Mikrodalga Uygulamaları İçin Al2O3/Cam/ZrO2 Seramiklerinin Yoğunlaştırılması ve Karakterizasyonu

Abstract

Bu çalışmada Al2O3/cam/ZrO2 kompozitlerin yoğunlaşma davranışı, faz oluşumu, sertliği ve dielektrik özellikleri karakterize edilmiştir. Alümina, CaO-Al2O3-SiO2 bazlı ticari cam ve nano zirkonyum oksit başlangıç malzemesi olarak kullanılmıştır. ZrO2, C55 tozuna (ağırlıkça %45 Al2O3+ ağırlıkça %55 cam) farklı miktarlarda (örneğin, ağırlıkça %47 ZrO2, ağırlıkça %57 ZrO2 ve ağırlıkça %68 ZrO2 içeren C55) ilave edilmiştir. Al2O3/Cam ve Al2O3/Cam/ZrO2 numuneleri tek eksenli kuru presleme yöntemiyle üretilmiştir. Optimum yoğunlaştırma sıcaklığı C55 için 800 ˚C, C55-47Z için 1100 ˚C, C55-57Z için 1150 ˚C ve C55-68Z için 1150 ˚C olduğu tespit edilmiştir. ZrO2 diğer fazlarla kimyasal olarak reaksiyona girmemiştir ve sıcaklıkla bozunmamıştır. ZrO2 miktarının artmasıyla sertlik kademeli olarak artmıştır. C55-47Z için 824 HV, C55-57Z için 881 HV ve C55-68Z için 907 HV olduğu saptanmıştır. C55-47Z ve C55-68Z'nin 5 MHz'deki dielektrik sabiti sırasıyla 11.7 ve 16.3 olduğu bulunmuştur. Mikrodalga uygulamaları için, yüksek dielektrik sabiti (5MHz'de 16.3, 1GHz'de 14.79 ve 10GHz'de 14.43) ve düşük dielektrik kaybı (5MHz'de 0.0032, 1GHz’de 0.0045 ve 10 GHz’de 0.0051) nedeniyle C55-68Z numunesi önerilmiştir.

Keywords

• mikro dalga uygulamaları
• Cam/seramik
• ZrO2
• dielektrik özellikler
• sinterleme

Densification and Characterization of Al2O3/Glass/ZrO2 Ceramics for Microwave Applications

Abstract

A commercial SiO2-Al2O3-CaO based commercial glass, Al2O3, and ZrO2 were used as initial materials. ZrO2 was added to the C55 powder (45 wt% Al2O3+ 55 wt% glass) at different amounts (e.g., C55 with 47 wt% ZrO2, 57 wt% ZrO2 and 68 wt% ZrO2). Al2O3/Glass and Al2O3/Glass/ZrO2 samples were fabricated by uniaxial dry pressing method. These compositions were determined for specific microwave applications due to their various dielectric constants. Densification behavior, phase formation, hardness, dielectric properties of the samples were characterized in this study. The optimum densification temperature was 800 ˚C for the C55, 1100 ˚C for the C55-47Z, 1150 ˚C for the C55-57Z and 1150 ˚C for the C55-68Z. X-ray diffraction proved that ZrO2 neither chemically reacted with other phases nor decomposed with temperature. Hardness slightly increased with increasing amount of ZrO2; 824 HV for the C55-47Z, 881 HV for the C55-57Z and 907 HV for C55-68Z. Dielectric constant for the C55-47Z and C55-68Z at 5 MHz were 11.7 and 16.3, respectively. For microwave applications, the C55-68Z sample as proposed due to high dielectric constant (16.3 at 5MHz, 14.79 at 1GHz, 14.43 GHz at 10GHz) and low dielectric loss (0.0032 at 5 MHz, 0.0045 at 1GHz and 0.0051 at 10 GHz).

Keywords

• Glass/ceramic
• ZrO2
• dielectric properties
• sintering
• microwave application

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