A Simple Test for Non-ideal Memristors
Abstract
Semiconductor components must be tested before
their usage. The test for a diode is well-known. Memristor is a nonlinear
circuit element, whose existence has been predicted in 1971 and a memristive
system behaving as memristor has been found in 2008. It is actually a nonlinear
resistor with charge-dependency. In recent years, memristor has become an
important research area. In addition to ideal memristors, memristive systems
are nowadays also called memristors. However, memristor is not entirely known
as a circuit element and there is still research undergoing to model it.
Memristor has different models used in literature, such as linear dopant drift
models, nonlinear dopant drift models, and threshold-based models. If memristor
would become commercially available and start being commonly used in circuits,
it will also need testing methods to be used by circuit designers. In this
paper, by reviewing some of the memristor models given in literature, a simple
test is suggested to be applied for individual memristors.
Keywords
References
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Details
Primary Language
English
Subjects
Engineering
Journal Section
Research Article
Publication Date
July 18, 2019
Submission Date
March 24, 2019
Acceptance Date
June 24, 2019
Published in Issue
Year 2019 Volume: 2 Number: 1