Araştırma Makalesi
BibTex RIS Kaynak Göster
Yıl 2018, Cilt: 1 Sayı: 1, 52 - 56, 06.08.2018

Öz

Kaynakça

  • 1] K. AL-Abdullah, Energy Procedia, 19, (2012).
  • [2] P.C. Lansåker, P. Petersson, G.A. Niklasson, C.G. Granqvist, Sol. Energy Mater.Sol. Cells, 117, (2013).
  • [3] A.L. Daltin, A. Addad, J.P. Chopart, Microelectron. Eng., 108, (2013).
  • [4] T. Audichon, E. Mayousse, T.W. Napporn, C. Morais, C. Comminges, K.B. Kokoh,Electrochim. Acta, 132, (2014).
  • [5] L. Boudaoud, N. Benramdane, A. Bouzidi, A. Nekerala, R. Desfeux, Optik e Int. J.Light Electron Opt., 127, (2016).
  • [6] B. Mauvernay, L. Presmanes, S. Capdeville, V.G. de Resende, E. De Grave,C. Bonningue, P. Tailhades, Thin Solid Films, 515, (2007).
  • [7] W. Peng, J. Li, B. Chen, N. Wang, G. Luo, F. Wei, Catal. Commun., 74, (2016).
  • [8] J. Yao, K. Hashimoto, A. Fujishima, Nature 355, (1992).
  • [9] C. Imawan, F. Solzbacher, H. Steffes, E. Obermeier, Sens. Actuators B, 64, (2000).
  • [10] J. K. Shin, S. M. Jeong, Y. Tak, S. H. Baeck, Research on Chemical Intermediates, 36, (2010).
  • [11] L. Seguin, M. Figlarz, R. Cavagnat, J.C. Lassegues, Spectrochimica Acta Part A, 51 (1995).

The Structural Properties of MoO3 Thin Films Grown by Magnetron Sputtering Technique

Yıl 2018, Cilt: 1 Sayı: 1, 52 - 56, 06.08.2018

Öz

The molybdenum trioxide MoO3 thin films were growth on
c-Si substrates by magnetron sputtering technique.
The structural and
morphological properties of
MoO3 thin films were investigated by XRD, RAMAN and SEM
analysis. Prior to annealing process, X-ray diffractogram indicated that
MoO3 thin films vere
amorphous nature. All of the
MoO3 thin films were applied three different annealing
temperature and obtained optimum annealing temperature with 300 0C.
XRD patterns of annealed thin films showed that these MoO3
thin films have polycrystalline nature with 2
θ
peak at 12
˚,23˚, 25˚, 38˚, 55˚and 58˚ corresponding to the (020), (110), (040), (060), (112) and (081) planesRAMAN spectrum of the MoO3 thin films were
determined 1
4 Raman active peaks belong to α-phase MoO3. The surface morphology of the MoO3 thin films as
deposited has appeared to be uniform with smaller grains and exhibits a coarse
structure. Annealing of the MoO3 thin films favors growth and
agglomeration of small grains.

Kaynakça

  • 1] K. AL-Abdullah, Energy Procedia, 19, (2012).
  • [2] P.C. Lansåker, P. Petersson, G.A. Niklasson, C.G. Granqvist, Sol. Energy Mater.Sol. Cells, 117, (2013).
  • [3] A.L. Daltin, A. Addad, J.P. Chopart, Microelectron. Eng., 108, (2013).
  • [4] T. Audichon, E. Mayousse, T.W. Napporn, C. Morais, C. Comminges, K.B. Kokoh,Electrochim. Acta, 132, (2014).
  • [5] L. Boudaoud, N. Benramdane, A. Bouzidi, A. Nekerala, R. Desfeux, Optik e Int. J.Light Electron Opt., 127, (2016).
  • [6] B. Mauvernay, L. Presmanes, S. Capdeville, V.G. de Resende, E. De Grave,C. Bonningue, P. Tailhades, Thin Solid Films, 515, (2007).
  • [7] W. Peng, J. Li, B. Chen, N. Wang, G. Luo, F. Wei, Catal. Commun., 74, (2016).
  • [8] J. Yao, K. Hashimoto, A. Fujishima, Nature 355, (1992).
  • [9] C. Imawan, F. Solzbacher, H. Steffes, E. Obermeier, Sens. Actuators B, 64, (2000).
  • [10] J. K. Shin, S. M. Jeong, Y. Tak, S. H. Baeck, Research on Chemical Intermediates, 36, (2010).
  • [11] L. Seguin, M. Figlarz, R. Cavagnat, J.C. Lassegues, Spectrochimica Acta Part A, 51 (1995).
Toplam 11 adet kaynakça vardır.

Ayrıntılar

Birincil Dil İngilizce
Konular Metroloji,Uygulamalı ve Endüstriyel Fizik
Bölüm Makaleler
Yazarlar

Beyhan Tatar

Canan Yöney Bu kişi benim

Dilek Demiroğlu Bu kişi benim

Yayımlanma Tarihi 6 Ağustos 2018
Gönderilme Tarihi 25 Temmuz 2018
Kabul Tarihi 1 Ağustos 2018
Yayımlandığı Sayı Yıl 2018 Cilt: 1 Sayı: 1

Kaynak Göster

APA Tatar, B., Yöney, C., & Demiroğlu, D. (2018). The Structural Properties of MoO3 Thin Films Grown by Magnetron Sputtering Technique. Journal of Physical Chemistry and Functional Materials, 1(1), 52-56.
AMA Tatar B, Yöney C, Demiroğlu D. The Structural Properties of MoO3 Thin Films Grown by Magnetron Sputtering Technique. Journal of Physical Chemistry and Functional Materials. Ağustos 2018;1(1):52-56.
Chicago Tatar, Beyhan, Canan Yöney, ve Dilek Demiroğlu. “The Structural Properties of MoO3 Thin Films Grown by Magnetron Sputtering Technique”. Journal of Physical Chemistry and Functional Materials 1, sy. 1 (Ağustos 2018): 52-56.
EndNote Tatar B, Yöney C, Demiroğlu D (01 Ağustos 2018) The Structural Properties of MoO3 Thin Films Grown by Magnetron Sputtering Technique. Journal of Physical Chemistry and Functional Materials 1 1 52–56.
IEEE B. Tatar, C. Yöney, ve D. Demiroğlu, “The Structural Properties of MoO3 Thin Films Grown by Magnetron Sputtering Technique”, Journal of Physical Chemistry and Functional Materials, c. 1, sy. 1, ss. 52–56, 2018.
ISNAD Tatar, Beyhan vd. “The Structural Properties of MoO3 Thin Films Grown by Magnetron Sputtering Technique”. Journal of Physical Chemistry and Functional Materials 1/1 (Ağustos 2018), 52-56.
JAMA Tatar B, Yöney C, Demiroğlu D. The Structural Properties of MoO3 Thin Films Grown by Magnetron Sputtering Technique. Journal of Physical Chemistry and Functional Materials. 2018;1:52–56.
MLA Tatar, Beyhan vd. “The Structural Properties of MoO3 Thin Films Grown by Magnetron Sputtering Technique”. Journal of Physical Chemistry and Functional Materials, c. 1, sy. 1, 2018, ss. 52-56.
Vancouver Tatar B, Yöney C, Demiroğlu D. The Structural Properties of MoO3 Thin Films Grown by Magnetron Sputtering Technique. Journal of Physical Chemistry and Functional Materials. 2018;1(1):52-6.