Research Article

A Simple Test for Non-ideal Memristors

Volume: 2 Number: 1 July 18, 2019
EN TR

A Simple Test for Non-ideal Memristors

Abstract

Semiconductor components must be tested before their usage. The test for a diode is well-known. Memristor is a nonlinear circuit element, whose existence has been predicted in 1971 and a memristive system behaving as memristor has been found in 2008. It is actually a nonlinear resistor with charge-dependency. In recent years, memristor has become an important research area. In addition to ideal memristors, memristive systems are nowadays also called memristors. However, memristor is not entirely known as a circuit element and there is still research undergoing to model it. Memristor has different models used in literature, such as linear dopant drift models, nonlinear dopant drift models, and threshold-based models. If memristor would become commercially available and start being commonly used in circuits, it will also need testing methods to be used by circuit designers. In this paper, by reviewing some of the memristor models given in literature, a simple test is suggested to be applied for individual memristors.   

Keywords

References

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Details

Primary Language

English

Subjects

Engineering

Journal Section

Research Article

Publication Date

July 18, 2019

Submission Date

March 24, 2019

Acceptance Date

June 24, 2019

Published in Issue

Year 2019 Volume: 2 Number: 1

APA
Mutlu, R., & Karakulak, E. (2019). A Simple Test for Non-ideal Memristors. European Journal of Engineering and Applied Sciences, 2(1), 1-5. https://izlik.org/JA68AZ24PA
AMA
1.Mutlu R, Karakulak E. A Simple Test for Non-ideal Memristors. EJEAS. 2019;2(1):1-5. https://izlik.org/JA68AZ24PA
Chicago
Mutlu, Reşat, and Ertuğrul Karakulak. 2019. “A Simple Test for Non-Ideal Memristors”. European Journal of Engineering and Applied Sciences 2 (1): 1-5. https://izlik.org/JA68AZ24PA.
EndNote
Mutlu R, Karakulak E (July 1, 2019) A Simple Test for Non-ideal Memristors. European Journal of Engineering and Applied Sciences 2 1 1–5.
IEEE
[1]R. Mutlu and E. Karakulak, “A Simple Test for Non-ideal Memristors”, EJEAS, vol. 2, no. 1, pp. 1–5, July 2019, [Online]. Available: https://izlik.org/JA68AZ24PA
ISNAD
Mutlu, Reşat - Karakulak, Ertuğrul. “A Simple Test for Non-Ideal Memristors”. European Journal of Engineering and Applied Sciences 2/1 (July 1, 2019): 1-5. https://izlik.org/JA68AZ24PA.
JAMA
1.Mutlu R, Karakulak E. A Simple Test for Non-ideal Memristors. EJEAS. 2019;2:1–5.
MLA
Mutlu, Reşat, and Ertuğrul Karakulak. “A Simple Test for Non-Ideal Memristors”. European Journal of Engineering and Applied Sciences, vol. 2, no. 1, July 2019, pp. 1-5, https://izlik.org/JA68AZ24PA.
Vancouver
1.Reşat Mutlu, Ertuğrul Karakulak. A Simple Test for Non-ideal Memristors. EJEAS [Internet]. 2019 Jul. 1;2(1):1-5. Available from: https://izlik.org/JA68AZ24PA