Sb2S3 İnce Filmlerinin Yapısal ve Optik Özellikleri

Year 2019, Volume: 19 Issue: 2, 286 - 291, 17.09.2019

Şilan Baturay , Derya Batıbay Yusuf Selim Ocak

Abstract

Bu çalışmaya konu olan
antimon sülfür ince filmler ultrasonik sprey piroliz tekniği kullanılarak
hazırlanmıştır. Farklı alttaş sıcaklığına bağlı olarak hazırlanan antimon
sülfür ince filmlerin optik ve yapısal özellikleri sırasıyla UV-vis
spektrofotometri ve XRD analizi kullanılarak incelenmiştir. Bu şekilde alttaş
sıcaklığını değiştirerek optik ve yapısal özelikleri kontrol etmek mümkün
olmuştur. Filmlerin optik özellikleri, UV-vis spektrometresi kullanılarak
enerji bant aralığı ölçümleri ile analiz edildi. 275, 300 ve 325 °C’ de yapılan
ve tavlanmamış filmler için enerji bant değerleri sırasıyla 2.36, 2.47 ve 1.84
eV olarak bulunurken, 500 °C’de sülfür ortamında tavlanan filmler için enerji
bant değerleri sırasıyla 1.73, 1.76 ve 1.77eV olarak bulundu. Bütün yönelimler
için mikro yapı (e), düzlemler arası mesafe (d), kristal büyüklüğü (D) ve
dislokasyon yoğunluk (δ) XRD analizi kullanılarak belirlendi.

Keywords

İnce Fim;Sb2S3; XRD; Ultrasonik Sprey Piroliz

The Structural and Optical Properties of Sb2S3 Thin Films

Abstract

The Antimony thiorea thin
films which are the subject of this study were prepared by ultrasonic spray
pyrolysis technique. The Antimony thiorea thin films were investigated
depending on the substrate temperature. The optical and structural
characteristics of these films were determined using UV–vis spectrophotometry
and XRD analysis, respectively. By changing the substrate temperature, it was
possible to control the optical and structural characteristic of the films. The
optical properties films were analysed by energy band gap measurements using
UV–vis spectrophotometry. While the band gaps of as grown films found to be
2.36, 2.47 ve 1.84eV, the band gaps of the films at annealing 500°C found to be
1.73, 1.76 ve 1.77eV.  XRD analysis was
used to determine the microstrain (e), lattice spacing phase (d), crystallite
size (D) and dislocation density (δ) for all orientations.

Keywords

Thin Films, Sb2S3, XRD, ultrasonic spray pyrolysis

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