CdO:Ag İnce Filmlerinin SILAR Tekniği İle Büyütülmesi ve Karakterizasyonu

Year 2019, , 128 - 135, 15.01.2019

Demet İskenderoglu , Harun Güney

https://doi.org/10.17714/gumusfenbil.360478

Cited By: 1

Abstract

Yapılan çalışmada gümüş (Ag) katkılı kadmiyum oksit (CdO)
ince filmleri mikroskobik cam yüzey üzerine Ardışık İyonik Tabaka Adsorpsiyon
ve Reaksiyonu (SILAR) yöntemi ile oda sıcaklığında büyütülmesi
gerçekleştirilmiştir. Büyütülen numunelerin yapısal, optik ve morfolojik
özellikleri incelenmiştir. Yapısal incelemede X-Işını Kırınımı (XRD) cihazı kullanılmış,
XRD sonuçlarından numunelerin polikristal kübik yapıda olduğu ve ortalama
kristal boyutunun Ag katkısı ile 22 nm’den ve 25 nm’ye arttığı görülmüştür.
Soğurma ölçümleri, Ag katkı oranının artışı ile band aralığının 2.22 eV’den 2.67
eV’ye arttığını göstermiştir. Taramalı Elektron Mikroskopisi (SEM) görüntüleri
Ag katkı oranı değişiminin yüzeyde değişime neden olduğunu ortaya koymuştur.

Keywords

Ag katkı, CdO, SILAR

Growth And Characterization CdO:Ag Thin Films By SILAR Technique

Abstract

In the study, Ag-doped CdO thin films were grown on the microscopic
glass surface by SILAR method at room temperature. The structural, optical and
morphological properties of the grown film were investigated. XRD device was
used in the structural investigation, XRD results show that the samples have
polycrystalline cubic structure and the average crystal sizes have been shown rising
from 22 nm to 25 nm with Ag dopant. The absorbance measurements show that the
band gap increase from 2.22 eV to 2.67 eV with the increasing Ag dopant ratio.
SEM images show that the changing Ag dopant ratio causes the significant
changing in the surface of samples.

Keywords

Ag dopant, CdO, SILAR

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