU-Journal of Electrical & Electronics Engineering 8 (1): 593-601. https://izlik.org/JA93EY33AD.
EndNote Güneş İ, Özcelep Y (January 1, 2012) RELIABILITY ANALYSIS OF ADSS CABLES USING DRY BAND ARCING TEST. IU-Journal of Electrical & Electronics Engineering 8 1 593–601.
IEEE [1]İ. Güneş and Y. Özcelep, “RELIABILITY ANALYSIS OF ADSS CABLES USING DRY BAND ARCING TEST”, IU-Journal of Electrical & Electronics Engineering, vol. 8, no. 1, pp. 593–601, Jan. 2012, [Online]. Available: https://izlik.org/JA93EY33AD
ISNAD Güneş, İbrahim - Özcelep, Yasin. “RELIABILITY ANALYSIS OF ADSS CABLES USING DRY BAND ARCING TEST”. IU-Journal of Electrical & Electronics Engineering 8/1 (January 1, 2012): 593-601. https://izlik.org/JA93EY33AD.
JAMA 1.Güneş İ, Özcelep Y. RELIABILITY ANALYSIS OF ADSS CABLES USING DRY BAND ARCING TEST. IU-Journal of Electrical & Electronics Engineering. 2012;8:593–601.
MLA Güneş, İbrahim, and Yasin Özcelep. “RELIABILITY ANALYSIS OF ADSS CABLES USING DRY BAND ARCING TEST”. IU-Journal of Electrical & Electronics Engineering, vol. 8, no. 1, Jan. 2012, pp. 593-01, https://izlik.org/JA93EY33AD.
Vancouver 1.Güneş İ, Özcelep Y. RELIABILITY ANALYSIS OF ADSS CABLES USING DRY BAND ARCING TEST. IU-Journal of Electrical & Electronics Engineering [Internet]. 2012 Jan. 1;8(1):593-601. Available from: https://izlik.org/JA93EY33AD