Research Article

STABILIZATION OF MINORITY CARRIER LIFETIME IN PERC STRUCTURED SILICON SOLAR CELL

Volume: 7 Number: 2 February 1, 2021
  • Veysel Ünsür *
EN

STABILIZATION OF MINORITY CARRIER LIFETIME IN PERC STRUCTURED SILICON SOLAR CELL

Abstract

This paper reports on the regeneration of the minority carrier lifetime in passivated emitter and rear cell (PERC) structured silicon solar cells. It is observed that minority carrier lifetime in the cells can degrade, recover and then stabilize with illumination level of ~1 sun (1000 W/m2) at 80oC. The exposure to ~1 sun illumination at 80oC enables the release of H from B-H bonds at ~1.3 eV energy to supplement the interstitial H in Si to passivate the B-O defects responsible for the minority carrier lifetime instability. Passivation of these B-O defects is therefore, dependent on temperature and time, hydrogenation and high carrier injection level. It was interesting to note that sequential process or single regeneration step led to same conclusion that minority carrier lifetime in a p-type PERC cell first degrades, due to B-O complexes, recovers and then stabilize with time. There is therefore, no need to degrade the cells in a separate step in order for regeneration to occur, because regeneration encompasses the three states: degradation, recovery and stabilization.

Keywords

References

  1. [1] Crabb RL. Photon induced degradation of electron and proton irradiated silicon solar cells. IEEE Transactions on Nuclear Science. 1973 Dec;20(6):243-9. https:// doi.org/10.1109/TNS.1973.4327402
  2. [2] Schmidt J, Bothe K. Structure and transformation of the metastable boron-and oxygen-related defect center in crystalline silicon. Physical review B. 2004 Jan 22;69(2):024107. https://doi.org/10.1103/PhysRevB.69.024107
  3. [3] Glunz SW, Rein S, Warta W, Knobloch J, Wettling W. Degradation of carrier lifetime in Cz silicon solar cells. Solar energy materials and solar cells. 2001 Jan 1;65(1-4):219-29. https://doi.org/10.1016/S0927-0248(00)00098-2
  4. [4] Unsur V, Hussain B and Ebong A. Complete Recovery of Light Induced Degradation of Cz Silicon Solar Cells with Rapid Thermal Processing. IEEE 43rd Photovoltaic Specialists Conference (PVSC).2016, https://doi.org/10.1109/PVSC.2016.7749695.
  5. [5] Ebong A, Chen N, Chowdhury A and Unsur V. The impact of rapid thermal processing (RTP) on crystalline silicon solar cell performance and light induced degradation (LID). IEEE 42nd Photovoltaic Specialists Conference (PVSC), Jun. 2015. https://doi.org/ 10.1109/PVSC.2015.7355879.
  6. [6] Sopori B, Basnyat P, Devayajanam S, Shet S, Mehta V, Binns J, Appel J. Understanding light-induced degradation of c-Si solar cells. In2012 38th IEEE Photovoltaic Specialists Conference 2012 Jun 3 (pp. 001115-001120). IEEE. https://doi.org/10.1109/PVSC.2012.6317798
  7. [7] Herguth A, Schubert G, Kaes M, Hahn G. A new approach to prevent the negative impact of the metastable defect in boron doped cz silicon solar cells. Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on, IEEE, 2006, pp. 940-943. https://doi.org/10.1109/WCPEC.2006.279611
  8. [8] Münzer KA. Hydrogenated silicon nitride for regeneration of light induced degradation. In Proceedings of the 24th European Photovoltaic Solar Energy Conference 2009 Sep 21 (pp. 1558-1561).

Details

Primary Language

English

Subjects

Engineering

Journal Section

Research Article

Authors

Veysel Ünsür * This is me
0000-0002-5942-4129
Türkiye

Publication Date

February 1, 2021

Submission Date

October 21, 2019

Acceptance Date

-

Published in Issue

Year 2021 Volume: 7 Number: 2

APA
Ünsür, V. (2021). STABILIZATION OF MINORITY CARRIER LIFETIME IN PERC STRUCTURED SILICON SOLAR CELL. Journal of Thermal Engineering, 7(2), 187-195. https://doi.org/10.18186/thermal.871308
AMA
1.Ünsür V. STABILIZATION OF MINORITY CARRIER LIFETIME IN PERC STRUCTURED SILICON SOLAR CELL. Journal of Thermal Engineering. 2021;7(2):187-195. doi:10.18186/thermal.871308
Chicago
Ünsür, Veysel. 2021. “STABILIZATION OF MINORITY CARRIER LIFETIME IN PERC STRUCTURED SILICON SOLAR CELL”. Journal of Thermal Engineering 7 (2): 187-95. https://doi.org/10.18186/thermal.871308.
EndNote
Ünsür V (February 1, 2021) STABILIZATION OF MINORITY CARRIER LIFETIME IN PERC STRUCTURED SILICON SOLAR CELL. Journal of Thermal Engineering 7 2 187–195.
IEEE
[1]V. Ünsür, “STABILIZATION OF MINORITY CARRIER LIFETIME IN PERC STRUCTURED SILICON SOLAR CELL”, Journal of Thermal Engineering, vol. 7, no. 2, pp. 187–195, Feb. 2021, doi: 10.18186/thermal.871308.
ISNAD
Ünsür, Veysel. “STABILIZATION OF MINORITY CARRIER LIFETIME IN PERC STRUCTURED SILICON SOLAR CELL”. Journal of Thermal Engineering 7/2 (February 1, 2021): 187-195. https://doi.org/10.18186/thermal.871308.
JAMA
1.Ünsür V. STABILIZATION OF MINORITY CARRIER LIFETIME IN PERC STRUCTURED SILICON SOLAR CELL. Journal of Thermal Engineering. 2021;7:187–195.
MLA
Ünsür, Veysel. “STABILIZATION OF MINORITY CARRIER LIFETIME IN PERC STRUCTURED SILICON SOLAR CELL”. Journal of Thermal Engineering, vol. 7, no. 2, Feb. 2021, pp. 187-95, doi:10.18186/thermal.871308.
Vancouver
1.Veysel Ünsür. STABILIZATION OF MINORITY CARRIER LIFETIME IN PERC STRUCTURED SILICON SOLAR CELL. Journal of Thermal Engineering. 2021 Feb. 1;7(2):187-95. doi:10.18186/thermal.871308

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