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INFLUENCE OF ALUMINUM CONCENTRATION ON THE ELECTRICAL AND OPTICAL PROPERTIES OF ZnO THIN FILMS

Year 2016, Volume: 3 Issue: 3, 453 - 462, 08.01.2017
https://doi.org/10.18596/jotcsa.18812

Abstract

Al:ZnO thin films having with different Al concentrations were deposited on glass substrates by a sol-gel technique. The effects of Al doping on the structural, optical and electrical properties of Al:ZnO were investigated using with XRD, optical transmittance and sheet resistance measurements. The concentration of zinc acetate was 0.1 M. Al content in the starting solution was varied from 0 to 20% as the molarity range. Optical transmittance spectra of the films in the form of Film/Glass were used to determine the film thickness and optical band gaps. The optical transmissions of Al:ZnO thin films were higher than 80% in the visible and near infrared region. The optical band gaps of Al:ZnO films decrease with increase of Al content. In order to obtain the average sheet resistance of the films the current and voltage through the probes have been measured for five different position by four-point probe method. The results showed that the sheet resistances of Al:ZnO thin films increased with the Al concentration. Considering the film thickness and geometric factor, the electrical resistivity values were computed. It was observed that the sheet resistance of AZO films up to 10% molarity of Al in the starting solution increased.

References

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  • Kobayashi K, Maeda T, Matsushima S, Okada G, Mechanism of Photoinduced Charge Transfer of Cu-Doped ZnO Film in Strong Electric Field. J Mater Sci. 1992;32:9R-3854. http://stacks.iop.org/1347-4065/32/i=9R/a=3854.
  • Li Q. H, Zhu D, Liu W, Liu Y, Ma X. C, Optical properties of Al-doped ZnO thin films by ellipsometry. Appl. Surface Sci. 2008, 254, 2922-2926. DOI:10.1016/j.apsusc.2007.09.104.
  • Kim H, Horwitz J. S, Kushto G. P, Kafa Z. H, Chrisey D. B, Indium tin oxide thin films grown on flexible plastic substrates by pulsed-laser deposition for organic light-emitting diodes. Appl. Phys. Lett. 2001; 79: 284-286. DOI: 10.1063/1.1350595.
  • Hung-Chun H, Basheer L. T, Kuznetsov V. L, Egdell R. G, Jacobs R. M. J, Pepper M, and Edwards P.P, Dopant-induced bandgap shift in Al-doped ZnO thin films prepared by spray pyrolysis. J. Appl. Phys. 2012;112:083708. DOI:/10.1063/1.4759208.
  • Sivasankar G, Ramajothi J, Aluminium Doped Zinc Oxide (ZnO) Thin Film Fabricated for Semiconductor by Spray Pyrolysis Technique. International Journal of ChemTech Research. 2015; 8:11: 497-501. http://sphinxsai.com/2015/ch_vol8_no11/2/(497-501)V8N11CT.pdf.
  • Gungor E, Gungor T, Effect of the substrate movement on the optical properties of ZnO thin films deposited by ultrasonic spray pyrolysis, Advances in Materials Science and Engineering. 2012;1-7 Article ID 594971. DOI: 10.1155/2012/594971.
  • Birgin E. G, Chambouleyron I, and Martinez J. M, Estimation of optical constants of thin films using unconstrained optimization. Journal of Computational Physics. 1999; 151: 862-888.
  • Swanepoel R, Determination of the thickness and optical constants of amorphous silicon Journal of Physics E: Scientific Instruments. 1983; 16:12: 1214-1222. DOI:10.1088/0022-3735/16/12/023
  • E. Gungor, T. Gungor, D. Caliskan, A, Ceylan, and E. Ozbay, Applied Surface Science, 318, 309–313 (2014). DOI:10.1016/j.apsusc.2014.06.132.
  • Lee J. H, Park B. O, Characteristics of Al-doped ZnO thin films obtained by ultrasonic spray pyrolysis: effects of Al doping and an annealing treatment. Materials Science and Engineering: B
  • 15 February 2004; 106:3, 242–245. DOI:10.1016/j.mseb.2003.09.040.
  • Pankove J. I, Optical processes in semiconductors, (Dover Publications, Inc. NewYork, 1975) p. 91.
Year 2016, Volume: 3 Issue: 3, 453 - 462, 08.01.2017
https://doi.org/10.18596/jotcsa.18812

