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Fingerprinting the Malfunction of Devices

Year 2007, Volume: 10 Issue: 2, 79 - 85, 01.06.2007

Abstract

A methodology to generate fingerprints for malfunctioning devices in a system from the design information of the system is proposed. The aim is to reduce measurement to the minimum and to the simple at the expense of more computation. A simple combined cycle is considered. A baseline of fingerprints is generated by considering the degradation of one of the efficiency parameters of a single device; one degradation at a time. Different degrees of degradation are considered at different load fractions. The load fractions considered cover the range from 1 (design point) to 0.4. The degrees of degradation considered cover the range from 1 (no degradation) to 0.6, the efficiency occurring at the considered load fraction. The needed design information is stated. Examples of fingerprints are presented in tables. Application of the base-line fingerprint methodology to existing plants in general is described. Extension to multi-degraded efficiency parameters is considered guided by the baseline fingerprints.

Year 2007, Volume: 10 Issue: 2, 79 - 85, 01.06.2007

Abstract

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Details

Primary Language English
Journal Section Regular Original Research Article
Authors

Yehia El-sayed This is me

Publication Date June 1, 2007
Published in Issue Year 2007 Volume: 10 Issue: 2

Cite

APA El-sayed, Y. (2007). Fingerprinting the Malfunction of Devices. International Journal of Thermodynamics, 10(2), 79-85.
AMA El-sayed Y. Fingerprinting the Malfunction of Devices. International Journal of Thermodynamics. June 2007;10(2):79-85.
Chicago El-sayed, Yehia. “Fingerprinting the Malfunction of Devices”. International Journal of Thermodynamics 10, no. 2 (June 2007): 79-85.
EndNote El-sayed Y (June 1, 2007) Fingerprinting the Malfunction of Devices. International Journal of Thermodynamics 10 2 79–85.
IEEE Y. El-sayed, “Fingerprinting the Malfunction of Devices”, International Journal of Thermodynamics, vol. 10, no. 2, pp. 79–85, 2007.
ISNAD El-sayed, Yehia. “Fingerprinting the Malfunction of Devices”. International Journal of Thermodynamics 10/2 (June 2007), 79-85.
JAMA El-sayed Y. Fingerprinting the Malfunction of Devices. International Journal of Thermodynamics. 2007;10:79–85.
MLA El-sayed, Yehia. “Fingerprinting the Malfunction of Devices”. International Journal of Thermodynamics, vol. 10, no. 2, 2007, pp. 79-85.
Vancouver El-sayed Y. Fingerprinting the Malfunction of Devices. International Journal of Thermodynamics. 2007;10(2):79-85.