Synthesis and Characterization of Pr2O3 Buffer Layers by Sol-Gel Process for YBCO Surface Coated Conductors
Abstract
Pr2O3 films were deposited using a sol-gel process from solutions derived from praseodymium (III) isoproxide. Homogenous, crack-free, and dense films were deposited on Ni tapes between temperatures of 600oC and 850oC for YBCO surface coated conductors. These films were characterized by XRD, SEM and AFM. According to XRD pattern, Pr2O3 film is successfully grown on Ni substrate. It was found that microstructures of the films are dense, continuous, crack-free and pinhole-free. As a result, it is accepted that Pr2O3 film is suitable for YBCO surface coated conductors
Keywords
References
- Akin, Y., Aslanoglu, Z., Celik, E., Arda, L., Sigmund, W., Hascicek, Y. S., 2003. IEEE Transactions on Applied Superconductivity, 13, 2673.
- Celik, E., Avci, E., Mutlu, H. I., Hascicek, Y. S., 2000. Advances in Cryogenic Engineering Materials, 46, 895.
- Chung, J., Ko, R., Shi, D., Ha, H., Kim, H., Song, K., Park, C., Moon, S., Yoo, S., 2005. Use of SrTiO3 as a Single Buffer Layer for RABiTS YBCO Coated Conductor. IEEE Transactions on Applied Superconductivity, 15-2, 3020-3023.
- Rakesh, S., Torche, M., Henkel, K., Hoffmann, P., Tallarida, M., Schmeisser, D., 2006. Al-oxynitrides as a buffer layer for Pr2O3/SiC interfaces. Materials Science in Semiconductor Processing 9, 945–948.
- Reeves, J.L., Selvamanickam, V., Snyder, R.L., 2003. Reel- To-Reel Texture Analysis of Hts Coated Conductors Using a Modified Gadds System, Advances in X-ray Analysis, 46, 163-166.
- Sohma, M., Kamıya, K., Tsukada, K., Yamaguchı, I., Kondo, W., Mızuta, S., 2006. Trans. Electron., E89– C2, 182-185.
- Van Driessche, I., Schoofs, B., Penneman, G., Bruneel, E., Hoste, S., 2005. Measurement Scıence Review, 5- 3, 19-29.
YBCO Yüzey Kaplanmış İletkenler İçin Sol-jel Prosesiyle Pr2O3 Buffer Katmanların Sentezlenmesi ve Karakterizasyonu
Abstract
Pr2O3 filmler sol-jel prosesiyle praseodimiyum (III) isoproksit kullanılarak hazırlanan çözeltilerile kaplanmışır. YBCO yüzey kaplanmış iletkenler için Ni şerit altlıklar üzerine homojen, çatlaksız ve yoğun filmler 600oC ve 850oC sıcaklıklar arasında kaplanmıştır. Bu filmler XRD, SEM ve AFM ile karakterize edilmiştir. XRD desenine göre, Pr2O3 film Ni altlık üzerine başarılı bir şekilde büyütülmüştür. Filmlerin tüm mikro yapılarının yoğun, sürekli, çatlaksız olduğu ve iğne deliği içermediği belirlenmiştir. Sonuç olarak, YBCO yüzey kaplanmış iletkenler için Pr2O3 filmin uygun olarak kabul edilebilir.
Keywords
References
- Akin, Y., Aslanoglu, Z., Celik, E., Arda, L., Sigmund, W., Hascicek, Y. S., 2003. IEEE Transactions on Applied Superconductivity, 13, 2673.
- Celik, E., Avci, E., Mutlu, H. I., Hascicek, Y. S., 2000. Advances in Cryogenic Engineering Materials, 46, 895.
- Chung, J., Ko, R., Shi, D., Ha, H., Kim, H., Song, K., Park, C., Moon, S., Yoo, S., 2005. Use of SrTiO3 as a Single Buffer Layer for RABiTS YBCO Coated Conductor. IEEE Transactions on Applied Superconductivity, 15-2, 3020-3023.
- Rakesh, S., Torche, M., Henkel, K., Hoffmann, P., Tallarida, M., Schmeisser, D., 2006. Al-oxynitrides as a buffer layer for Pr2O3/SiC interfaces. Materials Science in Semiconductor Processing 9, 945–948.
- Reeves, J.L., Selvamanickam, V., Snyder, R.L., 2003. Reel- To-Reel Texture Analysis of Hts Coated Conductors Using a Modified Gadds System, Advances in X-ray Analysis, 46, 163-166.
- Sohma, M., Kamıya, K., Tsukada, K., Yamaguchı, I., Kondo, W., Mızuta, S., 2006. Trans. Electron., E89– C2, 182-185.
- Van Driessche, I., Schoofs, B., Penneman, G., Bruneel, E., Hoste, S., 2005. Measurement Scıence Review, 5- 3, 19-29.
Details
| Primary Language | Turkish |
|---|---|
| Journal Section | Articles |
| Authors | |
| Publication Date | December 1, 2014 |
| Submission Date | August 8, 2015 |
| Published in Issue | Year 2014 Volume: 14 Issue: 3 |