Araştırma Makalesi

A Simple Test for Non-ideal Memristors

Cilt: 2 Sayı: 1 18 Temmuz 2019
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A Simple Test for Non-ideal Memristors

Öz

Semiconductor components must be tested before their usage. The test for a diode is well-known. Memristor is a nonlinear circuit element, whose existence has been predicted in 1971 and a memristive system behaving as memristor has been found in 2008. It is actually a nonlinear resistor with charge-dependency. In recent years, memristor has become an important research area. In addition to ideal memristors, memristive systems are nowadays also called memristors. However, memristor is not entirely known as a circuit element and there is still research undergoing to model it. Memristor has different models used in literature, such as linear dopant drift models, nonlinear dopant drift models, and threshold-based models. If memristor would become commercially available and start being commonly used in circuits, it will also need testing methods to be used by circuit designers. In this paper, by reviewing some of the memristor models given in literature, a simple test is suggested to be applied for individual memristors.   

Anahtar Kelimeler

Kaynakça

  1. [1] D. B. Strukov, G. S. Snider, D. R. Stewart, and R. S. Williams, ”The missing memristor found,” Nature (London), Vol. 453, pp. 80-83, 2008.
  2. [2] Vongehr, Sascha, and Xiangkang Meng. "The missing memristor has not been found." Scientific reports 5 (2015).
  3. [3] L. O. Chua,” Memristor - The Missing Circuit Element,” IEEE Trans.Circuit Theory, Vol. 18, pp. 507-519, 1971.
  4. [4] L. O. Chua and S. M. Kang,” Memrisive devices and systems,” Proc.IEEE, Vol. 64, pp. 209-223, 1976.
  5. [5] Prodromakis, T., and C. Toumazou. "A review on memristive devices and applications." 2010 17th IEEE International Conference on Electronics, Circuits and Systems.
  6. [6] Pershin, Yu V., J. Martinez-Rincon, and M. Di Ventra. "Memory circuit elements: from systems to applications." Journal of Computational and Theoretical Nanoscience 8.3 (2011): 441-448.
  7. [7] Y. V. Pershin and M. Di Ventra, “Memory effects in complex materials and nanoscale systems,” Adv. Phys., vol. 60, pp. 145–227, Apr. 01, 2011, 2011.
  8. [8] L. Chua, “Resistance switching memories are memristors,” Appl. Phys. A, vol. 102, pp. 765–783, Mar. 01, 2011, 2011.

Ayrıntılar

Birincil Dil

İngilizce

Konular

Mühendislik

Bölüm

Araştırma Makalesi

Yayımlanma Tarihi

18 Temmuz 2019

Gönderilme Tarihi

24 Mart 2019

Kabul Tarihi

24 Haziran 2019

Yayımlandığı Sayı

Yıl 2019 Cilt: 2 Sayı: 1

Kaynak Göster

APA
Mutlu, R., & Karakulak, E. (2019). A Simple Test for Non-ideal Memristors. European Journal of Engineering and Applied Sciences, 2(1), 1-5. https://izlik.org/JA68AZ24PA
AMA
1.Mutlu R, Karakulak E. A Simple Test for Non-ideal Memristors. EJEAS. 2019;2(1):1-5. https://izlik.org/JA68AZ24PA
Chicago
Mutlu, Reşat, ve Ertuğrul Karakulak. 2019. “A Simple Test for Non-ideal Memristors”. European Journal of Engineering and Applied Sciences 2 (1): 1-5. https://izlik.org/JA68AZ24PA.
EndNote
Mutlu R, Karakulak E (01 Temmuz 2019) A Simple Test for Non-ideal Memristors. European Journal of Engineering and Applied Sciences 2 1 1–5.
IEEE
[1]R. Mutlu ve E. Karakulak, “A Simple Test for Non-ideal Memristors”, EJEAS, c. 2, sy 1, ss. 1–5, Tem. 2019, [çevrimiçi]. Erişim adresi: https://izlik.org/JA68AZ24PA
ISNAD
Mutlu, Reşat - Karakulak, Ertuğrul. “A Simple Test for Non-ideal Memristors”. European Journal of Engineering and Applied Sciences 2/1 (01 Temmuz 2019): 1-5. https://izlik.org/JA68AZ24PA.
JAMA
1.Mutlu R, Karakulak E. A Simple Test for Non-ideal Memristors. EJEAS. 2019;2:1–5.
MLA
Mutlu, Reşat, ve Ertuğrul Karakulak. “A Simple Test for Non-ideal Memristors”. European Journal of Engineering and Applied Sciences, c. 2, sy 1, Temmuz 2019, ss. 1-5, https://izlik.org/JA68AZ24PA.
Vancouver
1.Reşat Mutlu, Ertuğrul Karakulak. A Simple Test for Non-ideal Memristors. EJEAS [Internet]. 01 Temmuz 2019;2(1):1-5. Erişim adresi: https://izlik.org/JA68AZ24PA