Electrical, Optical and Structural Analysis Depending on Concentration of TiO Thin Films Produced via Dip-Coating Method

Year 2022, Volume: 14 Issue: 2, 590 - 603, 31.07.2022

Necmi Serkan Tezel , Fatma Meydaneri Tezel , Afşin Kariper

https://doi.org/10.29137/umagd.1070390

Abstract

In this study, TiO thin films were produced on glass lamels by Dip-Coating method at 2 times 5 seconds into solutions prepared at different concentrations (A1:0.8 Molar, A2:1,25x10-2 Molar, A3:2, 5x10-3 Molar) and these films were annealed at 500 °C. In general, these films with an amorphous structure have 2θ = 25,5° (1 0 1) a spread was observed at the Miller orientation peak. With a decrease in the concentration, small grains have changed from a spherical shape to an ellipse of larger and smaller sizes. While there is a lot of reflectivities in the UV region, their transmittance values are quite high in the visible region of 400-700 nm. The energy band gap values of TiO thin films with A1, A2 and A3 concentrations were calculated as Eg = 3.52 eV; 2.60 eV and 3.03 eV, respectively. The increase in the electrical resistivity values with increasing concentration is evidence that the exhibits a typical metal-like behavior due to the particular conductivity in the oxide sub-layers.

Keywords

Thin film, Dip-coating, TiO2, Electrical Resistivity, Optical Properties, Egap

Daldırma Metodu ile Üretilen TiO İnce Filmlerin Derişime Bağlı Elektriksel, Optik ve Yapısal Analizi

Abstract

Bu çalışmada, farklı derişimlerde (A1: 0,8 Molar, A2: 1,25x10-2 Molar, A3: 2,5x10-3 Molar) hazırlanan çözeltilere 2 şer kez 5 saniye daldırma metodu (Dip-coating) ile cam lameller üzerine TiO ince filmleri üretilmiştir ve üretilen bu filmler 500 °C’ de tavlanmıştır. Genel olarak amorf yapıya sahip bu filmlerin 2θ = 25,5° (1 0 1) Miller yönelim pikinde yayılma görülmüştür. Derişimin azalması ile küçük taneli yapılar, küresel şekilden daha irili ufaklı elipse doğru değişim göstermiştir. UV bölgede yansıtma özelliği oldukça fazla iken 400-700 nm görünür bölgede ise geçirgenlikleri oldukça fazladır. A1, A2 ve A3 derişimli TiO ince filmlerin enerji bant aralığı değerleri sırası ile Eg = 3,52 eV; 2,60 eV ve 3,03 eV olarak hesaplanmıştır. Derişimin artması ile elektriksel özdirenç değerlerinin artması, oksit alt tabakalardaki özel iletkenlikten dolayı metal benzeri tipik bir davranış gösterdiğinin kanıtıdır.

Keywords

İnce Tabaka, Daldırma-Kaplama, TiO2, Elektriksel Direnç, Optik Özellikler, Egap

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