Characterization of sol-gel derived NiO thin films: Effect of post-heat treatment

Djanette Meriem Blizak; Drifa Brinis

Characterization of sol-gel derived NiO thin films: Effect of post-heat treatment

Abstract

Nickel Oxide (NiO) thin films have a wide range of applications in the field of photovoltaics and optoelectronics technology, due to their excellent properties. By modifying the composition and state of the structure with heat treatments, most of the properties of the film are improved. Thus, this study aim to show the behavior of NiO thin films with the post-heat treatment. We prepared thin films of nickel oxide (NiO) by the spray pyrolysis method, deposited on glass substrates and heated to different temperatures (200 °C, 250 °C and 300 °C). The obtained samples were characterized by UV-Visible spectroscopy, contact angle measure-ment and Raman spectroscopy. We found that the transmittance of films increases with the annealing temperature and Urbach energy (disorder) decreases with increasing optics gap and annealing temperature. Also, the contact angle increases with the temperature of the annealing, but the surface remains hydrophilic. Furthermore, the Raman spectrum has shown the presence of the crystalline state and amorphous carbon (graphite).

Keywords

References

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Details

Primary Language

English

Subjects

Biochemistry and Cell Biology (Other)

Journal Section

Research Article

Authors

Djanette Meriem Blizak ^*
0000-0001-7311-3442
Algeria

Drifa Brinis This is me
0000-0001-8290-2574
Algeria

Publication Date

August 1, 2024

Submission Date

November 4, 2022

Acceptance Date

March 23, 2023

Published in Issue

Year 2024 Volume: 42 Number: 4

IZ

https://izlik.org/JA82FF74PB

Cite

RIS / Bibtex

APA

Meriem Blizak, D., & Brinis, D. (2024). Characterization of sol-gel derived NiO thin films: Effect of post-heat treatment. Sigma Journal of Engineering and Natural Sciences, 42(4), 1009-1015. https://izlik.org/JA82FF74PB

AMA

1.Meriem Blizak D, Brinis D. Characterization of sol-gel derived NiO thin films: Effect of post-heat treatment. SIGMA. 2024;42(4):1009-1015. https://izlik.org/JA82FF74PB

Chicago

Meriem Blizak, Djanette, and Drifa Brinis. 2024. “Characterization of Sol-Gel Derived NiO Thin Films: Effect of Post-Heat Treatment”. Sigma Journal of Engineering and Natural Sciences 42 (4): 1009-15. https://izlik.org/JA82FF74PB.

EndNote

Meriem Blizak D, Brinis D (August 1, 2024) Characterization of sol-gel derived NiO thin films: Effect of post-heat treatment. Sigma Journal of Engineering and Natural Sciences 42 4 1009–1015.

IEEE

[1]D. Meriem Blizak and D. Brinis, “Characterization of sol-gel derived NiO thin films: Effect of post-heat treatment”, SIGMA, vol. 42, no. 4, pp. 1009–1015, Aug. 2024, [Online]. Available: https://izlik.org/JA82FF74PB

ISNAD

Meriem Blizak, Djanette - Brinis, Drifa. “Characterization of Sol-Gel Derived NiO Thin Films: Effect of Post-Heat Treatment”. Sigma Journal of Engineering and Natural Sciences 42/4 (August 1, 2024): 1009-1015. https://izlik.org/JA82FF74PB.

JAMA

1.Meriem Blizak D, Brinis D. Characterization of sol-gel derived NiO thin films: Effect of post-heat treatment. SIGMA. 2024;42:1009–1015.

MLA

Meriem Blizak, Djanette, and Drifa Brinis. “Characterization of Sol-Gel Derived NiO Thin Films: Effect of Post-Heat Treatment”. Sigma Journal of Engineering and Natural Sciences, vol. 42, no. 4, Aug. 2024, pp. 1009-15, https://izlik.org/JA82FF74PB.

Vancouver

1.Djanette Meriem Blizak, Drifa Brinis. Characterization of sol-gel derived NiO thin films: Effect of post-heat treatment. SIGMA [Internet]. 2024 Aug. 1;42(4):1009-15. Available from: https://izlik.org/JA82FF74PB