Research Article

Investigation of SnO2 and Ti-Doped SnO2 Thin Films for Morphological, Structural and Electrical Characterization

Volume: 5 Number: 1 January 20, 2023
EN TR

Investigation of SnO2 and Ti-Doped SnO2 Thin Films for Morphological, Structural and Electrical Characterization

Abstract

In this work, SnO2 and Ti-doped SnO2 thin films were produced by successive ionic absorption and reaction methods on platin interdigital contacts. The thin films produced were not annealed. Structural properties of amorphous thin films were investigated using X-ray Diffraction (XRD), morphological properties using Scanning Electron Microscopy (SEM), optical and electrical properties of Ultraviolet-visible Spectrophotometer (UV-VIS) and Keithley 2400 instruments. From the XRD results, it was determined that the thin films were an amorphous structure. Surface analysis by SEM shows that all films are coated and smooth. The current-voltage measurements show that thin films are ohmic. Lnρ results also show that the lowest resistance value for SnO2 thin films is after 320 °C temperature and after 360 °C temperature for Ti-doped SnO2 thin films.

Keywords

References

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Details

Primary Language

English

Subjects

Engineering

Journal Section

Research Article

Publication Date

January 20, 2023

Submission Date

September 22, 2022

Acceptance Date

November 22, 2022

Published in Issue

Year 2023 Volume: 5 Number: 1

APA
Bayram, A. B., & Çorlu, T. (2023). Investigation of SnO2 and Ti-Doped SnO2 Thin Films for Morphological, Structural and Electrical Characterization. International Journal of Engineering and Innovative Research, 5(1), 1-12. https://doi.org/10.47933/ijeir.1178891
AMA
1.Bayram AB, Çorlu T. Investigation of SnO2 and Ti-Doped SnO2 Thin Films for Morphological, Structural and Electrical Characterization. IJEIR. 2023;5(1):1-12. doi:10.47933/ijeir.1178891
Chicago
Bayram, Ahmet Buğrahan, and Tuğba Çorlu. 2023. “Investigation of SnO2 and Ti-Doped SnO2 Thin Films for Morphological, Structural and Electrical Characterization”. International Journal of Engineering and Innovative Research 5 (1): 1-12. https://doi.org/10.47933/ijeir.1178891.
EndNote
Bayram AB, Çorlu T (January 1, 2023) Investigation of SnO2 and Ti-Doped SnO2 Thin Films for Morphological, Structural and Electrical Characterization. International Journal of Engineering and Innovative Research 5 1 1–12.
IEEE
[1]A. B. Bayram and T. Çorlu, “Investigation of SnO2 and Ti-Doped SnO2 Thin Films for Morphological, Structural and Electrical Characterization”, IJEIR, vol. 5, no. 1, pp. 1–12, Jan. 2023, doi: 10.47933/ijeir.1178891.
ISNAD
Bayram, Ahmet Buğrahan - Çorlu, Tuğba. “Investigation of SnO2 and Ti-Doped SnO2 Thin Films for Morphological, Structural and Electrical Characterization”. International Journal of Engineering and Innovative Research 5/1 (January 1, 2023): 1-12. https://doi.org/10.47933/ijeir.1178891.
JAMA
1.Bayram AB, Çorlu T. Investigation of SnO2 and Ti-Doped SnO2 Thin Films for Morphological, Structural and Electrical Characterization. IJEIR. 2023;5:1–12.
MLA
Bayram, Ahmet Buğrahan, and Tuğba Çorlu. “Investigation of SnO2 and Ti-Doped SnO2 Thin Films for Morphological, Structural and Electrical Characterization”. International Journal of Engineering and Innovative Research, vol. 5, no. 1, Jan. 2023, pp. 1-12, doi:10.47933/ijeir.1178891.
Vancouver
1.Ahmet Buğrahan Bayram, Tuğba Çorlu. Investigation of SnO2 and Ti-Doped SnO2 Thin Films for Morphological, Structural and Electrical Characterization. IJEIR. 2023 Jan. 1;5(1):1-12. doi:10.47933/ijeir.1178891

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