Structural and Optical Properties of Sb Doped CuO Films

Abstract

Preferentially (111) oriented Sb-doped CuO thin film with various weight fractions (0, 1, 2 and 3 wt% of Sb) have been grown on soda-lime glass substrate (SLG) by spin coating technique. The effect of Sb doping in different amounts on the structural, morphological and optical properties of CuO films was comprehensively investigated via X-ray diffraction (XRD) unit, scanning electron microscopy (SEM) and UV–vis spectrophotometer.  X-ray diffraction spectroscopy studies of the films indicate that thin films are polycrystalline nature along the preferential direction. The morphology of all CuO thin film is uniform with no cracking in the surface. The transmittance of the CuO films changed with an increase in Sb content. Ultraviolet–visible spectrophotometer measurements indicate that a radical increase in the energy band gap of the films with an increase in Sb content from 1.70 to 2.37 eV.  It can be said that the optical properties of the Sb doped CuO thin film were significantly changed.

Keywords

• Thin film,Transmittance,Energy band gap,XRD

Sb Katkılı CuO Filmlerinin Yapısal ve Optik Özellikleri

Abstract

(111) tercihli yönelimli Sb katkılı CuO ince film, çeşitli ağırlık oranlarında (ağırlıkça % 0, 1, 2 ve 3 Sb), soda kireç cam alttaşı (SLG) üzerine dönel kaplama tekniği kullanılarak büyütüldü. Farklı Sb katkısının CuO filmlerin yapısal, morfolojik ve optik özellikleri üzerindeki etkisi, X-ışını difraksiyon (XRD) ünitesi, taramalı elektron mikroskobu (SEM) ve UV-vis spektrofotometresi kullanılarak kapsamlı bir şekilde incelenmiştir. Filmlerin X ışını kırınım spektroskopi çalışmaları, ince filmlerin tercihli yönelim boyunca polikristal doğaya sahip olduklarını göstermektedir. Tüm CuO ince film morfolojisi yüzeyde kusur olmaksızın homojen doğaya sahip olduğunu göstermektedir. Elde edilen CuO filmlerin geçirgenliği, Sb içeriğindeki artışla değişmiştir. Ultraviyole görünür bölge spektrofotometre ölçümleri, elde edilen filmlerin enerji bant aralığında 1.70'den 2.37 eV'ye kadar radikal bir şekilde artış olduğunu göstermektedir. Sb katkılı CuO ince film optik özelliklerinin önemli ölçüde değiştiği söylenebilir.

Keywords

• İnce film,Geçirgenlik,Enerji bant aralığı,XRD

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