Abstract

References

  • Minami T, Sato H, Nanto H, Takata S, Highly Conductive and Transparent Silicon Doped Zinc Oxide Thin Films Prepared by RF Magnetron Sputtering. Jpn J Appl Phys. 1986;25:9-L776. http://stacks.iop.org/1347-4065/25/i=9A/a=L776.
  • Kobayashi K, Maeda T, Matsushima S, Okada G, Mechanism of Photoinduced Charge Transfer of Cu-Doped ZnO Film in Strong Electric Field. J Mater Sci. 1992;32:9R-3854. http://stacks.iop.org/1347-4065/32/i=9R/a=3854.
  • Li Q. H, Zhu D, Liu W, Liu Y, Ma X. C, Optical properties of Al-doped ZnO thin films by ellipsometry. Appl. Surface Sci. 2008, 254, 2922-2926. DOI:10.1016/j.apsusc.2007.09.104.
  • Kim H, Horwitz J. S, Kushto G. P, Kafa Z. H, Chrisey D. B, Indium tin oxide thin films grown on flexible plastic substrates by pulsed-laser deposition for organic light-emitting diodes. Appl. Phys. Lett. 2001; 79: 284-286. DOI: 10.1063/1.1350595.
  • Hung-Chun H, Basheer L. T, Kuznetsov V. L, Egdell R. G, Jacobs R. M. J, Pepper M, and Edwards P.P, Dopant-induced bandgap shift in Al-doped ZnO thin films prepared by spray pyrolysis. J. Appl. Phys. 2012;112:083708. DOI:/10.1063/1.4759208.
  • Sivasankar G, Ramajothi J, Aluminium Doped Zinc Oxide (ZnO) Thin Film Fabricated for Semiconductor by Spray Pyrolysis Technique. International Journal of ChemTech Research. 2015; 8:11: 497-501. http://sphinxsai.com/2015/ch_vol8_no11/2/(497-501)V8N11CT.pdf.
  • Gungor E, Gungor T, Effect of the substrate movement on the optical properties of ZnO thin films deposited by ultrasonic spray pyrolysis, Advances in Materials Science and Engineering. 2012;1-7 Article ID 594971. DOI: 10.1155/2012/594971.
  • Birgin E. G, Chambouleyron I, and Martinez J. M, Estimation of optical constants of thin films using unconstrained optimization. Journal of Computational Physics. 1999; 151: 862-888.
  • Swanepoel R, Determination of the thickness and optical constants of amorphous silicon Journal of Physics E: Scientific Instruments. 1983; 16:12: 1214-1222. DOI:10.1088/0022-3735/16/12/023
  • E. Gungor, T. Gungor, D. Caliskan, A, Ceylan, and E. Ozbay, Applied Surface Science, 318, 309–313 (2014). DOI:10.1016/j.apsusc.2014.06.132.
  • Lee J. H, Park B. O, Characteristics of Al-doped ZnO thin films obtained by ultrasonic spray pyrolysis: effects of Al doping and an annealing treatment. Materials Science and Engineering: B
  • 15 February 2004; 106:3, 242–245. DOI:10.1016/j.mseb.2003.09.040.
  • Pankove J. I, Optical processes in semiconductors, (Dover Publications, Inc. NewYork, 1975) p. 91.
There are 13 citations in total.

Details

Journal Section Articles
Authors

Ebru Güngör This is me

Tayyar Gungor

Publication Date January 8, 2017
Submission Date July 9, 2016
Published in Issue Year 2016 Volume: 3 Issue: 3

Cite

Vancouver Güngör E, Gungor T. INFLUENCE OF ALUMINUM CONCENTRATION ON THE ELECTRICAL AND OPTICAL PROPERTIES OF ZnO THIN FILMS. JOTCSA. 2017;3(3):453-62.