BibTex RIS Kaynak Göster

Yıl 2015, Cilt: 36 Sayı: 3, 1 - 10, 13.05.2015

Omid Ghahghaei Saeed Malekzadeh Hamed Naeimy

Öz

Kaynakça

  • Jonah A. Harley, Advances in piezoresistive probes for atomic force microscopy, March 2000.
  • Varol A., Gunev I., Orun B., and Basdogan C., Numerical simulation of nano scanning in intermittent-contact mode AFM under Q control. arXiv:1204.3016.
  • Tortonese M., Yamada H., Barrett R.C., Quate C.F. and Edward L., Ginzton Laboratory, Atomic force microscopy using a piezoresistive cantilever. Solid-State Sensors and Actuators, 1991. Digest of Technical Papers, TRANSDUCERS '91., 1991 International Conference on
  • Georg Schitter, Member, IEEE, Karl J. Åström, Fellow, IEEE, Barry E. DeMartini, Member, IEEE, Philipp J. Thurner, Kimberly L. Turner, and Paul K. Hansma, Design and Modeling of a High-Speed AFM-Scanner. IEEE Transactıons on Control Systems Technology, 15 (2007) 5.
  • Miller E.H., A note on reflector arrays (Periodical style Accepted for publication),” IEEE Trans. Antennas Propagat., to be published.

Design & modeling a novel Atomic Force Microscope (AFM) for detect roughness in turning machining

Yıl 2015, Cilt: 36 Sayı: 3, 1 - 10, 13.05.2015

Omid Ghahghaei Saeed Malekzadeh Hamed Naeimy

Öz

Abstract. In this paper we design and modeling a novel AFM (Atomic Force Microscope) that use it in turning machining. We know that work piece roughness is very essential part in final product in every machining method specially in turning. In this case we want to know availability of using AFM in turning. So at first designed a kind of AFM with cantilever beam, piezoelectric and piezoresistance. After that we should modeling this design in our situation, for these we define some surface that may be happen in machining. So know modeled our design for sample surface. At the end of project a P control method has been used for controlling our processing.

Anahtar Kelimeler

Atomic Force Microscope turning machining; roughness; AFM control; cantilever beam

Kaynakça

  • Jonah A. Harley, Advances in piezoresistive probes for atomic force microscopy, March 2000.
  • Varol A., Gunev I., Orun B., and Basdogan C., Numerical simulation of nano scanning in intermittent-contact mode AFM under Q control. arXiv:1204.3016.
  • Tortonese M., Yamada H., Barrett R.C., Quate C.F. and Edward L., Ginzton Laboratory, Atomic force microscopy using a piezoresistive cantilever. Solid-State Sensors and Actuators, 1991. Digest of Technical Papers, TRANSDUCERS '91., 1991 International Conference on
  • Georg Schitter, Member, IEEE, Karl J. Åström, Fellow, IEEE, Barry E. DeMartini, Member, IEEE, Philipp J. Thurner, Kimberly L. Turner, and Paul K. Hansma, Design and Modeling of a High-Speed AFM-Scanner. IEEE Transactıons on Control Systems Technology, 15 (2007) 5.
  • Miller E.H., A note on reflector arrays (Periodical style Accepted for publication),” IEEE Trans. Antennas Propagat., to be published.
Toplam 5 adet kaynakça vardır.

Ayrıntılar

Bölüm Derleme
Yazarlar

Omid Ghahghaei

Saeed Malekzadeh Bu kişi benim

Hamed Naeimy Bu kişi benim

Yayımlanma Tarihi 13 Mayıs 2015
Yayımlandığı Sayı Yıl 2015 Cilt: 36 Sayı: 3

Kaynak Göster

APA Ghahghaei, O., Malekzadeh, S., & Naeimy, H. (2015). Design & modeling a novel Atomic Force Microscope (AFM) for detect roughness in turning machining. Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi, 36(3), 1-10.
AMA Ghahghaei O, Malekzadeh S, Naeimy H. Design & modeling a novel Atomic Force Microscope (AFM) for detect roughness in turning machining. Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi. Mayıs 2015;36(3):1-10.
Chicago Ghahghaei, Omid, Saeed Malekzadeh, ve Hamed Naeimy. “Design & Modeling a Novel Atomic Force Microscope (AFM) for Detect Roughness in Turning Machining”. Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi 36, sy. 3 (Mayıs 2015): 1-10.
EndNote Ghahghaei O, Malekzadeh S, Naeimy H (01 Mayıs 2015) Design & modeling a novel Atomic Force Microscope (AFM) for detect roughness in turning machining. Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi 36 3 1–10.
IEEE O. Ghahghaei, S. Malekzadeh, ve H. Naeimy, “Design & modeling a novel Atomic Force Microscope (AFM) for detect roughness in turning machining”, Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi, c. 36, sy. 3, ss. 1–10, 2015.
ISNAD Ghahghaei, Omid vd. “Design & Modeling a Novel Atomic Force Microscope (AFM) for Detect Roughness in Turning Machining”. Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi 36/3 (Mayıs 2015), 1-10.
JAMA Ghahghaei O, Malekzadeh S, Naeimy H. Design & modeling a novel Atomic Force Microscope (AFM) for detect roughness in turning machining. Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi. 2015;36:1–10.
MLA Ghahghaei, Omid vd. “Design & Modeling a Novel Atomic Force Microscope (AFM) for Detect Roughness in Turning Machining”. Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi, c. 36, sy. 3, 2015, ss. 1-10.
Vancouver Ghahghaei O, Malekzadeh S, Naeimy H. Design & modeling a novel Atomic Force Microscope (AFM) for detect roughness in turning machining. Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi. 2015;36(3):1-10.