Constraint Programming Based Optimization of Equipment Selection for Testing Process of Products with a Single Attribute Subject to Test

Abstract

Testing process is an important cost component, especially for complex products, where companies must carefully plan their resources. Both technical and managerial aspects of the test process, the relationship between test characteristics, and the yield are investigated in detail, but the test and repair equipment selection has not yet been considered as an optimization problem. This paper briefly describes such a process based on an imperfect test – repair loop – and describes a constraint programming approach as a solution method. The model stands for an economic choice of test selection equipment with a realistic cost estimation approach which can also be generalized for repair equipments.

Keywords

• Test design
• equipment selection
• optimization
• mixed integer programming
• constraint programming

Tek Özelliği Test Edilen Ürünlerin Test Sürecinde Ekipman Seçimi İçin Kısıt Programlama Temelli Optimizasyon

Abstract

Test süreci, özellikle karmaşık ürünler için, işletme kaynaklarının doğru planlanmasını gerektiren önemli bir maliyet bileşenidir. Literatürde hem teknik hem de yönetim içerikli çalışmalarda test süreci ayrıntılı olarak işlenmekte, test karakteristikleri ile çıktı ürün kalitesi arasındaki ilişki ortaya konmakta, fakat optimal test ve tamir ekipmanı seçimi, bir optimizasyon problemi olarak ele alınmamaktadır. Bu çalışmada mükemmel olmayan bir test ve tamir döngüsünün dinamikleri ve ilintili ekipman seçim optimizasyonu problemini çözecek bir kısıt programlama modelinin yapısı açıklanmaktadır. Tamir makineleri için de genellenebilecek bu model, gerçekçi bir maliyet hesabı yaklaşımıyla ideal test ekipmanı seçimi yapılmasına yardım etmektedir.

Keywords

• Test tasarımı
• ekipman seçimi
• optimizasyon
• karışık tamsayı programlama
• kısıt programlama

References

1. Dick, John H., Erwin Trischler, Chryssa Dislis ve Anthony Peter Ambler (1994), Sensitivity Analysis in Economic Based Test Strategy Planning. Journal of Electronic Testing: Theory and Applications (JETTA), 5, 239 – 252.
2. Dislis, Chryssa, Ian D. Dear, S. C. Lau, J. R. Miles ve Anthony Peter Ambler (1988), Hierarchical Test Strategy Planning Based on Cost Evaluation. IEE Colloquium on Computer Aided Test and Diagnosis, 7/1 – 7/8.
3. Dislis, Chryssa, Ian D. Dear, J. R. Miles, S. C. Lau ve Anthony Peter Ambler (1989). Cost Analysis of Test Method Environments. Proceedings of International Test Conference, 875 – 883.
4. Fisher, Eric, Steve Fortune, Marty Gladstein, Suresh Goyal, William B. Lyons, James Mosher ve Gordon Wilfong (2007a), Economic Modeling of Global Test Strategy I: Mathematical Models. Bell Labs Technical Journal, 12, 1, 161 – 173.
5. Fisher, Eric, Steve Fortune, Marty Gladstein, Suresh Goyal, William B. Lyons, James Mosher ve Gordon Wilfong (2007a b), Economic Modeling of Global Test Strategy II: Software System and Examples. Bell Labs Technical Journal, 12, 1, 175 – 186.
6. Flehinger, Betty J. (1965), Product Test Planning for Repairable Systems. Technometrics, 7, 4, 485 – 494.
7. Gluss, Brian (1959), An Optimum Policy for Detecting a Fault in a Complex System. Operations Research, 7, 4, 468 – 477.
8. Goyal, Suresh ve James H. Mosher (2006), An Improved Test Process Model for Cost Reduction. Bell Labs Technical Journal, 11, 1, 173 – 190.

9. Nachlas, Joel A., Susan R. Loney ve Blair A. Binney (1990), Diagnostic – Strategy Selection for Series Systems. IEEE Transactions on Reliability, 39, 3, 273 – 280.
10. Rossi, Roberto, Sahap Armagan Tarım, Brahim Hnich ve Steve Prestwich (2006), MultiComponent Testing in Telecommunications. Proceedings of the European Conference on Operational Research EURO XXI.
11. Volkerink, Eric H., Ajay Khoche, Linda A. Kamas, Jochen Rivoir ve Hans G. Kerkhoff (2001), Tackling Test Trade – Offs from Design, Manufacturing to Market Using Economic Modeling. Proceedings of the IEEE International Test Conference, 1098 – 1107.
12. Wilson, Simon, Ben Flood, Suresh Goyal, Jim Mosher, Susan Bergin, Joseph O’Brien ve Robert Kennedy (2007), Parameter Estimation for a Model With Both Imperfect Test and Repair. Proceedings of 25th IEEE VLSI Symposium (VTS’07).
13. Wilson, Simon ve Suresh Goyal (2012), Estimating Production Test Properties from Test Measurement Data. Applied Stochastic Models in Business and Industry, 28, 542 – 557.