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Investigation of SnO2 and Ti-Doped SnO2 Thin Films for Morphological, Structural and Electrical Characterization
Abstract
In this work, SnO2 and Ti-doped SnO2 thin films were produced by successive ionic absorption and reaction methods on platin interdigital contacts. The thin films produced were not annealed. Structural properties of amorphous thin films were investigated using X-ray Diffraction (XRD), morphological properties using Scanning Electron Microscopy (SEM), optical and electrical properties of Ultraviolet-visible Spectrophotometer (UV-VIS) and Keithley 2400 instruments. From the XRD results, it was determined that the thin films were an amorphous structure. Surface analysis by SEM shows that all films are coated and smooth. The current-voltage measurements show that thin films are ohmic. Lnρ results also show that the lowest resistance value for SnO2 thin films is after 320 °C temperature and after 360 °C temperature for Ti-doped SnO2 thin films.
Keywords
References
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Details
Primary Language
English
Subjects
Engineering
Journal Section
Research Article
Publication Date
January 20, 2023
Submission Date
September 22, 2022
Acceptance Date
November 22, 2022
Published in Issue
Year 2023 Volume: 5 Number: 1
APA
Bayram, A. B., & Çorlu, T. (2023). Investigation of SnO2 and Ti-Doped SnO2 Thin Films for Morphological, Structural and Electrical Characterization. International Journal of Engineering and Innovative Research, 5(1), 1-12. https://doi.org/10.47933/ijeir.1178891
AMA
1.Bayram AB, Çorlu T. Investigation of SnO2 and Ti-Doped SnO2 Thin Films for Morphological, Structural and Electrical Characterization. IJEIR. 2023;5(1):1-12. doi:10.47933/ijeir.1178891
Chicago
Bayram, Ahmet Buğrahan, and Tuğba Çorlu. 2023. “Investigation of SnO2 and Ti-Doped SnO2 Thin Films for Morphological, Structural and Electrical Characterization”. International Journal of Engineering and Innovative Research 5 (1): 1-12. https://doi.org/10.47933/ijeir.1178891.
EndNote
Bayram AB, Çorlu T (January 1, 2023) Investigation of SnO2 and Ti-Doped SnO2 Thin Films for Morphological, Structural and Electrical Characterization. International Journal of Engineering and Innovative Research 5 1 1–12.
IEEE
[1]A. B. Bayram and T. Çorlu, “Investigation of SnO2 and Ti-Doped SnO2 Thin Films for Morphological, Structural and Electrical Characterization”, IJEIR, vol. 5, no. 1, pp. 1–12, Jan. 2023, doi: 10.47933/ijeir.1178891.
ISNAD
Bayram, Ahmet Buğrahan - Çorlu, Tuğba. “Investigation of SnO2 and Ti-Doped SnO2 Thin Films for Morphological, Structural and Electrical Characterization”. International Journal of Engineering and Innovative Research 5/1 (January 1, 2023): 1-12. https://doi.org/10.47933/ijeir.1178891.
JAMA
1.Bayram AB, Çorlu T. Investigation of SnO2 and Ti-Doped SnO2 Thin Films for Morphological, Structural and Electrical Characterization. IJEIR. 2023;5:1–12.
MLA
Bayram, Ahmet Buğrahan, and Tuğba Çorlu. “Investigation of SnO2 and Ti-Doped SnO2 Thin Films for Morphological, Structural and Electrical Characterization”. International Journal of Engineering and Innovative Research, vol. 5, no. 1, Jan. 2023, pp. 1-12, doi:10.47933/ijeir.1178891.
Vancouver
1.Ahmet Buğrahan Bayram, Tuğba Çorlu. Investigation of SnO2 and Ti-Doped SnO2 Thin Films for Morphological, Structural and Electrical Characterization. IJEIR. 2023 Jan. 1;5(1):1-12. doi:10.47933/ijeir.1178891
