Çözücü ve Isıl İşlem Sürecinin MoS2 İnce Filmlerinin Yapısal Özelliklerine Etkisinin İncelenmesi

Abstract

Son yıllarda, geçiş metali kalkojenleri (GMK) kendilerine özgü fiziksel ve kimyasal özelliklerinden dolayı çokça çalışılan malzeme gruplarından biri olmuştur. GMK’ler, optoelektronik uygulamalarda, hidrojen evrim reaksiyonları, enerji depolama sistemleri, güneş pili uygulamalarında ve radar emici sistemlerde sıkça kullanılmaktadır. Bu çalışmada, farklı çözücüler ve ısıl işlem süreçleri kullanılarak üretilen GMK grubundan olan MoS2 ince filmlerinin yapısal özellikleri araştırılmıştır. İnce filmler sol-gel spin kaplama yöntemi ile üretilmiştir. Filmlerin kristalizasyonu farklı sıcaklık değerlerinde vakum altında tutulan ve azot gazı (N2) akışı sağlanan fırın sisteminde sağlanmıştır. Isıl işlem sıcaklığı ve çözücü kimyasalın etkisi yapısal analiz metotları ile değerlendirilmiştir. Bu kapsamda, X-ışını kırınım metodu (XRD) ve Raman saçınım ve taramalı elektron mikroskop (SEM) metodu filmlerin yapısal analizlerinin yapılmasında kullanılmıştır.

Keywords

• MoS2
• İnce film
• sol-jel
• termal ayrışma

Investigation of the Effect of Solvent and Heat Treatment Process on Structural Properties of MoS2 Thin Films

Abstract

In recent years, transition metal dichalcogenides (TMDCs) have become one of the most studied material groups due to their unique physical and chemical properties. The TMDCs are frequently used in optoelectronic applications, hydrogen evolution reactions, energy storage systems, solar cells, and radar absorbing systems. In this study, the structural properties of MoS2 thin films, belonging to one of the TMDCs group, produced by using different solvents and heat treatment processes were investigated. Thin films were produced by using the sol-gel spin coating technique. The crystallization of the films was ensured at different heat treatment temperature values under a vacuum atmosphere by introducing N2 gas flow. The effects of the heat treatment temperature and chemical solvent were evaluated by the structural characterizations techniques. Within this scope, the X-ray diffraction method (XRD), Raman scattering, and scanning electron microscope (SEM) were used to investigate the structural properties of films.

Keywords

• : MoS2
• Thin Film
• Sol-gel
• Thermal decomposition

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