Year 2021, Volume , Issue 23, Pages 435 - 439 2021-04-30

In-Situ Strain Measurement on Al7075 Plate by Using High Energy Synchrotron Light Source
Yüksek Enerjili Senkrotron Işık Kaynağı Kullanarak Al7075 Plakalarda Yerinde Gerilme Ölçümü

İlyas ŞAVKLIYILDIZ [1]


In this study, compressive and tensile strain in Al7075 plate have been measured by synchrotron energy-dispersive X-ray diffraction (EDXRD) in conjunction with 4-point bending test under various load up to 1000 lbs(453.6 kg). The compressive and tensile strain are determined by stress related interplanar spacing variation at 111 peak reflection which is considered atomic level strain measurement. The specimen initially shows elastic strain behavior under 400 lbs (181.4 kg) load. However, further load increment applied on sample causes plastic deformation on the regions close edge of the specimen where the biggest stress values in terms of both compression and tension is aroused. Finally, 1000 lbs load is applied on the specimen and major part of the specimen is deformed plastically. Vicinity of body center of sample shows almost no strain formation which is attributed nature of 4-point bending flexural test. Using high energy EDXRD method allow us to reveal precise atomic level strain distribution in Al7075 alloy under different loads.
Bu çalışmada, enerji dağılımlı x-ışını kırınımı ile Al7075 plakalarda basma ve çekme gerinimi 4 nokta eğilme testiyle 1000 lbs (453.6 kg)’e kadar değişen yüklerle beraber yapılmıştır. Atomic seviye gerinim ölçümü olarak 111 yönünde düzlemlerarası mesafe ile alakalı stres ölçümü ile basma ve çekme gerinimleri belirlenmiştir. Ilk olarak numune 400 lbs (181.4 kg) yük altında elastik gerinim göstermiştir. Fakat daha fazla yük artışı basma ve çekme gerinimlerinin ortaya çıktığı yerlerde plastik deformasyona neden olmuştur. Son olarak, 1000 lbs (453.6 kg) yük altında numunenin büyük kısmı plastik olarak deforme olmuştur. Numunenin hacim merkezi civarında 4 nokta eğilme testinin doğası olarak hiçbir strain oluşumu göstermemiştir. EDXRD metodunu kullanmak bize farklı yükler altında Al7075 alaşımında atomik seviye hassasiyette gerinim dağılımını ortaya çıkarmayı sağlamıştır.
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Primary Language en
Subjects Engineering
Journal Section Articles
Authors

Orcid: 0000-0001-7903-9220
Author: İlyas ŞAVKLIYILDIZ (Primary Author)
Institution: KONYA TEKNİK UNİVERSİTESIİ
Country: Turkey


Supporting Institution U.S. Department of Energy, Division of Material Sciences and Division of Chemical Sciences
Project Number DE-AC02-76CH00016
Thanks Dr. Enver Koray AKDOĞAN (Materials Science and Engineering Department, Rutgers University, New Brunswick, NJ, USA)
Dates

Publication Date : April 30, 2021

APA Şavklıyıldız, İ . (2021). In-Situ Strain Measurement on Al7075 Plate by Using High Energy Synchrotron Light Source . Avrupa Bilim ve Teknoloji Dergisi , (23) , 435-439 . DOI: 10.31590/ejosat.878002