Dönel Kaplama Yöntemi ile Üretilen Ag Katkılı CuO İnce Filmlerin Yapısal, Optik ve Morfolojik Özellikleri

Year 2022, Volume: 27 Issue: 3, 489 - 501, 25.12.2022

Şilan Baturay İlhan Candan

https://doi.org/10.53433/yyufbed.1094830

Abstract

Son yıllarda, bakır (II) oksit (CuO) ince filmler benzersiz fiziksel ve kimyasal özelliklerinden dolayı araştırmacılardan büyük ilgi görmektedir. Bu çalışmada, gümüş (Ag) katkılı bakır oksit ince filmleri, çeşitli katkı oranlarında dönel kaplama tekniği uygulanarak cam alttaş üzerinde üretildi. Farklı gümüş katkısına bağlı olarak hazırlanan ince filmlerin yapısal, morfolojik ve optik özellikleri sırasıyla X-ışını kırınımmetresi (XRD), taramalı elektron mikroskobu (SEM) ve UV-VİS spektrofotometrisi kullanılarak incelenmiştir. Ag katkılı CuO filmlerinin XRD desenleri, tüm ince filmlerin polikristal doğaya sahip tenorite yapılı olduğunu göstermiştir. En belirgin yönelimler için stres, düzlemler arası mesafe, kristal büyüklüğü ve dislokasyon yoğunluğu X-ışını kırınımı analizi kullanılarak hesaplandı. En fazla kristal büyüklüğü değeri (111) tercihli yönelimi için katkısız CuO filmine ait olup yüksek kalitede kristalliğe sahip olduğu söylenilebilir. SEM ölçümü, film yüzeylerinde çok küçük bir topaklama ile beraber, ince film yüzeylerinde homojen olarak dağılmış nanoyapı parçacıkların varlığını göstermektedir. SEM görüntülerinin sonucu atomik kuvvet mikroskopu (AFM) ile benzer yapıdadır. EDX bağlantılı FEI Quanta 250 FEG taramalı elektron mikroskopu ile filmlerin tabaka kalınlığı yaklaşık olarak 460 nm civarındadır. Ayrıca, elde edilen örneklerin optik özellikleri, UV-VİS spektrofotometrisi kullanılarak bant aralığı ölçümleri, soğurma ve geçirgenlik değerleri türünden analiz edildi. İnce filmlerin ultraviyole-görünür ölçümleri, oda sıcaklığında CuO ince filminin geçirgenlik ve soğurma değerlerinin Ag katkılanma sonucu değiştiği görülmektedir. Aynı şekilde enerji bant aralığı, artan Ag katkı oranına bağlı olarak değişti.

Keywords

Ag, CuO, Spin kaplama, XRD

Structural, Optical and Morphological Properties of Ag Doped CuO Thin Films Produced by Spin Coating Method

Abstract

In recent years, copper(II) oxide (CuO) thin films have attracted great interest from researchers due to their unique physical and chemical properties. In this study, silver (Ag) doped copper oxide thin films were produced on glass substrate by applying rotational coating technique at various additive ratios. Structural, morphological and optical properties of thin films prepared due to different silver doping were investigated using X-ray diffraction (XRD), scanning electron microscope (SEM) and UV-VİS spectrophotometry, respectively. XRD patterns of Ag-doped CuO films showed that all thin films were tenorite structured with polycrystalline nature. For the most prominent orientations, stress, interplanetary distance, crystal size and dislocation density were calculated using X-ray diffraction analysis. The highest crystal size value (111) belongs to the unadulterated CuO film for its preferential orientation, and it can be said to have high quality crystallinity. SEM measurement shows the presence of homogeneously dispersed nanostructure particles on the thin film surfaces, with very little agglomeration on the film surfaces. The result of SEM images is similar to the atomic force microscope (AFM). With the FEI Quanta 250 FEG scanning electron microscope with EDX coupling, the layer thickness of the films is around 460 nm. In addition, the optical properties of the obtained samples were analyzed in terms of band gap measurements, absorption and transmittance values using UV-vis. Ultraviolet-visible measurements of thin films show that the transmittance and absorption values of CuO thin film at room temperature change as a result of Ag doping. Likewise, the energy band gap changed with increasing Ag doping ratio.

Keywords

Ag, CuO, Spin coating, XRD

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