Sulphur
doped Co3O4 (S-Co3O4)
nanostructured thin film has been produced by ultrasonic spray pyrolysis (USP)
method. The film has been characterized by X-ray diffraction (XRD),
energy-dispersive X-ray spectroscopy (EDAX), Fourier transform infrared (FT-IR)
and Raman spectroscopy. The surface appearance of the film was obtained using
scanning electron microscope (SEM). Optical reflectance and transmittance
spectra were recorded with a double beam spectrophotometer equipped with an
integrating sphere. The optical constants such as refractive index, extinction
coefficient, optical conductivity, real and imaginary parts of the dielectric
constant of the film were calculated. The XRD pattern shows that the film has
only clear diffraction peaks around 2θ = 29.26o corresponding to the
(111) plane of cubic Co3O4. The crystallite size was
calculated to be approximately 24 nm. The Raman measurements revealed four
peaks of Co3O4. Infrared spectrum of the film has been
investigated in 500–3000 cm−1 region.
Subjects | Engineering |
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Journal Section | Articles |
Authors | |
Publication Date | June 30, 2017 |
Published in Issue | Year 2017 Volume: 18 Issue: 2 |