In this work, the effect of annealing on Au-CuO films obtained by chemical bath deposition method was studied in
terms of their structural, electrical and optical properties. Annealing process was carried out at an oxygen
environment. The CuO peaks were detected using X-ray diffraction
and all of the films were polycrystalline. Crystal size, preferential
orientation, and surface tension were
estimated from XRD data. The surface morphology and thickness of the films was
determined using a field emission
scanning electron microscope. Energy dispersive X-ray analysis stated average
atomic percentages of Au in the films. The electrical resistivity values of the
films determined using four probe methods varied from 155.74 to 496.87 Ω.cm.
The optical properties of the films were determined using the optic spectrometer. The energy band gap values, extinction coefficient, refractive index
and dielectric coefficient of the films were also calculated.
Primary Language | English |
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Subjects | Engineering |
Journal Section | Physics |
Authors | |
Publication Date | December 1, 2019 |
Published in Issue | Year 2019 |