Research Article
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The Optoelectronic Characterization of Ag doped ZnO Thin Films

Year 2026, Volume: 15 Issue: 1 , 114 - 122 , 24.03.2026
https://doi.org/10.17798/bitlisfen.1768075
https://izlik.org/JA82GD77XT

Abstract

This study investigates the properties of silver (Ag)-doped zinc oxide (ZnO) thin films, which possess significant potential for various optoelectronic applications. The films were fabricated utilizing a cost-effective nebulizer spray technique. Structural analysis confirmed that both the undoped and Ag-doped samples crystallized in the hexagonal wurtzite phase, characteristic of ZnO. Scanning electron microscopy (SEM) revealed that the incorporation of Ag significantly altered the surface morphology, resulting in an increased grain size and the formation of more irregular surface features. Optical measurements demonstrated that while Ag doping slightly reduced the films' transmittance, it concurrently narrowed the optical band gap, thereby enhancing light absorption within the visible region. Moreover, the photoluminescence characteristics were observed to be strongly dependent on the presence of the silver dopant. Finally, current-voltage (I-V) characterization affirmed that the Ag-doped ZnO films exhibited superior photoconductivity compared to their undoped counterparts. An evaluation of the photodetector performance parameters indicated a substantial improvement in photosensitivity, which increased from a value of 14.7 in undoped ZnO to 64.2 following the incorporation of Ag.

Ethical Statement

The study is complied with research and publication ethics.

Project Number

BTÜBAP-2024-EKOM-06

Thanks

Batman University Commission of Scientific Research Project under Grant No. BTÜBAP-2024-EKOM-06 provided support for this study.

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There are 29 citations in total.

Details

Primary Language English
Subjects Condensed Matter Characterisation Technique Development, Electronic and Magnetic Properties of Condensed Matter; Superconductivity, Structural Properties of Condensed Matter
Journal Section Research Article
Authors

Şerif Rüzgar 0000-0002-4964-2202

Project Number BTÜBAP-2024-EKOM-06
Submission Date August 18, 2025
Acceptance Date February 3, 2026
Publication Date March 24, 2026
DOI https://doi.org/10.17798/bitlisfen.1768075
IZ https://izlik.org/JA82GD77XT
Published in Issue Year 2026 Volume: 15 Issue: 1

Cite

IEEE [1]Ş. Rüzgar, “The Optoelectronic Characterization of Ag doped ZnO Thin Films”, Bitlis Eren Üniversitesi Fen Bilimleri Dergisi, vol. 15, no. 1, pp. 114–122, Mar. 2026, doi: 10.17798/bitlisfen.1768075.

Bitlis Eren University
Journal of Science Editor
Bitlis Eren University Graduate Institute
Bes Minare Mah. Ahmet Eren Bulvari, Merkez Kampus, 13000 BITLIS