Optimization of doping process parameters of cerium vanadates doped with Be, Mg, Ca, Sr and Ba ions

Abstract

In this research Taguchi method was applied to determine optimum parameters of doping process of cerium vanadate with Be, Mg, Ca, Sr and Ba ions. Percentage and type of doping ions are used as parameters in optimization process applied as orthogonal array to decrease the number of experiments. The calculated unit cell volume by Rietveld Refinement analysis via X-ray diffraction data (XRD) were used to confirm the formation of doped cerium vanadates. ANOVA method was applied to determine the effectiveness of the parameters. 

Keywords

• Cerium vanadate
• metal doping
• X-ray diffraction
• Rietveld refinement method
• Taguchi optimization method

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